Configuring radiation sources to simultaneously irradiate a substrate
    3.
    发明授权
    Configuring radiation sources to simultaneously irradiate a substrate 失效
    配置辐射源同时照射基板

    公开(公告)号:US08586488B2

    公开(公告)日:2013-11-19

    申请号:US12860990

    申请日:2010-08-23

    IPC分类号: H01L21/00

    CPC分类号: H01L21/268

    摘要: A computer program product and system for configuring J electromagnetic radiation sources (J≧2) to simultaneously irradiate a substrate. Each source has a different function of wavelength and angular distribution of emitted radiation. The substrate includes a base layer and I stacks (I≧2) thereon. Pj denotes a same source-specific normally incident energy flux on each stack from source j. For simultaneous exposure of the I stacks to radiation from the J sources, Pj is computed such that an error E being a function of |W1−S1|, |W2−S2|, |WI−SI| is about minimized with respect to Pj (j=1, . . . , J). Wi and Si respectively denote an actual and target energy flux transmitted into the substrate via stack i (i=1, . . . , I). The stacks are exposed to the radiation from the sources characterized by the computed Pj (j=1, . . . , J).

    摘要翻译: 一种用于配置J电磁辐射源(J> = 2)以同时照射衬底的计算机程序产品和系统。 每个源具有不同的发射辐射的波长和角分布的功能。 衬底包括基层,I堆叠(I> = 2)。 Pj表示来自源j的每个堆叠上相同的源特定的正常入射能量通量。 为了将I堆叠同时暴露于来自J源的辐射,计算Pj,使得误差E是| W1-S1 |,| W2-S2 |,| WI-SI |的函数; 相对于Pj(j = 1,...,J)被最小化。 Wi和Si分别表示通过堆叠i(i = 1,...,I)传输到衬底中的实际和目标能量通量。 这些堆叠暴露于由所计算的Pj(j = 1,...,J)表征的源的辐射。

    Formation of spacers for FinFETs (Field Effect Transistors)
    4.
    发明授权
    Formation of spacers for FinFETs (Field Effect Transistors) 有权
    FinFET间隔物的形成(场效应晶体管)

    公开(公告)号:US07399664B1

    公开(公告)日:2008-07-15

    申请号:US11679862

    申请日:2007-02-28

    CPC分类号: H01L29/785 H01L29/66795

    摘要: A structure and a method for forming the same. The structure includes (a) a substrate, (b) a semiconductor fin region on top of the substrate, (c) a gate dielectric region on side walls of the semiconductor fin region, and (d) a gate electrode region on top and on side walls of the semiconductor fin region. The gate dielectric region (i) is sandwiched between and (ii) electrically insulates the gate electrode region and the semiconductor fin region. The structure further includes a first spacer region on a first side wall of the gate electrode region. A first side wall of the semiconductor fin region is exposed to a surrounding ambient. A top surface of the first spacer region is coplanar with a top surface of the gate electrode region.

    摘要翻译: 一种结构及其形成方法。 该结构包括(a)衬底,(b)在衬底的顶部上的半导体鳍片区域,(c)半导体鳍片区域的侧壁上的栅极电介质区域,以及(d)顶部和上部的栅电极区域 半导体鳍片区域的侧壁。 栅极电介质区域(i)夹在其间并且(ii)使栅电极区域和半导体鳍片区域电绝缘。 该结构还包括在栅电极区域的第一侧壁上的第一间隔区域。 半导体鳍片区域的第一侧壁暴露于周围环境。 第一间隔区域的顶表面与栅电极区域的顶表面共面。

    FIELD EFFECT TRANSISTOR WITH THIN GATE ELECTRODE AND METHOD OF FABRICATING SAME
    5.
    发明申请
    FIELD EFFECT TRANSISTOR WITH THIN GATE ELECTRODE AND METHOD OF FABRICATING SAME 有权
    具有薄门电极的场效应晶体管及其制造方法

    公开(公告)号:US20080157188A1

    公开(公告)日:2008-07-03

    申请号:US12037121

    申请日:2008-02-26

    IPC分类号: H01L29/00

    摘要: A field effect transistor and a method of fabricating the field effect transistor. The field effect transistor includes: a silicon body, a perimeter of the silicon body abutting a dielectric isolation; a source and a drain formed in the body and on opposite sides of a channel formed in the body; and a gate dielectric layer between the body and an electrically conductive gate electrode, a bottom surface of the gate dielectric layer in direct physical contact with a top surface of the body and a bottom surface the gate electrode in direct physical contact with a top surface of the gate dielectric layer, the gate electrode having a first region having a first thickness and a second region having a second thickness, the first region extending along the top surface of the gate dielectric layer over the channel region, the second thickness greater than the first thickness.

    摘要翻译: 场效应晶体管和制造场效应晶体管的方法。 场效应晶体管包括:硅体,硅体的周边抵靠电介质隔离; 源体和漏极,其形成在主体中并形成在主体中的通道的相对侧上; 以及位于主体和导电栅电极之间的栅极电介质层,栅极电介质层的与表面主体直接物理接触的底表面和栅电极与 所述栅极电介质层,所述栅电极具有第一厚度的第一区域和具有第二厚度的第二区域,所述第一区域沿着所述沟道区域上的所述栅极电介质层的顶表面延伸,所述第二厚度大于所述第一厚度 厚度。

    Field effect transistor with thin gate electrode and method of fabricating same
    6.
    发明授权
    Field effect transistor with thin gate electrode and method of fabricating same 有权
    具有薄栅电极的场效应晶体管及其制造方法

    公开(公告)号:US07374980B2

    公开(公告)日:2008-05-20

    申请号:US11549311

    申请日:2006-10-13

    IPC分类号: H01L21/84 H01L21/8242

    摘要: A field effect transistor and a method of fabricating the field effect transistor. The field effect transistor includes: a silicon body, a perimeter of the silicon body abutting a dielectric isolation; a source and a drain formed in the body and on opposite sides of a channel formed in the body; and a gate dielectric layer between the body and an electrically conductive gate electrode, a bottom surface of the gate dielectric layer in direct physical contact with a top surface of the body and a bottom surface the gate electrode in direct physical contact with a top surface of the gate dielectric layer, the gate electrode having a first region having a first thickness and a second region having a second thickness, the first region extending along the top surface of the gate dielectric layer over the channel region, the second thickness greater than the first thickness.

    摘要翻译: 场效应晶体管和制造场效应晶体管的方法。 场效应晶体管包括:硅体,硅体的周边抵靠电介质隔离; 源体和漏极,其形成在主体中并形成在主体中的通道的相对侧上; 以及位于主体和导电栅电极之间的栅极电介质层,栅极电介质层的与表面主体直接物理接触的底表面和栅电极与 所述栅极电介质层,所述栅电极具有第一厚度的第一区域和具有第二厚度的第二区域,所述第一区域沿着所述沟道区域上的所述栅极电介质层的顶表面延伸,所述第二厚度大于所述第一厚度 厚度。

    Dense chevron finFET and method of manufacturing same
    7.
    发明授权
    Dense chevron finFET and method of manufacturing same 有权
    密集人字形finFET及其制造方法

    公开(公告)号:US07323374B2

    公开(公告)日:2008-01-29

    申请号:US11162663

    申请日:2005-09-19

    IPC分类号: H01L21/00

    摘要: A method, structure and alignment procedure, for forming a finFET. The method including, defining a first fin of the finFET with a first mask and defining a second fin of the finFET with a second mask. The structure including integral first and second fins of single-crystal semiconductor material and longitudinal axes of the first and second fins aligned in the same crystal direction but offset from each other. The alignment procedure including simultaneously aligning alignment marks on a gate mask to alignment targets formed separately by a first masked used to define the first fin and a second mask used to define the second fin.

    摘要翻译: 用于形成finFET的方法,结构和取向程序。 该方法包括:用第一掩模限定finFET的第一鳍片,并用第二掩模限定finFET的第二鳍片。 该结构包括单晶半导体材料的整体第一和第二鳍片以及第一和第二鳍片的纵向轴线在相同的晶体方向上排列但彼此偏移。 对准过程包括同时将栅极掩模上的对准标记对准由通过用于限定第一鳍片的第一掩模单独形成的对准靶和用于限定第二鳍片的第二掩模。

    Method of forming semiconductor device with decoupling capacitance
    9.
    发明授权
    Method of forming semiconductor device with decoupling capacitance 失效
    用去耦电容形成半导体器件的方法

    公开(公告)号:US06365484B1

    公开(公告)日:2002-04-02

    申请号:US09634970

    申请日:2000-08-09

    IPC分类号: H01L2120

    摘要: A semiconductor device is disclosed that provides a decoupling capacitance and method for the same. The semiconductor device includes a first circuit region having a first device layer over an isolation layer and a second circuit region adjacent the first circuit region having a second device layer over a well. An implant layer is implanted beneath the isolation layer in the first circuit region, which will connect to the well of the second circuit region.

    摘要翻译: 公开了提供一种去耦电容的半导体器件及其方法。 半导体器件包括具有在隔离层上的第一器件层的第一电路区域和与第一电路区域相邻的第二电路区域,该第二电路区域在阱上具有第二器件层。 在第一电路区域中的隔离层下方植入注入层,其将连接到第二电路区域的阱。

    CONFIGURING RADIATION SOURCES TO SIMULTANEOUSLY IRRADIATE A SUBSTRATE
    10.
    发明申请
    CONFIGURING RADIATION SOURCES TO SIMULTANEOUSLY IRRADIATE A SUBSTRATE 失效
    配置辐射源同时辐射基板

    公开(公告)号:US20100318210A1

    公开(公告)日:2010-12-16

    申请号:US12860990

    申请日:2010-08-23

    IPC分类号: G06F17/00

    CPC分类号: H01L21/268

    摘要: A computer program product and system for configuring J electromagnetic radiation sources (J≧2) to simultaneously irradiate a substrate. Each source has a different function of wavelength and angular distribution of emitted radiation. The substrate includes a base layer and I stacks (I≧2) thereon. Pj denotes a same source-specific normally incident energy flux on each stack from source j. For simultaneous exposure of the I stacks to radiation from the J sources, Pj is computed such that an error E being a function of |W1−S1|, |W2−S2|, |WI−SI| is about minimized with respect to Pj (j=1, . . . , J). Wi and Si respectively denote an actual and target energy flux transmitted into the substrate via stack i (i=1, . . . , I). The stacks are exposed to the radiation from the sources characterized by the computed Pj (j=1, . . . , J).

    摘要翻译: 一种用于配置J电磁辐射源(J≥2)以同时照射衬底的计算机程序产品和系统。 每个源具有不同的发射辐射的波长和角分布的功能。 基板包括基层和I堆叠(I≥2)。 Pj表示来自源j的每个堆叠上相同的源特定的正常入射能量通量。 为了将I堆叠同时暴露于来自J源的辐射,计算Pj,使得误差E是| W1-S1 |,| W2-S2 |,| WI-SI |的函数; 相对于Pj(j = 1,...,J)被最小化。 Wi和Si分别表示通过堆叠i(i = 1,...,I)传输到衬底中的实际和目标能量通量。 这些堆叠暴露于由所计算的Pj(j = 1,...,J)表征的源的辐射。