摘要:
A programmable logic device has a plurality of super-regions of programmable logic disposed on the device in a two-dimensional array of intersecting rows and columns of super-regions. Horizontal and vertical inter-super-region interconnection conductors are associated with each row and column, respectively. Each super-region includes a plurality of regions of programmable logic, and each region includes a plurality of subregions of programmable logic. Inter-region interconnection conductors are associated with each super-region. Local conductors are associated with each region. Shared driver circuits may be provided (e.g., for (1) receiving signals from the subregions and the horizontal and/or vertical conductors, and (2) applying selected received signals to the inter-region conductors, the horizontal and vertical conductors, and possibly also the local conductors). The horizontal and/or vertical conductors may be axially segmented and buffering circuitry may be provided for programmably stitching together axial segments to make longer conductors.
摘要:
A programmable logic device has a plurality of super-regions of programmable logic disposed on the device in a two-dimensional array of intersecting rows and columns of super-regions. Horizontal and vertical inter-super-region interconnection conductors are associated with each row and column, respectively. Each super-region includes a plurality of regions of programmable logic, and each region includes a plurality of subregions of programmable logic. Inter-region interconnection conductors are associated with each super-region, principally for bringing signals into the super-region and interconnecting the regions in the super-region. Local conductors are associated with each region, principally for bringing signals into the region. At the super-region level the device may be horizontally and vertically isomorphic, which helps make it possible to produce devices with low aspect ratios of one or nearly one. Shared driver circuits may be provided (e.g., for (1) receiving signals from the subregions and the horizontal and/or vertical conductors, and (2) applying selected received signals to the inter-region conductors, the horizontal and vertical conductors, and possibly also the local conductors). The horizontal and/or vertical conductors may be axially segmented and buffering circuitry may be provided for programmably stitching together axial segments to make longer conductors.
摘要:
A programmable logic device has a plurality of conductors extending around its periphery for use in providing at least some of the signals needed for control of input/output (“I/O”) pins which are also disposed around the periphery of the device. These control signals may include clock signals, output enable signals, clock enable signals, clear signals, or the like. The conductors that thus extend around the periphery are segmented into plural segments that can either be used independently of one another or programmably stitched together and therefore used together.
摘要:
Scan testing of logic circuitry is facilitated by providing register circuits, each having an input gate configured to selectively pass a data s signal applied to that register, a master stage configured to store a data signal passed by the input gate of that register, an interstage gate configured to selectively pass a data signal stored by the master stage of that register, and a slave stage configured to store a data signal passed by the interstage gate of that register. Inter-register gates are operatively arranged to selectively pass a data signal stored by the master stage of an associated respective first one of the registers to the master stage of an associated respective second one of the registers for storage by the master stage of that second one of the registers. During normal operation, circuitry is configured to alternately enable the input gates and the interstage gates, and to disable the inter-register gates. During a scan mode, circuitry is configured to disable the input gates and the interstage gates, and to alternately enable alternate ones of the inter-register gates.
摘要:
Programmable interconnection group arrangements for selectively interconnecting logic on a programmable logic device are provided. Interconnection groups may be programmed to route signals between the various conductors on the device, and to route signals from various logic regions on the device to the various conductors. The interconnection groups provide routing flexibility and efficiency without using excessive amounts of interconnection resources.
摘要:
A programmable logic device (PLD) includes a plurality of logic array blocks (LAB's) connected by a PLD routing architecture. At least one LAB includes a logic element (LE) configurable to arithmetically combine a plurality of binary input signals in a plurality of stages. The LE comprises look-up table (LUT) logic having K inputs (a “K-LUT”). The K-LUT is configured to input the binary input signals at respective inputs of the K-LUT logic cell and to provide, at a plurality of outputs of the K-LUT logic cell, respective binary result signals indicative of at least two of the plurality of stages of the arithmetic combination of binary input signals. An input line network includes a network of input lines, the input lines configurable to receive input signals from the PLD routing architecture that represent the binary input signals and to provide the input signals to the K-LUT. An output line network includes a network of output lines, the output lines configured to receive, from the K-LUT, output signals that represent the binary result signals and to provide the output signals to the PLD routing architecture. The described LUT's can perform arithmetic efficiently, as well as non-arithmetic functions.
摘要:
Memory elements are provided that exhibit immunity to soft error upset events when subjected to radiation strikes such as high-energy atomic particle strikes. The memory elements may each have four inverter-like transistor pairs that form a bistable element and a pair of address transistors. There may be four nodes in the transistor each of which is associated with a respective one of the four inverter-like transistor pairs. There may be two control transistors each of which is coupled between the transistors in a respective one of the inverter-like transistor pairs. During data writing operations, the two control transistors may be turned off to temporarily decouple the transistors in two of the four inverter-like transistor pairs.
摘要:
An integrated circuit having a logic element that includes an array of storage elements convertibly functioning as either a configuration random access memory (CRAM) or a static random access memory (SRAM) is provided. The logic element includes first and second pairs of data paths having dedicated multiplexers. In one embodiment, the first and second pairs of data paths are multiplexed into bit lines of a row of the array. The logic element also includes a data path control block generating control signals for each of the dedicated multiplexers. The control signals determine whether the storage elements function as a CRAM or a SRAM. A method for selectively configuring a memory array between a CRAM mode and SRAM mode are provided.
摘要:
A programmable logic device (PLD) includes at least two regions. Each region includes electrical circuitry that has a set of transistors. Each of the two regions has a corresponding fixed transistor threshold voltage, a corresponding fixed transistor body bias, and a corresponding fixed supply voltage.
摘要:
Error detection circuitry is provided on a programmable logic resource. Programmable logic resource configuration data is loaded into a cyclic redundancy check (CRC) module where a checksum calculation may be performed. In one embodiment, the checksum may be compared to an expected value, which is a precomputed checksum on data prior to being programmed into or while data is being programmed into a programmable logic resource. In another embodiment, the expected value may be included in the checksum calculation. An output indicating whether an error is detected may be generated depending on the relationship between the checksum and the expected value, or on the value of the checksum. This output may be sent to an output pin that is accessible by user logic.