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公开(公告)号:US20230345722A1
公开(公告)日:2023-10-26
申请号:US17726968
申请日:2022-04-22
Applicant: Micron Technology, Inc.
Inventor: Byeung Chul Kim , Joshua Wolanyk , Richard J. Hill , Damir Fazil
IPC: H01L27/11582 , H01L23/535 , H01L27/11556 , H01L27/11529 , H01L27/11573
CPC classification number: H01L27/11582 , H01L23/535 , H01L27/11556 , H01L27/11529 , H01L27/11573
Abstract: Some embodiments include apparatuses and methods of forming the apparatuses. One of the methods includes forming levels of materials one over another; forming a first opening and a second opening in the levels of materials; forming at least one dielectric material in the first and second openings; forming tiers of materials over the levels of materials and over the dielectric material in the first and second openings; forming a first pillar of a memory cell string, the first pillar extending through the tiers of materials and extending partially into a location of the first opening; and forming a second pillar of a contact structure, the second pillar extending through the tiers of materials and through a location of the second opening.
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公开(公告)号:US12040253B2
公开(公告)日:2024-07-16
申请号:US17508143
申请日:2021-10-22
Applicant: Micron Technology, Inc.
Inventor: Alyssa N. Scarbrough , John D. Hopkins , Chet E. Carter , Justin D. Shepherdson , Collin Howder , Joshua Wolanyk
CPC classification number: H01L23/481 , H10B41/10 , H10B41/27 , H10B41/35 , H10B43/10 , H10B43/27 , H10B43/35
Abstract: A memory array comprising strings of memory cells comprises laterally-spaced memory blocks individually comprising a vertical stack comprising alternating insulative tiers and conductive tiers above a conductor tier. Strings of memory cells comprise channel-material strings that extend through the insulative tiers and the conductive tiers. The channel-material strings directly electrically couple with conductor material of the conductor tier by conducting material that is in a lowest of the conductive tiers and that is directly against multiple of the channel-material strings. A through-array-via (TAV) region comprises TAVs that individually extend through the lowest conductive tier and into the conductor tier. Individual of the TAVs in the lowest conductive tier comprise a conductive core having an annulus circumferentially there-about. The annulus has dopant therein at a total dopant concentration of 0.01 to 30 atomic percent. Insulative material in the lowest conductive tier is circumferentially about the annulus and between immediately-adjacent of the TAVs. Other embodiments, including method, are disclosed.
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公开(公告)号:US20250131776A1
公开(公告)日:2025-04-24
申请号:US18785827
申请日:2024-07-26
Applicant: Micron Technology, Inc.
Inventor: Joshua Wolanyk
Abstract: Systems and methods for retaining data related to a detected collision are disclosed including receiving vehicle information from a sensor, receiving information about one or more other vehicles using a communication circuit, receiving an indication of a detected collision, and responsive to the received indication of the detected collision, storing information corresponding to the detected collision from a collision reenactment period in non-volatile memory of the first vehicle and broadcasting the information corresponding to the detected collision using the communication circuit.
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公开(公告)号:US20230062403A1
公开(公告)日:2023-03-02
申请号:US17508143
申请日:2021-10-22
Applicant: Micron Technology, Inc.
Inventor: Alyssa N. Scarbrough , John D. Hopkins , Chet E. Carter , Justin D. Shepherdson , Collin Howder , Joshua Wolanyk
IPC: H01L23/48 , H01L27/11519 , H01L27/11524 , H01L27/11556 , H01L27/11565 , H01L27/1157 , H01L27/11582
Abstract: A memory array comprising strings of memory cells comprises laterally-spaced memory blocks individually comprising a vertical stack comprising alternating insulative tiers and conductive tiers above a conductor tier. Strings of memory cells comprise channel-material strings that extend through the insulative tiers and the conductive tiers. The channel-material strings directly electrically couple with conductor material of the conductor tier by conducting material that is in a lowest of the conductive tiers and that is directly against multiple of the channel-material strings. A through-array-via (TAV) region comprises TAVs that individually extend through the lowest conductive tier and into the conductor tier. Individual of the TAVs in the lowest conductive tier comprise a conductive core having an annulus circumferentially there-about. The annulus has dopant therein at a total dopant concentration of 0.01 to 30 atomic percent. Insulative material in the lowest conductive tier is circumferentially about the annulus and between immediately-adjacent of the TAVs. Other embodiments, including method, are disclosed.
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