Circuit and method for scan testing
    161.
    发明授权

    公开(公告)号:US11714131B1

    公开(公告)日:2023-08-01

    申请号:US17699900

    申请日:2022-03-21

    Abstract: In an embodiment, a method for performing scan testing includes: generating first and second scan clock signals; providing the first and second scan clock signals to first and second scan chains, respectively, where the first and second scan clock signals includes respective first shift pulses when a scan enable signal is asserted, and respective first capture pulses when the scan enable signal is deasserted, where the first shift pulse of the first and second scan clock signals correspond to a first clock pulse of a first clock signal, where the first capture pulse of the first scan clock signal corresponds to a second clock pulse of the first clock signal, and where the first capture pulse of the second scan clock signal corresponds to a first clock pulse of a second clock signal different from the first clock signal.

    TIME INTERLEAVING CIRCUIT HAVING GLITCH MITIGATION

    公开(公告)号:US20230231546A1

    公开(公告)日:2023-07-20

    申请号:US18151332

    申请日:2023-01-06

    Inventor: Aradhana KUMARI

    CPC classification number: H03K5/1252 H03K5/135

    Abstract: Provided is a time interleaving circuit to mitigate glitches. A first loading stage outputs first data representative of first serialized data. A second loading stage generates second serialized data. The second loading stage receives the first data output by the first loading stage. In response to the first data having a first state, the time interleaving circuit inverts the second serialized data to generate second data representative of the second serialized data. In response to the first data having a second state, the time interleaving circuit outputting the second data without inverting the second serialized data. Exclusive disjunction logic receives the second data and operates on the first data and the second data to generate output data.

    Glitch suppression apparatus and method

    公开(公告)号:US11687428B2

    公开(公告)日:2023-06-27

    申请号:US17152901

    申请日:2021-01-20

    CPC classification number: G06F11/263 G06F1/06 G06F11/2236

    Abstract: An apparatus includes a main core processor configured to receive a first signal through a first main buffer, a second signal through a second main buffer, a third signal through a third main buffer and a fourth signal through a fourth main buffer, a shadow core processor configured to receive the first signal through a first shadow buffer, the second signal through a second shadow buffer, the third signal through a third shadow buffer and the fourth signal through a fourth shadow buffer, and a first glitch suppression buffer coupled to a common node of an input of the first main buffer and an input of the first shadow buffer.

    IN-MEMORY COMPUTE ARRAY WITH INTEGRATED BIAS ELEMENTS

    公开(公告)号:US20230186983A1

    公开(公告)日:2023-06-15

    申请号:US18167580

    申请日:2023-02-10

    CPC classification number: G11C11/419 H10B10/12

    Abstract: An in-memory compute (IMC) device includes an array of memory cells and control logic coupled to the array of memory cells. The array of memory cells is arranged as a plurality of rows of cells intersecting a plurality of columns of cells. The array of memory cells includes a first subset of memory cells forming a plurality of computational engines at intersections of rows and columns of the first subset of the array of memory cells. The array also includes a second subset of memory cells forming a plurality of bias engines. The control logic, in operation, generates control signals to control the array of memory cells to perform a plurality of IMC operations using the computational engines, store results of the plurality of IMC operations in memory cells of the array, and computationally combine results of the plurality of IMC operations with respective bias values using the bias engines.

    RESET AND SAFE STATE LOGIC GENERATION IN DUAL POWER FLOW DEVICES

    公开(公告)号:US20230168699A1

    公开(公告)日:2023-06-01

    申请号:US17967498

    申请日:2022-10-17

    CPC classification number: G05F1/46 H03K19/20

    Abstract: An electric device includes: a first power domain; a second power domain; a third power domain, where during power-up, the third, the second, and the first power domains are configured to be powered up sequentially, where during standby-exit, the first, the second, and the third power domains are configured to be powered up sequentially; isolation paths that provide controlled signal transmission among the first, the second, and the third power domains, where each isolation path includes an isolation circuit between an input power domain and an output power domain of the isolation path; and a control circuit in the first power domain, where for each isolation path, the control circuit is configured to generate an isolation control signal for the isolation circuit, where the isolation circuit is configured enable or disable signal transmission along the isolation path.

    Pulse width modulator with reduced pulse width

    公开(公告)号:US11646741B2

    公开(公告)日:2023-05-09

    申请号:US17931043

    申请日:2022-09-09

    CPC classification number: H03L7/0812 H03L7/085

    Abstract: An integrated circuit includes a pulse width modulator. The pulse width modulator includes a multiplexer that receives a plurality of data delay signals. Each of the data delay signals is based on a data signal and a respective clock phase signal. The multiplexer includes a first multiplexer stage and a second multiplexer stage. The first multiplexer stage receives all of the data delay signals and has a relatively large delay. The second multiplexer stage receives to output signals from the first multiplexer stage and has a relatively small delay. The second multiplexer stage outputs a pulse width modulation signal that can have a pulse width corresponding to the offset between two adjacent clock phase signals.

Patent Agency Ranking