摘要:
PROBLEM TO BE SOLVED: To provide an exterior member for an electronic apparatus having a plurality of layers of conductor patterns and through-holes.SOLUTION: The exterior member for an electronic apparatus includes: a laminate of a plurality of sheet materials on which conductive patterns are formed, respectively; through-holes formed on the laminate; and a heat-resistant material, provided at the laminate, having such heat resistance as not to be penetrated against heat when forming the through-hole, and through which the through-hole terminates without penetrating.
摘要:
PROBLEM TO BE SOLVED: To provide a cooler in which the possibility of liquid leakage can be determined under actual use conditions, and to provide an electronic apparatus equipped with that cooler, and a cooling system.SOLUTION: The cooler 33 being fixed to a heating component, e.g. a CPU 23, comprises a heat exchange part 21 internally provided with a space through which cooling water 25 circulates, a housing 22 which is bonded to the heat exchange part 21 and forms a space therebetween, and a leakage detection agent 26 arranged in the space between the heat exchange part 21 and the housing 22. When a hole is made in the top plate 21b of the heat exchange part 21 because of long term use, the leakage detection agent 26 is mixed into the cooling water 25. The possibility of liquid leakage can be determined by examining mixture of the leakage detection agent 26 into the cooling water 25.
摘要:
PROBLEM TO BE SOLVED: To solve the problem that a resin surface which contains no inorganic filler can not be roughened by a method of roughening a resin surface by etching an inorganic filler, and a resin surface which contains no butadiene component can not be roughened by a method of desorbing a butadiene compound of a resin from a resin member through oxidative decomposition.SOLUTION: The resin surface of a member, where a resin is exposed, is covered with monosubstituted trialkoxysilane or disubstituted dialkoxysilane to form a liquid film of the monosubstituted trialkoxysilane or disubstituted dialkoxysilane. The monosubstituted trialkoxysilane or disubstituted dialkoxysilane of the liquid film is polymerized to form a plurality of polysiloxane films dotted on the resin surface. The resin surface is etched using the polysiloxane films as an etching mask to roughen the resin surface.
摘要:
PROBLEM TO BE SOLVED: To provide a wiring board capable of obtaining a narrow pitch of a through-hole of a core board, and a manufacturing method of the wiring board capable of forming the through-hole of the core board by a simple process. SOLUTION: The wiring board 50 includes a core layer 30 having a carbon fiber 20. The core layer 30 is formed by alternately laying out the carbon fiber 20 and an organic fiber or a glass fiber 25, respectively. In the core layer 30, at a place where the organic fiber or the glass fiber 25 is arranged, a through-hole 2 in which a conductive member 4 is arranged in the inner wall surface, is formed. The upper part and the lower part of the core layer 30 are conductive via the through-hole 2. COPYRIGHT: (C)2010,JPO&INPIT
摘要:
PROBLEM TO BE SOLVED: To provide a method of manufacturing a printed wiring board by forming fine through-holes having a single via structure in a conductive substrate. SOLUTION: The method of manufacturing the printed wiring board includes the steps of: forming through-holes in a conductive core base material; immersing the conductive core base material in a liquid resin; taking the conductive core base material out of the liquid resin; and curing the liquid resin adhered to the inside wall of the through-hole to form an insulating film on the inside wall of the through-hole. COPYRIGHT: (C)2009,JPO&INPIT
摘要:
PROBLEM TO BE SOLVED: To provide a method of manufacturing a substrate, that correctly etches a conductor formed on the surface of the substrate in the production steps for substrates including a step of forming a through-hole in the substrate and fill it with an insulating material. SOLUTION: The method includes the steps of: forming a through-hole 18 in a substrate 16; filling the through-hole 18 with an insulating material 20 and performing electroless plating to coat the surface of the substrate 16; applying photoresist on the electroless-plated layer 80 formed on the surface of the substrate 16; optically exposing and developing the photoresist so as to form a resist pattern 72 coating an end face of the through-hole 18 filled with the insulating material 20; etching conductor layers 14 and 19 formed on the surface of the substrate 16 while using the resist pattern 72 as a mask; and removing the resist pattern 72 coating the end face of the through-hole 18 from the substrate 16 while using the electroless-plated layer 80 as a release layer. COPYRIGHT: (C)2009,JPO&INPIT
摘要:
PROBLEM TO BE SOLVED: To execute normality checking of a frame synchronization unit as needed before the occurrence of abnormality, and to promptly detect the occurrence of a fault in the frame synchronization unit, in regard to the frame synchronization unit, a communication unit, and a fault detection method. SOLUTION: A central processing unit 24 issues a command to transmit a frame synchronization signal. On receiving the command, a frame synchronization signal transmission section 22 reads out, from a frame number update section 21, a frame number (F2) at the time point of the frame synchronization signal transmission, adds it to the frame synchronization signal, and transmits them. The above frame synchronization signal is looped back by an upper-level unit (signal switch) 1. A frame synchronization signal reception section 23 reads out, from the frame number update section 21, a frame number (F5) at the time point of the frame synchronization signal reception being looped back, adds it to the frame synchronization signal, and transmits them to the central processing unit 24. The central processing unit 24 collates the relationship of magnitude between the frame numbers F2 and F5 in the received frame synchronization signal, and decides whether the frame synchronization is normal or abnormal. COPYRIGHT: (C)2009,JPO&INPIT
摘要:
PROBLEM TO BE SOLVED: To efficiently execute a call access processing with regard to a processing method of a call access request signal and with regard to a radio base station control apparatus. SOLUTION: The number of processing of the call access request signal of the radio base station with a low processing completion rate at a vergence is controlled by a step (1-1) for totaling a statistical information of the processing completion rate of each radio base station of the call access request signal (RACH) transmitted and received between a mobile machine and the radio base station, by steps (1-4 to 1-12) for gradually reducing the number of processing of the call access request signal of the radio base station each period at which the processing completion rate is a prescribed threshold value (M%) or lower and for setting a vergence control level so as to gradually increase the number of processing each period at which the processing completion rate is the prescribed threshold value (M%) or higher, and by a step (1-13) for calculating the number of processing of the call access request signal of the radio base station of a vergence control object according to the vergence control level. Also when the number of the call access request signal brought from some of the radio base stations is over a threshold value (N%) of a prescribed ratio of the number of a processable signal, the control of the processing is executed at once. COPYRIGHT: (C)2009,JPO&INPIT
摘要:
PROBLEM TO BE SOLVED: To provide an electronic device which can suppress a large stress from being applied to a solder bump or the like of an adjacent semiconductor chip when it is desired to replace a faulty chip by a new chip, and to provide a method of manufacturing the electronic device. SOLUTION: The electronic device includes a substrate 2 having an electrode 44 formed thereon, semiconductor element 4 mounted on the substrate to be electrically connected with the electrode via a solder bump 46, and a sealing resin layer 68 formed between the substrate and the semiconductor element so as to bury the solder bump. The sealing resin layer is made of a foam having a thermal conductivity not larger than 0.1 W/mK. COPYRIGHT: (C)2008,JPO&INPIT