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公开(公告)号:US20220300049A1
公开(公告)日:2022-09-22
申请号:US17203571
申请日:2021-03-16
Applicant: Intel Corporation
Inventor: Somvir Singh Dahiya , Stephen Gunther , Julien Sebot , Randy Osborne , Scot Kellar , Joshua Een
IPC: G06F1/20 , G06F1/3287 , G05B6/02
Abstract: A thermal management scheme, for a multichip module, that is aware of various dies in a stack (horizontal and/or vertical) and heat generated from them, local hot spots in a victim die, and hot spots in aggressor die(s). Each victim die receives telemetry information from thermal sensors located in aggressor dies as well as local thermal sensors in the victim die. The telemetry information is used to enable a virtual sensing scheme where temperature for a target die (e.g., a victim die) and/or its intellectual property (IP) domain is estimated or calculated. The estimated or calculated temperature is then used for performance management of the victim and/or aggressor dies in the stack.
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公开(公告)号:US12242315B2
公开(公告)日:2025-03-04
申请号:US17203571
申请日:2021-03-16
Applicant: Intel Corporation
Inventor: Somvir Singh Dahiya , Stephen Gunther , Julien Sebot , Randy Osborne , Scot Kellar , Joshua Een
IPC: G06F1/32 , G05B6/02 , G06F1/20 , G06F1/3287 , G06F1/3203
Abstract: A thermal management scheme, for a multichip module, that is aware of various dies in a stack (horizontal and/or vertical) and heat generated from them, local hot spots in a victim die, and hot spots in aggressor die(s). Each victim die receives telemetry information from thermal sensors located in aggressor dies as well as local thermal sensors in the victim die. The telemetry information is used to enable a virtual sensing scheme where temperature for a target die (e.g., a victim die) and/or its intellectual property (IP) domain is estimated or calculated. The estimated or calculated temperature is then used for performance management of the victim and/or aggressor dies in the stack.
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公开(公告)号:US20240063091A1
公开(公告)日:2024-02-22
申请号:US17891735
申请日:2022-08-19
Applicant: Intel Corporation
Inventor: Adel Elsherbini , Feras Eid , Scot Kellar , Yoshihiro Tomita , Rajiv Mongia , Kimin Jun , Shawna Liff , Wenhao Li , Johanna Swan , Bhaskar Jyoti Krishnatreya , Debendra Mallik , Krishna Vasanth Valavala , Lei Jiang , Xavier Brun , Mohammad Enamul Kabir , Haris Khan Niazi , Jiraporn Seangatith , Thomas Sounart
IPC: H01L23/473 , H01L23/00 , H01L25/065 , H01L23/367 , H01L23/373
CPC classification number: H01L23/473 , H01L24/08 , H01L25/0652 , H01L24/16 , H01L24/32 , H01L24/73 , H01L23/3677 , H01L23/3675 , H01L23/3732 , H01L23/3738 , H01L2924/3511 , H01L2224/08145 , H01L2224/08121 , H01L2224/16225 , H01L2224/32225 , H01L2224/73204 , H01L2924/182 , H01L2924/186
Abstract: Microelectronic devices, assemblies, and systems include a multichip composite device having one or more chiplets bonded to a base die and an inorganic dielectric material adjacent the chiplets and over the base die. The multichip composite device is coupled to a structural member that is made of or includes a heat conducting material, or has integrated fluidic cooling channels to conduct heat from the chiplets and the base die.
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