Abstract:
What is disclosed is a novel system and method for generating a spectral matching guide for spot color print applications. Spectral matching values are determined for spot colors obtained from a library of spot colors. A spectral matching guide is created from the spot colors and their respective spectral matching values in a manner more fully disclosed herein. Thereafter, when a user desires to render a job in a particular spot color, the associated spectral matching value for that spot color can be obtained from the spectral matching guide. In other embodiments, recommendations in the form of a suggested printer to use, a media type, a halftone screen, and other meaningful assistance can be provided for selection of spot colors for a given print/copy job that are less sensitive to varying illuminations. The present spectral matching guide provides meaningful extensions in spectral color reproduction in print/copy job environments.
Abstract:
In a spectrographic workpiece metrology system having an optical viewing window, the viewing window is calibrated against a reference sample of a known absolute reflectance spectrum to produce a normalized reflectance spectrum of the reference sample, which is combined with the absolute reflectance spectrum to produce a correction factor. Successive production workpieces are measured through the window and calibrated against the viewing window reflectance, and transformed to absolute reflectance spectra using the same correction factor without having to re-load the reference sample.
Abstract:
Described herein are spectrometers comprising one or more wavelength-selective filters, such as guided mode resonance filters. Some of the spectrometers described herein are configured for obtaining absorbance spectra in a discrete fashion by measuring absorbances of a sample at multiple discrete wavelengths or wavelength bands. In another aspect, methods are also provided for obtaining spectra, images and chemical maps of samples in a discrete fashion.
Abstract:
An apparatus and method to determine overlay of a target on a substrate (6) by measuring, in the pupil plane (40) of a high numerical aperture len (L1), an angle-resolved spectrum as a result of radiation being reflected off the substrate. The overlay is determined from the anti-symmetric component of the spectrum, which is formed by subtracting the measured spectrum and a mirror image of the measured spectrum. The measured spectrum may contain only zeroth order reflected radiation from the target.
Abstract:
A metrology apparatus includes first (21) and second (22) radiation sources which generate first (iB1) and second (iB2) illumination beams of different spatial extent and/or angular range. One of the illumination beams is selected, e.g. according to the size of target to be measured. The beam selection can be made by a tillable mirror (254) at a back-projected substrate plane in a Kohler illumination setup.
Abstract:
An image processing system includes a photographing apparatus and a processing apparatus. The photographing apparatus includes LEDs for emitting light with characteristics of spectroscopic distributions varied in a visible light area, an image pick-up device unit which picks-up a subject image that is illuminated by the LEDs and is formed by an image pick-up optical system and which outputs an image signal, and a control unit. The control unit sequentially lights-on the LEDs upon an instruction for photographing a subject spectroscopic image being input from an operating switch, picks-up the image, and thus controls the operation for capturing subject spectroscopic images. The processing apparatus includes a calculating device which performs a desired image calculation based on the image signal.
Abstract:
Customized spectral profiles, and filters and illuminants having a customized spectral profile, optimized to reduce light in one or more wavelength regions for which one or more pigments are relatively more susceptible to perceptible changes in appearance.
Abstract:
The present invention relates to an image processing system and an image processing method, an image pickup apparatus and an image pickup method, and an image display device and an image display method, which can faithfully pick up and display the colors of an object. Slit light of an optical image of the object that has passed through a slit 42 is divided into a spectrum by a light divider 43. A light sensor 44 outputs image data based on the spectrum of the slit light of the optical image of the object. A micromirror array 74 causes the exiting of reflection light formed by extracting spectrum portions based on the image data from a spectrum of incident white light from a light divider 73. The spectrum portions of the reflection light exiting from the micromirror array 74 are synthesized by a spectrum synthesizer 77 and are projected onto a screen 111. The present invention is applicable to the image processing system.
Abstract:
In a spectrographic workpiece metrology system having an optical viewing window, the viewing window is calibrated against a reference sample of a known absolute reflectance spectrum to produce a normalized reflectance spectrum of the reference sample, which is combined with the absolute reflectance spectrum to produce a correction factor. Successive production workpieces are measured through the window and calibrated against the viewing window reflectance, and transformed to absolute reflectance spectra using the same correction factor without having to re-load the reference sample.
Abstract:
The present invention aims at providing a method for detecting a color of a signal light from a moving vehicle such as railroad train. The method includes capturing an image from a camera mounted on the moving vehicle and extracting candidate regions in the image that contain light region. The method further includes classifying the candidate regions as a signal light region or a non-signal light region and identifying the color of the signal light region.