公开(公告)号：US20150075264A1

公开(公告)日：2015-03-19

申请号：US14388744

申请日：2013-03-13

Applicant: Hysitron, Inc.

Inventor： Syed Amanulla Syed Asif ,  Rajiv Dama ,  Ryan Major

IPC: G01N3/40 ,  G02B7/16 ,  G01Q70/02 ,  G01N3/56 ,  G01N3/04

CPC classification number: G01N3/40 ,  G01N3/04 ,  G01N3/068 ,  G01N3/42 ,  G01N3/56 ,  G01N2203/0078 ,  G01N2203/0647 ,  G01Q30/025 ,  G01Q60/366 ,  G01Q70/02 ,  G02B7/16 ,  G02B21/248

Abstract: An objective testing module includes a module base configured for coupling with an objective turret of a microscope. The objective testing module includes a mechanical testing assembly. The mechanical testing assembly is configured to mechanically test a sample at macro scale or less, and quantitatively determine one or more properties of the sample based on the mechanical testing. The mechanical testing assembly optionally includes a probe and one or more transducers coupled with the probe. The transducer measures one or more of force applied to a sample by the probe or displacement of the probe within the sample. In operation, an optical instrument locates a test location on a sample and the objective testing module mechanically tests at the test location with the mechanical testing assembly at a macro scale or less. The mechanical testing assembly further determines one or more properties of the sample according to the mechanical test.

Abstract translation: 客观测试模块包括被配置为与显微镜的目标转台耦合的模块基座。 客观测试模块包括机械测试组件。 机械测试组件被配置为以大规模或更小的尺寸机械测试样品，并且基于机械测试定量地确定样品的一个或多个特性。 机械测试组件可选地包括探针和与探针耦合的一个或多个换能器。 传感器测量通过探头施加到样品的力或样品内探针位移的一种或多种。 在操作中，光学仪器将测试位置定位在样品上，并且客观测试模块在机械测试组件以大规模或更小的程度在测试位置进行机械测试。 机械测试组件根据机械测试进一步确定样品的一个或多个特性。

公开(公告)号：US09804072B2

公开(公告)日：2017-10-31

申请号：US14361133

申请日：2012-11-28

Applicant: Hysitron, Inc.

Inventor： Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Lucas Paul Keranen ,  Ryan Major ,  Yunje Oh ,  Oden Lee Warren ,  Maciej W. Misiak

IPC: G01N3/42 ,  G01N3/54 ,  G01N3/18 ,  G01N3/08 ,  H05B1/02 ,  H05B3/32

CPC classification number: G01N3/54 ,  G01N3/08 ,  G01N3/18 ,  G01N2203/0078 ,  G01N2203/0226 ,  G01N2203/0282 ,  G01N2203/0286 ,  G01N2203/0482 ,  H05B1/023 ,  H05B3/32

Abstract: A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.

公开(公告)号：US20140331782A1

公开(公告)日：2014-11-13

申请号：US14361094

申请日：2012-11-28

Applicant: Hysitron, Inc.

Inventor： Lucas Paul Keranen ,  Syed Amanulla Syed Asif ,  Ryan Major ,  Yunje Oh

IPC: G01N3/18

CPC classification number: G01N3/54 ,  G01N3/08 ,  G01N3/18 ,  G01N2203/0078 ,  G01N2203/0226 ,  G01N2203/0282 ,  G01N2203/0286 ,  G01N2203/0482 ,  H05B1/023 ,  H05B3/32

Abstract: A sample gripping and heating assembly includes an assembly housing and first and second heating grips coupled with the assembly housing. The first and second heating grips each include a gripping surface, and the gripping surfaces of the first and second heating grips are opposed to each other. Each of the first and second heating grips further includes a heating element adjacent to the gripping surface. Optionally, the sample gripping and heating assembly is included in a heating system including a probe heater having a probe heating element for heating of a probe. The heating system is included with a testing assembly having a stage coupled with the sample gripping and heating assembly, and a transducer assembly coupled with the probe heater.

Abstract translation: 样品夹持和加热组件包括组件壳体和与组件壳体耦合的第一和第二加热夹具。 第一和第二加热夹具各自包括抓握表面，并且第一和第二加热夹的夹持表面彼此相对。 第一和第二加热夹具中的每一个还包括与抓握表面相邻的加热元件。 可选地，样品夹持和加热组件包括在包括具有用于加热探针的探针加热元件的探针加热器的加热系统中。 加热系统包括具有与样品夹持和加热组件耦合的台架的测试组件以及与探针加热器耦合的换能器组件。

公开(公告)号：US20170030812A1

公开(公告)日：2017-02-02

申请号：US15295196

申请日：2016-10-17

Applicant: Hysitron, Inc.

Inventor： Edward Cyrankowski ,  Syed Amanulla Syed Asif ,  Ryan Major ,  Derek Rasugu ,  Yuxin Feng

IPC: G01N3/04 ,  H01J37/20 ,  G02B21/26 ,  G01N3/42

Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.

Abstract translation: 包括多自由度样品台的多自由度样品台或测试组件。 多自由度采样台包括多个级，包括线性的，以及一个或多个旋转或倾斜台，其被配置为将样本定位在多个取向中，以便在聚集体积中的多个仪器进行接近或观察，从而限制 多自由度样品阶段。 多自由度样品台包括一个或多个夹紧组件，用于在观察期间将样品静态保持在适当位置，并且例如通过机械测试仪器向样品施加力。 此外，多自由度样品台包括一个或多个交叉滚子轴承组件，其基本上消除了与各个台阶的运动轴正交的方向上的一个或多个阶段的元件之间的机械公差。

公开(公告)号：US09472374B2

公开(公告)日：2016-10-18

申请号：US14347173

申请日：2012-09-28

Applicant: Hysitron, Inc.

Inventor： Edward Cyrankowski ,  Syed Amanulla Syed Asif ,  Ryan Major ,  Derek Rasugu ,  Yuxin Feng

IPC: H01J37/20 ,  G02B21/26 ,  G02B21/32 ,  G21K5/10 ,  G01N3/04 ,  G01N3/42

CPC classification number: G01N3/04 ,  G01N3/42 ,  G01N2203/0026 ,  G01N2203/0206 ,  G02B21/26 ,  G02B21/32 ,  G21K5/10 ,  H01J37/20 ,  H01J2237/202 ,  H01J2237/2062 ,  H01J2237/28

Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.

Abstract translation: 包括多自由度样品台的多自由度样品台或测试组件。 多自由度采样台包括多个级，包括线性的，以及一个或多个旋转或倾斜台，其被配置为将样本定位在多个取向中，以便在聚集体积中的多个仪器进行接近或观察，从而限制 多自由度样品阶段。 多自由度样品台包括一个或多个夹紧组件，用于在观察期间将样品静态保持在适当位置，并且例如通过机械测试仪器向样品施加力。 此外，多自由度样品台包括一个或多个交叉滚子轴承组件，其基本上消除了与各个台阶的运动轴正交的方向上的一个或多个阶段的元件之间的机械公差。

公开(公告)号：US20160123859A1

公开(公告)日：2016-05-05

申请号：US14948549

申请日：2015-11-23

Applicant: Hysitron, Inc.

Inventor： Yunje Oh ,  Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Oden Lee Warren

IPC: G01N1/42 ,  H05B1/02 ,  H05B3/22 ,  G01N3/08

CPC classification number: G01N1/42 ,  G01N3/08 ,  G01N3/18 ,  G01N3/42 ,  G01N2203/0226 ,  G01N2203/0286 ,  G01N2203/04 ,  G01N2223/418 ,  H01J37/20 ,  H05B1/023 ,  H05B3/06 ,  H05B3/22

Abstract: A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.

Abstract translation: 一种亚微米级属性测试装置，包括测试对象支架和加热组件。 组件包括构造成与亚微米机械测试仪器和电 - 机械换能器组件联接的保持器基座。 组件还包括与保持器基座联接的测试对象级。 测试对象阶段与保持器基座热隔离。 测试对象阶段包括被配置为接收测试对象的舞台对象表面和支撑舞台对象表面的舞台。 舞台板在舞台主体表面下。 测试对象阶段还包括与舞台对象表面相邻的加热元件，加热元件构造成在舞台对象表面处产生热量。

公开(公告)号：US09759641B2

公开(公告)日：2017-09-12

申请号：US14948549

申请日：2015-11-23

Applicant: Hysitron, Inc.

Inventor： Yunje Oh ,  Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Oden Lee Warren

IPC: H05B3/20 ,  H05B3/10 ,  G01N1/42 ,  H01J37/20 ,  G01N3/08 ,  H05B1/02 ,  H05B3/22 ,  G01N3/18 ,  G01N3/42

CPC classification number: G01N1/42 ,  G01N3/08 ,  G01N3/18 ,  G01N3/42 ,  G01N2203/0226 ,  G01N2203/0286 ,  G01N2203/04 ,  G01N2223/418 ,  H01J37/20 ,  H05B1/023 ,  H05B3/06 ,  H05B3/22

Abstract: A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface.

公开(公告)号：US20150033835A1

公开(公告)日：2015-02-05

申请号：US14361133

申请日：2012-11-28

Applicant: Hysitron, Inc.

Inventor： Syed Amanulla Syed Asif ,  Edward Cyrankowski ,  Lucas Paul Keranen ,  Ryan Major ,  Yunjie Oh ,  Oden Lee Warren

IPC: G01N3/54 ,  H05B3/32 ,  G01N3/08 ,  H05B1/02

CPC classification number: G01N3/54 ,  G01N3/08 ,  G01N3/18 ,  G01N2203/0078 ,  G01N2203/0226 ,  G01N2203/0282 ,  G01N2203/0286 ,  G01N2203/0482 ,  H05B1/023 ,  H05B3/32

Abstract: A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.

Abstract translation: 用于微米或更小尺度的机械测试的加热系统包括级加热器。 舞台加热器具有舞台平面，舞台加热元件分布在舞台平面上。 在舞台平面的相对两侧有两个或多个支撑座。 第一桥从舞台平面延伸到两个或更多个支撑座的第一安装座，并且第二桥从舞台平面延伸到两个或更多个支撑座的第二安装座。 第一和第二桥梁在台面平面和两个或更多个支撑架之间提供多个支撑件，以相应地支撑台面平面。 在另一示例中，加热系统包括配置成加热探针作为机械测试的一部分的探针加热器。

公开(公告)号：US20140231670A1

公开(公告)日：2014-08-21

申请号：US14347173

申请日：2012-09-28

Applicant: HYSITRON, INC.

Inventor： Edward Cyrankowski ,  Syed Amanulla Syed Asif ,  Ryan Major ,  Derek Rasugu ,  Yuxin Feng

IPC: H01J37/20

CPC classification number: G01N3/04 ,  G01N3/42 ,  G01N2203/0026 ,  G01N2203/0206 ,  G02B21/26 ,  G02B21/32 ,  G21K5/10 ,  H01J37/20 ,  H01J2237/202 ,  H01J2237/2062 ,  H01J2237/28

Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.

Abstract translation: 包括多自由度样品台的多自由度样品台或测试组件。 多自由度采样台包括多个级，包括线性的，以及一个或多个旋转或倾斜台，其被配置为将样本定位在多个取向中，以便在聚集体积中的多个仪器进行接近或观察，从而限制 多自由度样品阶段。 多自由度样品台包括一个或多个夹紧组件，用于在观察期间将样品静态保持在适当位置，并且例如通过机械测试仪器向样品施加力。 此外，多自由度样品台包括一个或多个交叉滚子轴承组件，其基本上消除了与各个台阶的运动轴正交的方向上的一个或多个阶段的元件之间的机械公差。