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312 条记录 (耗时 0.039 秒)

    High-frequency switch
    101.
    发明授权
    High-frequency switch 失效
    高频开关

    公开(公告)号：US6070059A

    公开(公告)日：2000-05-30

    申请号：US760690

    申请日：1996-12-04

    申请人： Mitsuhide Kato ,  Norio Nakajima ,  Koji Tanaka

    发明人： Mitsuhide Kato ,  Norio Nakajima ,  Koji Tanaka

    IPC分类号： H01P1/15 ,  H04B1/48 ,  H01P5/18 ,  H01P1/10 ,  H04B1/46

    CPC分类号： H01P1/15 ,  H04B1/48

    摘要： A high-frequency switch in which insertion losses can be reduced and a wiring pattern for supplying control voltages can be simplified. The high-frequency switch has first through fourth ports. A transmission line is connected between each pair of the ports, thereby connecting the pairs of ports to each other. A respective capacitor is coupled between each of the ports and a corresponding one of the nodes between the respective transmission lines. A diode is connected between each of said nodes and a reference potential. A capacitor is coupled between the reference potential and each of the diodes. First through fourth control voltage terminals are connected to respective nodes between each of the diodes and the corresponding capacitors.

    摘要翻译： 可以减少插入损耗的高频开关和用于提供控制电压的布线图案。 高频开关具有第一至第四端口。 传输线连接在每对端口之间，从而将端口对彼此连接起来。 相应的电容器耦合在每个端口和相应的传输线之间的相应的节点之间。 二极管连接在每个所述节点和参考电位之间。 电容器耦合在参考电位和每个二极管之间。 第一至第四控制电压端子连接到每个二极管和相应的电容器之间的相应节点。

    Sealed chain
    102.
    发明授权
    Sealed chain 失效
    密封链

    公开(公告)号：US5787700A

    公开(公告)日：1998-08-04

    申请号：US865768

    申请日：1997-05-30

    申请人： Koji Tanaka

    发明人： Koji Tanaka

    IPC分类号： F16G13/02 ,  F16G13/06

    CPC分类号： F16G13/06

    摘要： A sealed chain is provided that traps lubricant and dust electrostatically. The chain includes an inner plate which is penetrated by a bushing and an outer plate which is penetrated by a pin. The inner and outer plates are connected alternatingly. Between the inner plate and the outer plate, a seal which is coaxial with the bushing and the pin, is provided in contact with the inner and outer plates. The contact area between the seal and the inner plate is smaller than the contact area between the seal and the outer plate. An annular dust hole, which is around the end of the bushing for sliding on the pin is formed on the inner part of the surface of the seal facing the inner plate. When chain bends due to, for example, winding by a sprocket, the seal slides on the inner plate thus, generating electrostatic charge. The end of the bushing 12, which slides on the pin, is encircled by the dust hole, which entraps lubricant electrostatically on sliding surfaces and dust formed by the wear of sliding surfaces.

    摘要翻译： 提供密封的链条，以静电方式收集润滑剂和粉尘。 链条包括被衬套穿透的内板和被销钉穿过的外板。 内板和外板交替连接。 在内板和外板之间，与衬套和销同轴的密封件设置成与内板和外板接触。 密封件和内板之间的接触面积小于密封件和外板之间的接触面积。 在面向内板的密封件的表面的内部形成有围绕用于在销上滑动的衬套的端部周围的环形灰尘孔。 当链条由于例如由链轮卷绕而弯曲时，密封件在内板上滑动从而产生静电荷。 在销上滑动的衬套12的端部被灰尘孔包围，该灰尘孔滑动表面上静电吸入润滑剂，并且由滑动表面的磨损形成的灰尘。

    Method for testing semiconductor device
    105.
    发明授权
    Method for testing semiconductor device 失效
    半导体器件测试方法

    公开(公告)号：US5436559A

    公开(公告)日：1995-07-25

    申请号：US109957

    申请日：1993-08-23

    申请人： Ryoichi Takagi ,  Tetsuo Tada ,  Koji Tanaka

    发明人： Ryoichi Takagi ,  Tetsuo Tada ,  Koji Tanaka

    IPC分类号： G01R31/28 ,  G01R31/319 ,  G01R31/3193

    CPC分类号： G01R31/2844 ,  G01R31/31924 ,  G01R31/31937

    摘要： A method of testing a semiconductor device operating according to predetermined testing information. An output signal of the semiconductor device is received through a signal transmission line and a reference voltage is generated in accordance with an expected logical level of the output signal. The reference voltage is compared with a voltage of the output signal thus received and a current flow is supplied to the signal transmission line in accordance with the result. A logical level of the output signal thus received is determined and a decision is made whether the semiconductor device operates correctly.

    摘要翻译： 一种测试根据预定测试信息操作的半导体器件的方法。 通过信号传输线接收半导体器件的输出信号，并根据输出信号的预期逻辑电平产生参考电压。 将参考电压与如此接收的输出信号的电压进行比较，并根据结果将电流提供给信号传输线。 确定如此接收的输出信号的逻辑电平，并且确定半导体器件是否正常工作。

    Vehicle height adjusting device
    107.
    发明授权
    Vehicle height adjusting device 失效
    车高调整装置

    公开(公告)号：US5344189A

    公开(公告)日：1994-09-06

    申请号：US945650

    申请日：1992-12-22

    申请人： Koji Tanaka ,  Takashi Shima

    发明人： Koji Tanaka ,  Takashi Shima

    IPC分类号： B60G17/017 ,  B60G17/04 ,  B60G17/052 ,  B60S9/00

    CPC分类号： B60G17/0523 ,  B60G17/017 ,  B60G17/0424 ,  B60G2202/152 ,  B60G2202/154 ,  B60G2300/14 ,  B60G2500/30 ,  B60G2800/20 ,  B60G2800/202

    摘要： A vehicle height adjusting device capable of kneeling without exhausting air in air springs into the atmosphere. It is possible to perform the kneeling in addition to a forward inclination without using supporting legs, a specific pump, and a moving device, as well as a disengaging device therefor. Furthermore, in order to avoid using the aforesaid moving device, kneeling circuits including an air reservoir device are provided, and when kneeling, the air inside the respective air springs is moved to and stored in the air reservoir device. As a result, the front part or the whole of the vehicle body is caused to kneel, while when returning from the kneeling state, the air stored in the air reservoir device is returned to the respective air springs by virtue of hydraulic pressure from a hydraulic source via the kneeling circuits. The entire vehicle body is returned to its original state with a normal air suspension state that is controlled by leveling valves.

    摘要翻译： PCT No.PCT / JP92 / 00199 Sec。 371日期1992年12月22日 102（e）日期1992年12月22日PCT提交1992年2月25日PCT公布。 公开号WO92 / 15465 日期：1992年9月17日。一种车辆高度调节装置，能够在空气中不排出空气而跪下进入大气。 除了前倾之外，还可以不使用支撑腿，特定的泵和移动装置，也可以进行下跪以及其脱离装置。 此外，为了避免使用上述移动装置，设置包括储气装置的跪路，并且当跪下时，各空气弹簧内的空气被移动并储存在储气装置中。 结果，使车身的前部或整体跪下，当从跪状态返回时，存储在储气装置中的空气由于来自液压的液压而返回到各个空气弹簧 通过跪下的电路来源。 整个车体通过调平阀控制的正常空气悬架状态恢复到原始状态。

    High moisture-absorbing and releasing fibers and process for producing the same
    108.
    发明授权
    High moisture-absorbing and releasing fibers and process for producing the same 失效
    高吸水和释放纤维及其制备方法

    公开(公告)号：US5292822A

    公开(公告)日：1994-03-08

    申请号：US973386

    申请日：1992-11-10

    申请人： Koji Tanaka ,  Kazutoshi Muta

    发明人： Koji Tanaka ,  Kazutoshi Muta

    IPC分类号： D06M11/00 ,  C08F8/30 ,  D06M11/38 ,  D06M11/63 ,  D06M23/00 ,  D06M101/00 ,  D06M101/16 ,  D06M101/18 ,  D06M101/28

    CPC分类号： C08F8/30 ,  C08F2800/20

    摘要： High-moisture absorbing and releasing fibers which have moisture-absorbing properties and moisture-releasing properties, are resistant to repetitive use, and have both flame resistance and antibacterial properties and a process for producing the same are provided.Acrylic fibers in which increase in nitrogen content by hydrazine cross-linking, an amount of salt type carboxyl groups and amido groups by modification of nitrile groups, tensile strength, LOI and sterilization rate are specifically adjusted. Such the fibers are obtained by hydrazine cross-linking treatment, hydrolysis treatment and conversion of the carboxyl groups to the salt type.High-moisture absorbing and releasing fibers having excellent processability in addition to flame resistance and antibacterial properties are obtained. Such the fibers can also be used repeatedly.

    摘要翻译： 具有吸湿性和脱湿性的高吸湿释放纤维耐重复使用，并且具有阻燃性和抗菌性两个特征，其制造方法。 通过肼交联提高氮含量的增加的丙烯酸纤维，通过腈基的改性，盐类羧基和酰胺基的量，拉伸强度，LOI和灭菌率被特别调整。 这样的纤维通过肼交联处理，水解处理和羧基转化为盐类获得。 获得除阻燃性和抗菌性以外具有优异加工性能的高吸水和释放纤维。 这样的纤维也可以重复使用。

    Apparatus and method for testing semiconductor device
    109.
    发明授权
    Apparatus and method for testing semiconductor device 失效
    半导体器件测试装置及方法

    公开(公告)号：US5266894A

    公开(公告)日：1993-11-30

    申请号：US805140

    申请日：1991-12-11

    申请人： Ryoichi Takagi ,  Tetsuo Tada ,  Koji Tanaka

    发明人： Ryoichi Takagi ,  Tetsuo Tada ,  Koji Tanaka

    IPC分类号： G01R31/28 ,  G01R31/319 ,  G01R31/3193

    CPC分类号： G01R31/2844 ,  G01R31/31924 ,  G01R31/31937

    摘要： A semiconductor testing apparatus includes a comparator for receiving a signal output to a pin terminal of a semiconductor device under test through a transmission line and determining a logical level of the received signal. Semiconductor testing apparatus 1 further includes a current supply circuit for comparing a voltage of an input terminal of comparator with a reference voltage applied by reference voltage sources and supplying a current to transmission line. When a signal ringing on transmission line and a reflection with undershoot and overshoot at input terminal occur, current supply circuit supplies a current to transmission line in accordance with a relationship of magnitude between the voltage at input terminal and the reference voltage. The current supply to transmission line is made to inhibit the overshoot and undershoot of the signal. This allows comparator to carry out a functional testing and a measurement of DC/AC characteristics of a semiconductor device at precise timing and at high speed.

    摘要翻译： 半导体测试装置包括：比较器，用于通过传输线接收输出到被测半导体器件的引脚端子的信号，并确定接收信号的逻辑电平。 半导体测试装置1还包括电流供应电路，用于将比较器的输入端的电压与由参考电压源施加的参考电压进行比较，并将电流提供给传输线。 当传输线上的信号振铃和在输入端子处产生下冲和过冲的反射出现时，电流源电路根据输入端电压和参考电压之间的大小关系向传输线提供电流。 传输线的电流供应是为了抑制信号的过冲和下冲。 这允许比较器在精确的定时和高速下进行半导体器件的DC / AC特性的功能测试和测量。