Mass spectrometer using plasma ion source
    1.
    发明授权
    Mass spectrometer using plasma ion source 失效
    使用等离子体源的质谱仪

    公开(公告)号:US5148021A

    公开(公告)日:1992-09-15

    申请号:US630554

    申请日:1990-12-20

    CPC分类号: H01J49/06

    摘要: A mass spectrometer using a plasma ion source for analyzing an ultra-trace element includes a plasma generation system for generating a plasma including the composition of a sample, an ion beam formation system for extracting ions in the form of a beam from the plasma generating the ions, a mass spectrometry system for performing mass spectrometry of the ion beamn, and an ion detection system for detecting the ions subjected to the mass spectrometry, in which a lens system made up of a cylindrical first electrode, a cylindrical second electrode with a photon stopper disposed on the central axis thereof, and a cylindrical third electrode is further provided between the ion beam formation system and the mass spectrometry system. By the provision of the lens system, the ions generated in the plasma are transported more efficiently to the side of the mass spectrometry system and by the provision of the photon stopper in the above described position, it is achieved, with a simpler structure, to prevent photons from entering the ion detection system.

    摘要翻译: 使用等离子体离子源分析超微量元素的质谱仪包括:等离子体产生系统,用于产生包含样品组成的等离子体;离子束形成系统,用于从等离子体中提取离子的形式, 离子,用于进行离子束的质谱分析的质谱系统和用于检测进行质谱分析的离子的离子检测系统,其中由圆柱形第一电极构成的透镜系统,具有光子的圆柱形第二电极 止动件设置在其中心轴上,并且在离子束形成系统和质谱系统之间还设置有圆柱形的第三电极。 通过设置透镜系统,在等离子体中产生的离子更有效地传输到质谱系统的侧面,并且通过在上述位置提供光子停止器,以更简单的结构实现 防止光子进入离子检测系统。

    Atomic absorption spectrophotometer
    2.
    发明授权
    Atomic absorption spectrophotometer 失效
    原子吸收分光光度计

    公开(公告)号:US4728189A

    公开(公告)日:1988-03-01

    申请号:US6170

    申请日:1987-01-23

    IPC分类号: G01N21/31 G01J3/42 G01N21/74

    CPC分类号: G01N21/3103

    摘要: An absorption profile indicative of a relation in atomic absorption spectroscopy between the absorbance of a desired element and time has a constant half-width independent of the concentration of the desired element in a sample, and hence the half-width of absorption profile with respect to the desired element can be previously determined from data which is obtained by the measurement of a standard sample. In an atomic absorption spectrophotometer herein disclosed, the half-width of absorption profile is previously determined in the above-mentioned manner, and the true peak value of an absorption profile obtained by measuring a sample which contains the desired element at a high concentration, is calculated using the time width of this absorption profile at a predetermined absorbance and the previously-determined half-width.

    摘要翻译: 指示所需元素的吸光度与时间之间的原子吸收光谱中的关系的吸收曲线具有与样品中期望元素的浓度无关的恒定半宽,因此吸收曲线的半宽相对于 可以从通过测量标准样品获得的数据预先确定所需要的元素。 在本文公开的原子吸收分光光度计中,预先按照上述方式确定吸收曲线的半宽度,通过以高浓度测量含有所需元素的样品而获得的吸收曲线的真实峰值为 使用该吸收曲线的时间宽度以预定吸光度和预先确定的半宽度计算。

    Atomic absorption spectrophotometer
    3.
    发明授权
    Atomic absorption spectrophotometer 失效
    原子吸收分光光度计

    公开(公告)号:US4867562A

    公开(公告)日:1989-09-19

    申请号:US196263

    申请日:1988-05-20

    IPC分类号: G01N21/31 G01N21/74

    摘要: An atomic absorption spectrophotometer for simultaneously measuring a plurality of elements different in kind from each other. A cylindrical heating furnace is provided for heating a sample being analyzed to dry, ash and atomize the sample thereby producing atomic vapor. A plurality of hollow-cathode discharge tubes corresponding in number to the elements being detected are arranged for simultaneously emitting light beams respectively containing line spectra of the respective elements, to cause the light beams to be incident upon the heating furnace at respective angles of inclination with respect to a central axis of the heating furnace. A plurality of spectral detection systems are arranged behind the heating furnace in relation to the angles of inclination, for respectively spectral-diffracting and receiving the light beams having their respective line spectra absorbed by the atomic vapor. A signal processing device is provided for carrying out calculation to obtain concentrations or quantities of the respective elements in the sample being analyzed, on the basis of respective ratios of atomic resonance absorption of the respective line spectra spectral-detected.

    摘要翻译: 一种用于同时测量彼此不同种类的多种元素的原子吸收分光光度计。 提供圆柱形加热炉,用于加热被分析的样品以干燥,灰分并雾化样品,从而产生原子蒸气。 多个对应于被检测的元件的空心阴极放电管被布置成同时发射分别包含各个元件的线谱的光束,以使光束以相应的倾角入射到加热炉上, 相对于加热炉的中心轴线。 多个光谱检测系统相对于倾斜角度布置在加热炉后面,用于分别衍射和接收具有由原子蒸气吸收的各自线谱的光束。 提供信号处理装置,用于根据频谱检测的各个线谱的原子共振吸收的相应比例进行计算以获得正在分析的样品中的各元素的浓度或数量。

    Atomic absorption spectrophotometer and analyzing method
    5.
    发明授权
    Atomic absorption spectrophotometer and analyzing method 失效
    原子吸收光谱仪和分析方法

    公开(公告)号:US5104220A

    公开(公告)日:1992-04-14

    申请号:US316964

    申请日:1989-02-28

    IPC分类号: G01N21/31 G01N21/74

    CPC分类号: G01N21/74

    摘要: An atomic absorption spectrophotometer comprising means for setting the ashing temperature for that of the element having the lowest ashing temperature; means for setting the atomizing temperature for that of the element having the highest atomizing temperature; and means for effecting background correction utilizing Zeeman effect.

    摘要翻译: 一种原子吸收分光光度计,包括用于设定具有最低灰度温度的元件的灰度温度的装置; 用于设定具有最高雾化温度的元件的雾化温度的装置; 以及利用塞曼效应进行背景校正的方法。

    Atomic absorption spectrophotometer with furnace at pressure equal or
near light source pressure
    6.
    发明授权
    Atomic absorption spectrophotometer with furnace at pressure equal or near light source pressure 失效
    原子吸收分光光度计,炉内压力等于或接近光源压力

    公开(公告)号:US4840484A

    公开(公告)日:1989-06-20

    申请号:US175320

    申请日:1988-03-30

    IPC分类号: G01N21/31 G01N21/74

    CPC分类号: G01N21/74 G01N2021/745

    摘要: In an atomic absorption spectrophotometer including an electric furnace for drying and ashing a liquid sample to be analyzed and then atomizing the sample to generate atomic vapor, a low-pressure lamp for emitting light having a spectrum of an element to be analyzed onto the atomic vapor atomized in the electric furnace, a monochromator for splitting the transmitted light from the electric furnace and selecting a wavelength of an atomic absorption line absorbed by the element to be analyzed, and a signal processing unit for performing signal processing on the light having the selected wavelength supplied from the monochromator, the electric furnace is an airtight mechanism for maintaining airtightness of the inside of the electric furnace and an evacuation unit for evacuating the inside of the electric furnace to a pressure equal to the pressure inside the lamp.

    摘要翻译: 在包括用于干燥和灰化待分析的液体样品的电炉,然后将样品雾化以产生原子蒸气的原子吸收分光光度计中的低压灯,用于将具有待分析元素的光谱发射到原子蒸气上的光 在电炉中雾化的单色仪,用于分离来自电炉的透射光并选择待分析元件吸收的原子吸收线的波长的单色仪,以及对具有所选波长的光进行信号处理的信号处理单元 电炉是用于保持电炉内部的气密性的气密机构和用于将电炉的内部抽空至与灯内的压力相等的压力的排气单元。

    Mass spectrometer, skimmer cone assembly, skimmer cone and its
manufacturing method
    8.
    发明授权
    Mass spectrometer, skimmer cone assembly, skimmer cone and its manufacturing method 失效
    质谱仪,撇渣锥组件,撇渣器及其制造方法

    公开(公告)号:US5793039A

    公开(公告)日:1998-08-11

    申请号:US605572

    申请日:1996-02-22

    CPC分类号: H01J49/067

    摘要: Disclosed is a structure comprising; (a) Plasma gas is supplied to torch tube 8 from inert pressure vessel 1. (b) Nebulizer 3 absorbs sample 4 to vaporize the sample as aerosol and to introduce it into plasma 5. (c) Plasma 5 touches sampling cone 10 having an opening at the apex and a conical surface, whereby an ion stream is extracted through the opening of the sampling cone whose pressure is reduced at the rear face thereof. (d) The extracted ion stream further touches skimmer cone 12 of the conical surface having a small hole at the apex, and is absorbed into vacuum chamber 13 where the pressure is further reduced at the rear face. (e) The ion stream is flowed into quadruple pole filter 18 to carry out the mass spectrometry analysis of the ion stream.

    摘要翻译: 公开了一种结构,包括: (a)将等离子体气体从惰性压力容器1供应给割炬管8.(b)雾化器3吸收样品4以使气溶胶蒸发,并将其引入等离子体5.(c)等离子体5接触采样锥10, 在顶点处开口并具有锥形表面,由此通过其后面压力减小的取样锥体的开口提取离子流。 (d)提取的离子流进一步接触顶点处具有小孔的圆锥形表面的撇渣器锥体12,并被吸收到真空室13中,在该真空室13中后面进一步减小压力。 (e)离子流流入四极过滤器18,进行离子流的质谱分析。

    Plasma mass spectrometer
    9.
    发明授权
    Plasma mass spectrometer 失效
    等离子体质谱仪

    公开(公告)号:US5308977A

    公开(公告)日:1994-05-03

    申请号:US25139

    申请日:1993-03-02

    CPC分类号: H01J49/105

    摘要: A plasma mass spectrometer generates an aerosol of a sample, by dissolving the sample in a liquid solvent, and spraying the liquid into a spray chamber via a nebulizer. The solvent condenses in the spray chamber and an aerosol of the sample then passes through a supply tube to a plasma torch. Microwave power from an output on the plasma torch converts the aerosol to a plasma, and the plasma passes to an analyzer. If microwave radiation reached the spray chamber, it would cause heating of the solvent which may evaporate it so that the solvent would be present in the plasma. Therefore, there is a wall between the spray chamber and the plasma torch and microwave output which blocks such microwave radiation.

    摘要翻译: 等离子体质谱仪通过将样品溶解在液体溶剂中并通过喷雾器将液体喷射到喷雾室中而产生样品气溶胶。 溶剂在喷雾室中冷凝,然后样品的气溶胶通过供应管到等离子体焰炬。 来自等离子体焰炬上的输出的微波功率将气溶胶转换成等离子体,并且等离子体传递到分析器。 如果微波辐射到达喷雾室,则会引起溶剂的加热,这可能使其蒸发,使得溶剂将存在于等离子体中。 因此,喷雾室和等离子体焰炬和微波输出之间存在阻挡这种微波辐射的壁。