Abstract:
The etchant material of this invention comprises a chemical etchant composition including a halogen-containing feed gas and gaseous carbon dioxide. Typically, the halogen-containing feed gas is a fluorine-containing or a chlorine-containing feed gas, or both a fluorine-containing and a chlorine-containing feed gas. Preferably, the chlorine-containing feed gas comprises chlorine gas or HCl, and the fluorine-containing feed gas comprises SF.sub.6 or NF.sub.3. The fluorine-containing feed gas can also comprise CF.sub.4, or C2F.sub.6.
Abstract:
A method is provided for fabricating a high resistance row (or column) electrode with which a low resistance runner is associated. The electrode is formed, preferably from a substantially transparent material, and a low resistant (i.e., highly conductive material) is disposed thereon. The highly conductive material is subsequently etched such that the highly conductive material remains along the sides of the electrode, thereby reducing the resistivity of the electrode.
Abstract:
A method to anisotropically etch an oxide/poly/oxide or an oxide/poly/oxide sandwich structure on a silicon wafer substrate in situ, that is, using a single parallel plate plasma reactor chamber and a single inert cathode, with a variable gap between cathode and anode. This method has an oxide etch step and a silicide/poly etch step. In the poly removal step, helium is added to improve etch uniformity. The pressure, power, and various gas quantities are balanced to produce the fastest etch rates while preserving selectivity. The fully etched sandwich structure has a vertical profile at or near 90.degree. from horizontal.
Abstract:
A process for creating a metal etch mask from either cobalt, nickel, palladium, iron or copper which may be utilized for halogen-plasma excavation of deep trenches. The process begins by creating a thin isolation layer of either silicon nitride or silicon dioxide on top of the layer to be trenched. A thin layer of one of the metals selected from the aforementioned list of five is then created on top of the isolation layer. A layer of polysilicon is then blanket deposited on top of the refractory metal layer. Photoresist masking is then performed as though the photoresist were the actual pattern for the trench etch. Exposed portions of the polysilicon layer are then etched away with an anisotropic etch. Following a photoresist strip, the substrate and overlying layers are subjected to an elevated temperature step, which causes the polysilicon to react with the underlying metal layer to form metal silicide. In substrate regions where no polysilicon overlies the metal layer, no silicide is formed. Next, the metal silicide is removed with a wet etch. A metal mask remains that is essentially an exact image of the original photoresist mask. Trenches may be etched to any desired depth with virtually no consumption of the metal mask. Once the trench etch is complete, the metal etch mask may be stripped utilizing a wet etch reagent such as aqua regia.
Abstract:
A plasma dry etch chamber is provided with an anode plate which has a cooling jacket which extends radially outwardly from a cooling core to an extent corresponding to the radial dimension of a silicon wafer work product. In order to further reduce deposit formation, the outer perimeter of the anode is designed to reduce the effects of polymer deposition.
Abstract:
A method including receiving a voice call; analyzing speech in real-time to determine whether payment information is included in the voice call; omitting to record the voice call when it is determined that the voice call includes the payment information; and recording the voice call when it is determined that the voice call does not include the payment information.
Abstract:
A radio frequency communication device and methods of testing and tuning an antenna attached thereto are described. A radio frequency communication device comprises internal circuitry and an antenna having a plurality of antenna segments associated therewith. Each antenna segment is associated with the antenna in either series or parallel relation through at least one of a fuse and an antifuse. In testing and tuning, a comparison is made to indicate whether the antenna is too short or too long.
Abstract:
A radio frequency communication device and method are disclosed. In one aspect, an RFID tag includes an adjustable antenna having a main segment and one or more additional segments that are short relative to the main segment; and the antenna is adjustable to electrically isolate one or more of the additional segments from the main segment. In another aspect, an RFID tag includes an antenna having a first section and a second section short relative to the first section; and the antenna is adjustable to disconnect the first and second sections from each other at a predetermined location. In a further aspect, an RFID tag includes an antenna having a first section and a second section; and the first section is adjustable to decrease the first length of the first section and the second section adjustable to increase the second length of the second section.
Abstract:
The disclosed method for forming a field emission display includes forming a cathode and an anode, forming a plurality of photoresist posts over the cathode, and coating the posts with a coating material. The coating material forms sidewalls around the posts. The photoresist posts may then be removed from within the sidewalls. The anode may then be fitted onto the sidewalls so that the sidewalls function as spacers in the field emission display.
Abstract:
An apparatus for stabilizing the threshold voltage in an active matrix field emission device is disclosed. The apparatus includes the formation of radiation-blocking elements between a cathodoluminescent display screen of the FED and semiconductor junctions formed on a baseplate of the FED.