Abstract:
Power distribution networks in a three-dimensional (3D) integrated circuit (IC) (3DIC) are disclosed. In one aspect, a voltage drop within a power distribution network in a 3DIC is reduced to reduce unnecessary power dissipation. In a first aspect, interconnect layers devoted to distribution of power within a given tier of the 3DIC are provided with an increased thickness such that a resistance of such interconnect layers is reduced relative to previously used interconnect layers and also reduced relative to other interconnect layers. Further voltage drop reductions may also be realized by placement of vias used to interconnect different tiers, and particularly, those vias used to interconnect the thickened interconnect layers devoted to the distribution of power. That is, the number, position, and/or arrangement of the vias may be controlled in the 3DIC to reduce the voltage drop.
Abstract:
To enable low cost pre-bond testing for a three-dimensional (3D) integrated circuit, a backbone die may have a fully connected two-dimensional (2D) clock tree and one or more non-backbone die may have multiple isolated 2D clock trees. In various embodiments, clock sinks on the backbone die and the non-backbone die can be connected using multiple through-silicon-vias and the isolated 2D clock trees in the non-backbone die can be further connected via a Detachable tree (D-tree), which may comprise a rectilinear minimum spanning tree representing a shortest interconnect among the sinks associated with the 2D clock trees in the non-backbone die. Accordingly, the backbone die and the non-backbone die can be separated and individually tested prior to bonding using one clock probe pad, and the D-tree may be easily removed from the non-backbone die subsequent to the pre-bond testing by burning fuses at the sinks associated with the 2D clock trees.
Abstract:
Monolithic three dimensional (3D) integrated circuit (IC) (3DIC) cross-tier clock skew management systems are disclosed. Methods and related components are also disclosed. In an exemplary embodiment, to offset the skew that may result across the tiers in the clock tree, a cross-tier clock balancing scheme makes use of automatic delay adjustment. In particular, a delay sensing circuit detects a difference in delay at comparable points in the clock tree between different tiers and instructs a programmable delay element to delay the clock signals on the faster of the two tiers. In a second exemplary embodiment, a metal mesh is provided to all elements within the clock tree and acts as a signal aggregator that provides clock signals to the clocked elements substantially simultaneously.
Abstract:
A 3D multi-bit flip-flop may include a two tier structure. The two tier structure may include a first tier containing a common clock circuit for the multi-bit flip-flop as well as the clock driven portions of the individual flip-flops and a second tier containing a common scan circuit for the multi-bit flip-flop as well as the non-clock driven portions of the individual flip-flops. Alternatively, the first tier may include the common clock circuit as well as a portion of the individual flip-flops and the second tier may include the common scan circuit as well as the other portion of the individual flip-flops.
Abstract:
A circuit includes a pulsed-latch circuit. The pulsed-latch circuit includes a first plurality of transistors. One or more of the first plurality of transistors is length-of-diffusion (LOD) protected.
Abstract:
Monolithic three dimensional (3D) flip-flops with minimal clock skew and related systems and methods are disclosed. The present disclosure provides a 3D integrated circuit (IC) (3DIC) that has a flop spread across at least two tiers of the 3DIC. The flop is split across tiers with transistor partitioning in such a way that keeps all the clock related devices at the same tier, thus potentially giving better setup, hold and clock-to-q margin. In particular, a first tier of the 3DIC has the master latch, slave latch, and clock circuit. A second tier has the input circuit and the output circuit.
Abstract:
A circuit includes a pulsed-latch circuit. The pulsed-latch circuit includes a first plurality of transistors. One or more of the first plurality of transistors is length-of-diffusion (LOD) protected.
Abstract:
Power distribution networks in a three-dimensional (3D) integrated circuit (IC) (3DIC) are disclosed. In one aspect, a voltage drop within a power distribution network in a 3DIC is reduced to reduce unnecessary power dissipation. In a first aspect, interconnect layers devoted to distribution of power within a given tier of the 3DIC are provided with an increased thickness such that a resistance of such interconnect layers is reduced relative to previously used interconnect layers and also reduced relative to other interconnect layers. Further voltage drop reductions may also be realized by placement of vias used to interconnect different tiers, and particularly, those vias used to interconnect the thickened interconnect layers devoted to the distribution of power. That is, the number, position, and/or arrangement of the vias may be controlled in the 3DIC to reduce the voltage drop.
Abstract:
Silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) standard library cell circuits having gate back-bias rail(s) are disclosed. Related systems and methods are also disclosed. In one aspect, a SOI CMOS standard library cell circuit is provided that is comprised of one or more standard library cells. Each standard library cell includes one or more PMOS channel regions and one or more NMOS channel regions. Each standard library cell has one or more gate back-bias rails disposed adjacent to PMOS and NMOS channel regions. The gate back-bias rails are configured to apply bias voltages to corresponding PMOS and NMOS channel regions to adjust threshold voltages of PMOS and NMOS transistors associated with the PMOS and NMOS channel regions, respectively. Voltage biasing can be controlled to adjust timing of an IC using SOI CMOS standard library cell circuits to achieve design timing targets without including timing closure elements that consume additional area.
Abstract:
Monolithic three dimensional (3D) integrated circuits (ICs) (3DICs) with vertical memory components are disclosed. A 3D memory crossbar architecture with tight-pitched vertical monolithic intertier vias (MIVs) for inter-block routing and multiplexers at each tier for block access is used to shorten overall conductor length and reduce resistive-capacitive (RC) delay. Elimination of such long crossbars reduces the RC delay of the crossbar and generally improves performance and speed. Further, elimination of the long horizontal crossbars makes conductor routing easier. The MIVs, with their small run-length, can work without the need for repeaters (unlike the long crossbars), and control logic may be used to configure the memory banks based on use.