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公开(公告)号：US20240310413A1
公开(公告)日：2024-09-19
申请号：US18604102
申请日：2024-03-13
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Daniel G. Knierim , Matthew J. Hull
CPC classification number: G01R1/203 , G01R1/06794
Abstract: A test and measurement accessory includes a shunt configured to be located in a current path including a device under test, the shunt comprising a wire bundle of individually insulated wires as a resistive portion and a sense lead, the wire bundle and the sense lead electrically connected at a first end, a first electrical contact electrically connected to the sense lead at a second end, and a second electrical contact electrically connected to the wires of the wire bundle at the second end to allow measurement of a voltage drop across the first and second electrical contacts. A test and measurement system includes a test and measurement instrument and the test and measurement accessory. A method includes measuring current using the accessory.
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公开(公告)号：US20240087776A1
公开(公告)日：2024-03-14
申请号：US18243632
申请日：2023-09-07
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Christopher R. Muggli , Daniel G. Knierim , David M. Ediger , Richard N. Atherton
Abstract: A shunt resistor has a substrate having electrically conductive structures to carry current in a current path, a resistive portion in electrical contact with the electrically conductive structures, and one or more canceling inductance leads electrically connected to the electrically conductive structures and the resistive portion, the one or more canceling inductance configured to cancel inductive effects in a voltage measurement across the resistive portion. A modular tip interconnect has a connector at a first end of the interconnect configured to connect to a probe tip of a test and measurement instrument, and the above shunt resistor located at a second end of the interconnect configured to connect to a device under test (DUT).
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公开(公告)号：US20220018896A1
公开(公告)日：2022-01-20
申请号：US17379940
申请日：2021-07-19
Applicant: Tektronix, Inc.
Inventor： Charles W. Case , Daniel G. Knierim , Joshua J. O'Brien , Josiah A. Bartlett , Julie A. Campbell
Abstract: A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.
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公开(公告)号：US10962566B1
公开(公告)日：2021-03-30
申请号：US16241523
申请日：2019-01-07
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Josiah A. Bartlett , David A. Sailor , Jay Schwichtenberg
Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
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公开(公告)号：US10859598B1
公开(公告)日：2020-12-08
申请号：US16288060
申请日：2019-02-27
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Karl A. Rinder , Daniel G. Knierim
Abstract: A method for electrically connecting a test and measurement instrument to a via of a printed circuit board, PCB, the method comprising: dispensing a UV-curable conductive adhesive into a back-drilled hole formed in the PCB, the back-drilled hole extending to the via, such that the dispensed adhesive contacts the via; curing the dispensed adhesive by applying a UV light source to the dispensed adhesive; and connecting a test and measurement instrument to the cured adhesive using a conductive member.
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Patent Agency Ranking
公开(公告)号：US20240069094A1
公开(公告)日：2024-02-29
申请号：US18387810
申请日：2023-11-07
Applicant: Tektronix, Inc.
Inventor： Charles W. Case , Daniel G. Knierim , Joshua J. O'Brien , Josiah A. Bartlett , Julie A. Campbell
CPC classification number: G01R31/2886 , G01R29/26
Abstract: A test system includes a test and measurement device having an input port for receiving signals for testing or measuring, a reprogrammable test accessory having an output coupled to the input port of the test and measurement device. The reprogrammable test accessory includes a test port structured to accept one or more test signals from a Device Under Test (DUT), a processor, a reprogrammable data protocol analyzer for determining whether data carried by the one or more test signals from the DUT conform to a predetermined data protocol, and a reprogramming facility for modifying the reprogrammable data protocol analyzer from a first configuration to a second configuration. Methods of operation are also described.
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公开(公告)号：US11385258B2
公开(公告)日：2022-07-12
申请号：US17062612
申请日：2020-10-04
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Karl A. Rinder , Regina R. Mrozik
Abstract: A method for acquiring a signal from an encapsulated test point on a device under test, includes forming a hole in an encapsulant adjacent to the test point, the hole extending through the encapsulant to the test point, delivering a UV-curable conductive adhesive into the hole such that the delivered adhesive contacts the test point, applying UV light from a UV light source to cure the delivered adhesive, and connecting a conductive element between the cured adhesive and a test and measurement instrument.
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公开(公告)号：US20170115325A1
公开(公告)日：2017-04-27
申请号：US14923242
申请日：2015-10-26
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Josiah A. Bartlett , David A. Sailor , Jay Schwichtenberg
CPC classification number: G01R1/06766 , G01R1/06794 , G01R1/073 , G01R35/005
Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
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公开(公告)号：US20240118314A1
公开(公告)日：2024-04-11
申请号：US18480457
申请日：2023-10-03
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , David M. Ediger , Daniel G. Knierim , David Thomas Engquist
CPC classification number: G01R1/06755 , H01B7/04 , H01B9/006 , H01B9/02
Abstract: A cable assembly has a connector to receive a signal, a cable connected to the connector, the cable having a length and one or more conductors along at least part of the length to conduct the signal, a magnetic material external to the one or more conductors, and an elastomer material external to the one or more conductors. A cable assembly has a connector to receive a differential signal, a cable connected to the connector having symmetric pair conductors, one or more discrete magnetic components spaced along the length of the cable, and one or more elastomer components next to at least one of the one or more magnetic components. A cable assembly has a connector to receive a differential signal, a cable connected to the connector having symmetric pair conductors, an elastomer material at least partially enclosing the cable, and a magnetic material at least partially enclosing the cable.
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公开(公告)号：US20230375596A1
公开(公告)日：2023-11-23
申请号：US18198800
申请日：2023-05-17
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Julie A. Campbell , David M. Ediger
CPC classification number: G01R15/146 , G01R19/10
Abstract: A test and measurement accessory has a shunt configured to be located in a current path between a busbar and an electronic module and structured to minimize length added to the current path, the shunt having an opening extending through the shunt, and a resistive portion, the resistive portion configured to form a portion of the current path, and two or more contacts, at least one of the contacts extending through the opening and electrically insulated from the resistive portion of the shunt. A test and measurement accessory has a shunt, two or more contacts, at least one of the contacts extending through the opening, and a resistive portion comprising a plurality of resistors surrounding an insulative portion. A test and measurement accessory has a shunt including a washer having an opening, a resistive portion, and two or more contacts.
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