DOUBLE SPIN FILTER TUNNEL JUNCTION
    122.
    发明申请

    公开(公告)号:US20170098762A1

    公开(公告)日:2017-04-06

    申请号:US15298674

    申请日:2016-10-20

    Abstract: A memory device that includes a first magnetic insulating tunnel barrier reference layer present on a first non-magnetic metal electrode, and a free magnetic metal layer present on the first magnetic insulating tunnel barrier reference layer. A second magnetic insulating tunnel barrier reference layer may be present on the free magnetic metal layer, and a second non-magnetic metal electrode may be present on the second magnetic insulating tunnel barrier. The first and second magnetic insulating tunnel barrier reference layers are arranged so that their magnetizations are aligned to be anti-parallel.

    OTP MRAM
    123.
    发明授权
    OTP MRAM 有权

    公开(公告)号:US09614144B1

    公开(公告)日:2017-04-04

    申请号:US14976207

    申请日:2015-12-21

    CPC classification number: H01L43/12 H01L43/08

    Abstract: Techniques for forming OTP memory elements with reduced breakdown voltage are provided. In one aspect, a method of forming an OTP MRAM element includes the steps of: creating a substrate having surface topology; and forming the OTP MRAM element on the substrate over the surface topology, wherein the OTP MRAM element comprises a first magnetic metal layer and a second metal magnetic layer separated by a tunnel barrier, and wherein by forming the OTP MRAM element over the surface topology the tunnel barrier has both a first thickness T1 and second thickness T2, wherein T1 is greater than T2. A method of forming a device having both MTP MRAM and OTP MRAM elements is provided, as is an MRAM device.

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