Abstract:
Disclosed herein is an apparatus for measuring a voltage including a primary integrator circuit configured to operate as a first integral stage of a sigma-delta analog-to-digital converter (ADC) circuit by a switching according to a control signal of a controller, a secondary integrator circuit configured to operate as a second integral stage by a switching of the controller, a comparator configured to compare final voltages modulated through the primary integrator circuit and the secondary integrator circuit, and a digital filter configured to delay an output of the comparator by a specified number of clocks according to a switching of the controller, pass the delayed output through a digital-to-analog converter (DAC) to feed the delayed output back to the primary and secondary integrator circuits, and receive the delayed output signal of the comparator as an input, wherein an output of the digital filter becomes a final measured value.
Abstract:
In accordance with an embodiment, a circuit includes a first oscillator having an oscillation frequency dependent on an input signal at a first input, where the first oscillator is configured to oscillate when an enable input is in a first state and freeze its phase or reduce its frequency when the enable input is in a second state. The circuit also includes a first time-to-digital converter having an input coupled to an output of the first oscillator, and a pulse generator having an input coupled to a first clock input of the circuit and an output coupled to the enable input of the first oscillator, where the pulse generator is configured to produce a pulse having pulse width less than a period of a clock signal at the first clock input.
Abstract:
A delta-sigma modulation analog-to-digital converter (ADC) may be constructed by combining a VCO used for a first order filter with a digital loop filter used for a second or higher order of the ADC. One such ADC would include an analog input node configured to receive an analog signal; a voltage-controlled oscillator (VCO) comprising a first input configured to receive the analog signal, wherein the voltage-controlled oscillator is configured to implement a first order noise-shaping function; a digital loop filter comprising a second input configured to receive an output of the voltage-controlled oscillator (VCO); and a digital output node configured to output a digital signal based on an output of the digital loop filter. The digital loop filter may be configured to implement at least a first order noise-shaping function, but may also implement higher order noise-shaping functions.
Abstract:
There are disclosed various methods and apparatuses for receiving a radio frequency a signal. In some embodiments the method a signal is provided to an input of an amplifying element. An amplified signal is formed on the basis of the input signal by the amplifying element. The amplified signal is integrated by an integrating element to form an integrated signal. A feedback signal is formed on the basis of the integrated signal, wherein the feedback signal is provided to the integrating element. In some embodiments the apparatus comprises means for implementing the method.
Abstract:
An analog-to-digital converting device (100, 200) includes: an integrator (102, 202) arranged to generate an integrating signal according to an analog input signal and a first analog feedback signal; a low-pass filter (104, 304, 404, 504, 604, 704) arranged to generate a first filtered signal according to the integrating signal; an analog-to-digital converter (106) arranged to generate a digital output signal according to the first filtered signal; and a first digital-to-analog converter (108) arranged to generate the first analog feedback signal according to the digital output signal.
Abstract:
An analog-to-digital converter, ADC, system (200) configured to receive a first (V1) and a second (V2) analog quantity and to provide a plurality of numerical parameters (CODE) representative of the first (V1) and second (V2) analog quantities. The ADC system includes a first (301), a second (302), and a third (305) ADC circuit, and a digital interface circuit (303). The first ADC circuit (301) is configured to provide a first code (D1) representative of the first analog quantity (V1) and to provide a first analog residue quantity (R1) representative of the first analog quantity (V1) with respect to the first code (D1). The second ADC circuit (302) is configured to provide a second code (D2) representative of the second analog quantity (V2) and to provide a second analog residue quantity (R2) representative of the second analog quantity (V2) with respect to the second code (D2). The third ADC circuit (304) is configured to receive the first (R1) and second (R2)analog residue quantities, and to provide a third digital code (D3) representative of a difference of the first (R1) and second (R2) analog residue quantities. The digital interface circuit (303) is configured to receive the first (D1), second (D2), and third (D3) codes, and to provide the plurality of numerical parameters (CODE) representative of the first (V1) and second (V2) analog quantities.
Abstract:
Resistive elements (11, 12) and a capacitive element (23) are respectively coupled between a node (101) and an inverting input terminal of an operational amplifier (10), between the node (101) and an output terminal of the operational amplifier (10), and between the node (101) and a common node. A resistive element (14) and a capacitive element (25) are coupled between the node (101) and a signal input terminal. Capacitive elements (21, 22) and a resistive element (13) are respectively coupled between a node (102) and the inverting input terminal of the operational amplifier (10), between the node (102) and the output terminal, and between the node (102) and the common node. Capacitive elements (24, 26) are respectively coupled between the node (102) and the signal input terminal, and the node (102) and the common node. An overall admittance where elements coupled to the node (101) are coupled in parallel is equal to an overall admittance where elements coupled to the node (102) are coupled in parallel.
Abstract:
An analog-to-digital converter (200) is proposed. The converter includes at least one stage (105) for converting an analog input signal into a digital output signal using a parallel quantizer (115) comparing the analog input signal with a plurality of threshold values in parallel; the converter of the invention further includes, for at least one selected stage (105), means (210,220) for estimating an analog correction signal indicative of the mean value of a quantization error of the selected stage, and means (440i) for at least partially compensating an offset error of the parallel quantizer (105) in the selected stage according to the analog correction signal.
Abstract:
A digital switching amplifier in accordance with the present invention is provided with attenuation sections that attenuate respective 1-bit signals that have been subjected to the power amplification, and an offset voltage addition and adjustment section that adds adjustment voltages to output signals of the respective attenuation sections so that a D.C. voltage level difference between negative feedback signals which return to a delta sigma modulation circuit becomes substantially zero. This allows to ensurely provide a digital switching amplifier that can avoid that the gain with respect to positive and negative input signals change and easily avoid that the noise occurs in the lower frequency band due to an offset voltage.