-
公开(公告)号:US10964618B2
公开(公告)日:2021-03-30
申请号:US16529331
申请日:2019-08-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jang-woo Lee , Kyung-suk Oh , Yung-cheol Kong , Woo-hyun Park , Jong-bo Shim , Jae-myeong Cha
IPC: H01L23/367 , H01L25/18 , H01L23/31 , H01L23/373 , H01L23/00 , H01L21/56
Abstract: A semiconductor package includes a first semiconductor chip, a second semiconductor chip attached to an upper surface of the first semiconductor chip, a silicon heat-dissipation body thermally connected to at least one of the first semiconductor chip and the second semiconductor chip, and a molding member configured to surround the first semiconductor chip and the second semiconductor chip and exposing an upper surface of the silicon heat-dissipation body.
-
公开(公告)号:US10026724B2
公开(公告)日:2018-07-17
申请号:US15444277
申请日:2017-02-27
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ji-hwang Kim , Jong-bo Shim , Sang-uk Han , Cha-jea Jo , Gun-ho Chang
IPC: H01L25/00 , H01L23/00 , H01L23/31 , H01L25/065
Abstract: A method of manufacturing a semiconductor package includes forming at least two partial package chip stacks, each partial package chip stack including at least two semiconductor chips each including a plurality of through substrate vias (TSVs), and including a first mold layer surrounding side surfaces of the at least two semiconductor chips, and sequentially mounting the at least two partial package chip stacks on a package substrate in a direction vertical to a top surface of the package substrate, such that the at least two partial package chip stacks include a first partial package chip stack and a second partial package chip stack directly connected to the first partial package chip stack.
-
公开(公告)号:US20180006006A1
公开(公告)日:2018-01-04
申请号:US15444277
申请日:2017-02-27
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ji-hwang Kim , Jong-bo Shim , Sang-uk Han , Cha-jea Jo , Gun-ho Chang
IPC: H01L25/00 , H01L25/065 , H01L23/31 , H01L23/00
CPC classification number: H01L25/50 , H01L23/3185 , H01L24/05 , H01L24/16 , H01L24/17 , H01L24/73 , H01L25/0657 , H01L2224/0557 , H01L2224/13025 , H01L2224/16146 , H01L2224/17181 , H01L2224/73204 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2225/06565 , H01L2225/06568 , H01L2225/06596 , H01L2225/1023 , H01L2225/1058
Abstract: A method of manufacturing a semiconductor package includes forming at least two partial package chip stacks, each partial package chip stack including at least two semiconductor chips each including a plurality of through substrate vias (TSVs), and including a first mold layer surrounding side surfaces of the at least two semiconductor chips, and sequentially mounting the at least two partial package chip stacks on a package substrate in a direction vertical to a top surface of the package substrate, such that the at least two partial package chip stacks include a first partial package chip stack and a second partial package chip stack directly connected to the first partial package chip stack.
-
公开(公告)号:US20170047294A1
公开(公告)日:2017-02-16
申请号:US15174411
申请日:2016-06-06
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: GUN-HO CHANG , Tae-je Cho , Jong-bo Shim
IPC: H01L23/00 , H01L25/00 , H01L25/065
CPC classification number: H01L23/562 , H01L21/486 , H01L21/561 , H01L21/568 , H01L23/147 , H01L23/49816 , H01L23/49827 , H01L23/5389 , H01L24/19 , H01L24/20 , H01L24/94 , H01L24/96 , H01L24/97 , H01L25/0657 , H01L25/50 , H01L2224/0401 , H01L2224/04105 , H01L2224/0557 , H01L2224/12105 , H01L2224/14181 , H01L2224/16145 , H01L2224/27002 , H01L2224/32145 , H01L2224/73204 , H01L2224/73259 , H01L2224/81005 , H01L2224/83005 , H01L2224/83192 , H01L2224/92224 , H01L2224/94 , H01L2224/97 , H01L2225/06513 , H01L2225/06541 , H01L2225/06568 , H01L2225/06582 , H01L2924/3511 , H01L2224/81 , H01L2224/03 , H01L2224/11 , H01L2224/83 , H01L2224/27 , H01L2924/00
Abstract: A semiconductor package includes a package member and a stress controlling layer. The package member includes an encapsulation layer and at least one chip. The encapsulation layer encapsulates the at least one chip. The stress controlling layer is disposed on a surface of the package member. The stress controlling layer has an internal stress to the extent that the stress controlling layer prevents the package member from having warpage.
Abstract translation: 半导体封装包括封装构件和应力控制层。 封装构件包括封装层和至少一个芯片。 封装层封装至少一个芯片。 应力控制层设置在包装件的表面上。 应力控制层具有内应力至应力控制层防止包装件翘曲的程度。
-
公开(公告)号:US12300665B2
公开(公告)日:2025-05-13
申请号:US17547382
申请日:2021-12-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jang-woo Lee , Un-byoung Kang , Ji-hwang Kim , Jong-bo Shim , Young-kun Jee
IPC: H01L23/48 , H01L21/56 , H01L23/00 , H01L23/31 , H01L25/065
Abstract: A semiconductor package includes a first package substrate, a first semiconductor chip on the first package substrate, a plurality of first chip connection units to connect the first package substrate to the first semiconductor chip, an interposer on the first semiconductor chip, the interposer having a width greater than a width of the first semiconductor chip in a direction parallel to an upper surface of the first package substrate, and an upper filling layer including a center portion and an outer portion, the center portion being between the first semiconductor chip and the interposer, and the outer portion surrounding the center portion and having a thickness greater than a thickness of the center portion in a direction perpendicular to the upper surface of the first package substrate.
-
公开(公告)号:US11637140B2
公开(公告)日:2023-04-25
申请号:US17202702
申请日:2021-03-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ji-hwang Kim , Jong-bo Shim , Sang-uk Han , Cha-jea Jo , Won-il Lee
IPC: H01L27/146
Abstract: An image sensor package includes an image sensor chip on a package substrate, a logic chip on the package substrate and perpendicularly overlapping the image sensor chip, and a memory chip on the package substrate and perpendicularly overlapping the image sensor chip and logic chip. The logic chip processes a pixel signal output from the image sensor chip. The memory chip is electrically connected to the image sensor chip through a conductive wire and stores at least one of the pixel signal from the image sensor chip or a pixel signal processed by the logic chip. The memory chip receives the pixel signal output from the image sensor chip through the conductive wire and receives the pixel signal processed by the logic chip through the image sensor chip and the conductive wire.
-
公开(公告)号:US20200168522A1
公开(公告)日:2020-05-28
申请号:US16529331
申请日:2019-08-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jang-woo Lee , Kyung-suk Oh , Yung-cheol Kong , Woo-hyun Park , Jong-bo Shim , Jae-myeong Cha
IPC: H01L23/367 , H01L23/31 , H01L23/373 , H01L23/00 , H01L25/18 , H01L21/56
Abstract: A semiconductor package includes a first semiconductor chip, a second semiconductor chip attached to an upper surface of the first semiconductor chip, a silicon heat-dissipation body thermally connected to at least one of the first semiconductor chip and the second semiconductor chip, and a molding member configured to surround the first semiconductor chip and the second semiconductor chip and exposing an upper surface of the silicon heat-dissipation body.
-
公开(公告)号:US12113087B2
公开(公告)日:2024-10-08
申请号:US18127110
申请日:2023-03-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ji-hwang Kim , Jong-bo Shim , Sang-uk Han , Cha-jea Jo , Won-il Lee
IPC: H01L27/146
CPC classification number: H01L27/14634 , H01L27/1462 , H01L27/14636 , H01L27/14638
Abstract: An image sensor package includes an image sensor chip on a package substrate, a logic chip on the package substrate and perpendicularly overlapping the image sensor chip, and a memory chip on the package substrate and perpendicularly overlapping the image sensor chip and logic chip. The logic chip processes a pixel signal output from the image sensor chip. The memory chip is electrically connected to the image sensor chip through a conductive wire and stores at least one of the pixel signal from the image sensor chip or a pixel signal processed by the logic chip. The memory chip receives the pixel signal output from the image sensor chip through the conductive wire and receives the pixel signal processed by the logic chip through the image sensor chip and the conductive wire.
-
公开(公告)号:US11227855B2
公开(公告)日:2022-01-18
申请号:US16407429
申请日:2019-05-09
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jang-woo Lee , Un-byoung Kang , Ji-hwang Kim , Jong-bo Shim , Young-kun Jee
Abstract: A semiconductor package includes a first package substrate, a first semiconductor chip on the first package substrate, a plurality of first chip connection units to connect the first package substrate to the first semiconductor chip, an interposer on the first semiconductor chip, the interposer having a width greater than a width of the first semiconductor chip in a direction parallel to an upper surface of the first package substrate, and an upper filling layer including a center portion and an outer portion, the center portion being between the first semiconductor chip and the interposer, and the outer portion surrounding the center portion and having a thickness greater than a thickness of the center portion in a direction perpendicular to the upper surface of the first package substrate.
-
公开(公告)号:US10971535B2
公开(公告)日:2021-04-06
申请号:US15636801
申请日:2017-06-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ji-hwang Kim , Jong-bo Shim , Sang-uk Han , Cha-jea Jo , Won-il Lee
IPC: H01L27/00 , H01L27/146
Abstract: An image sensor package includes an image sensor chip on a package substrate, a logic chip on the package substrate and perpendicularly overlapping the image sensor chip, and a memory chip on the package substrate and perpendicularly overlapping the image sensor chip and logic chip. The logic chip processes a pixel signal output from the image sensor chip. The memory chip is electrically connected to the image sensor chip through a conductive wire and stores at least one of the pixel signal from the image sensor chip or a pixel signal processed by the logic chip. The memory chip receives the pixel signal output from the image sensor chip through the conductive wire and receives the pixel signal processed by the logic chip through the image sensor chip and the conductive wire.
-
-
-
-
-
-
-
-
-