Semiconductor inspection device
    91.
    发明授权

    公开(公告)号:US11714120B2

    公开(公告)日:2023-08-01

    申请号:US17515145

    申请日:2021-10-29

    摘要: An inspection system includes a light source, a mirror, Galvano mirrors, a casing that holds the mirror and the Galvano mirrors inside and includes an attachment portion for attaching an optical element, and a control unit that controls a deflection angle of the Galvano mirrors, wherein the control unit controls the deflection angle so that an optical path optically connected to a semiconductor device is switched between a first optical path passing through the Galvano mirrors and the mirror, and a second optical path passing through the Galvano mirrors and the attachment portion, and controls the deflection angle so that the deflection angle when switching to the first optical path has been performed and the deflection angle when switching to the second optical path has been performed do not overlap.

    OPTICAL SENSOR
    93.
    发明公开
    OPTICAL SENSOR 审中-公开

    公开(公告)号:US20230223418A1

    公开(公告)日:2023-07-13

    申请号:US17922803

    申请日:2021-01-12

    IPC分类号: H01L27/146 H01L31/107

    CPC分类号: H01L27/1463 H01L31/107

    摘要: An optical sensor includes an avalanche multiplication region including a first multiplication region having a first conductive type and a second multiplication region having a second conductive type, each of the first multiplication region and the second multiplication region being formed in a layer shape, a charge collection region having the second conductive type disposed on a first side of the second multiplication region, and a first conductive region having the first conductive type disposed on the first side of the second multiplication region. The second multiplication region has a first portion overlapping the charge collection region in a thickness direction of the first multiplication region and the second multiplication region and a second portion overlapping the first conductive region in the thickness direction. A concentration of impurities in the first portion is higher than a concentration of impurities in the second portion.

    LASER MACHINING APPARATUS, LASER MACHINING METHOD, AND METHOD FOR MANUFACTURING SEMICONDUCTOR MEMBER

    公开(公告)号:US20230219172A1

    公开(公告)日:2023-07-13

    申请号:US18014495

    申请日:2021-03-29

    发明人: Takeshi SAKAMOTO

    IPC分类号: B23K26/53 B23K26/40

    摘要: A laser processing device includes: a light source configured to output laser light; a space light modulator for modulating the laser light output from the light source in accordance with a modulation pattern and outputting the modulated laser light; a converging lens for converging the laser light output from the space light modulator to an object, and forming a converging spot on the object; a movement unit for relatively moving the converging spot with respect to the object; and a control unit for relatively moving, while setting a position of the converging spot in a Z direction intersecting with an incident surface of the laser light on the object at a first Z position, the converging spot along a line extended in an X direction along the incident surface by controlling at least the space light modulator and the movement unit.

    LIGHT EMITTING ELEMENT AND REFLECTIVE-TYPE ENCODER

    公开(公告)号:US20230215989A1

    公开(公告)日:2023-07-06

    申请号:US18090002

    申请日:2022-12-28

    摘要: A light emitting element includes: a substrate; a mesa portion formed on the substrate and including an active layer, a first semiconductor layer, and a second semiconductor layer; a metal layer including a first metal part disposed on a top surface of the mesa portion and connected to the second semiconductor layer and a second metal part formed integrally with the first metal part and extending along a side surface of the mesa portion; an insulating layer formed on the side surface; and a resin layer formed on the insulating layer. The first metal part includes an opening region formed with a light passage opening and a connection region for external connection. The second metal part is formed on the side surface via the insulating layer and the resin layer and overlaps the active layer when viewed in a direction perpendicular to a thickness direction of the substrate.

    LIGHT GUIDE AND LIGHT DETECTION DEVICE
    97.
    发明公开

    公开(公告)号:US20230213446A1

    公开(公告)日:2023-07-06

    申请号:US18008503

    申请日:2021-02-10

    IPC分类号: G01N21/64

    CPC分类号: G01N21/645 G01N2201/0636

    摘要: A light guide includes a translucent member. The translucent member includes: a light incident surface where light is incident; a light emitting surface provided on a side of the translucent member opposite to the light incident surface and emitting light; a parabolic first mirror surface facing the light incident surface and reflecting the light incident from the light incident surface as parallel light; and a parabolic second mirror surface facing the first mirror surface and the light emitting surface and reflecting the parallel light reflected by the first mirror surface so as to be condensed toward the light emitting surface.

    Scintillator attachment structure in radiation imaging unit

    公开(公告)号:US11693132B2

    公开(公告)日:2023-07-04

    申请号:US17310819

    申请日:2019-12-23

    IPC分类号: G01T1/20

    CPC分类号: G01T1/20188 G01T1/2002

    摘要: A scintillator attachment structure includes an opening formed in a first side wall portion of a housing and a scintillator holder that holds the scintillator and includes a holder portion fitted in the opening. The scintillator holder can be attached to and detached from the housing. While the scintillator holder is attached to the housing, a predetermined angle is formed between the scintillator held by the holder portion protruding from the first side wall portion into the housing and the front surface mirror in the housing.

    SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

    公开(公告)号:US20230184681A1

    公开(公告)日:2023-06-15

    申请号:US17925131

    申请日:2021-03-17

    发明人: Satoshi YAMAMOTO

    IPC分类号: G01N21/64

    摘要: In this sample observation device, a reference table in which an optimum light amount of planar light at a measurement sensitivity represented by the product of a light amount of the planar light and a scanning speed is set according to the scanning speed is referred to, and the scanning speed of a scanning unit and the optimum light amount of the planar light that is applied to a sample are determined on the basis of the measurement sensitivity selected by a user.

    LIGHT IRRADIATION DEVICE AND SAMPLE OBSERVATION APPARATUS

    公开(公告)号:US20230176352A1

    公开(公告)日:2023-06-08

    申请号:US17924160

    申请日:2021-03-17

    IPC分类号: G02B21/00 G01N21/64

    摘要: A light irradiation device includes: a light source configured to output light having coherence; a light focusing element having a focusing axis and a non-focusing axis intersecting with the focusing axis and configured to focus the light on a focusing line so as to generate planar light; and an aperture mask having an opening part that limits a part of luminous fluxes of the light transmitted from the light source to the light focusing element. The opening part of the aperture mask has opening edges disposed to extend in a direction along the focusing axis of the light focusing element, and, in a case in which the opening edges are projected onto the focusing line, corresponding projected portions have linear spreads.