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    PHOTODETECTING SEMICONDUCTOR APPARATUS AND MOBILE DEVICE
    161.
    发明申请
    PHOTODETECTING SEMICONDUCTOR APPARATUS AND MOBILE DEVICE 审中-公开
    光电半导体设备和移动设备

    公开(公告)号：US20100127159A1

    公开(公告)日：2010-05-27

    申请号：US12571797

    申请日：2009-10-01

    Applicant: Nobuhisa WATANABE

    Inventor： Nobuhisa WATANABE

    IPC: G01J1/42

    CPC classification number: G01J1/02 ,  G01J1/0204 ,  G01J1/0209 ,  G01J1/0214 ,  G01J1/0242 ,  G01J1/0271 ,  G01J1/04 ,  G01J1/044 ,  G01J1/0488 ,  G01J1/4204 ,  G01J1/4228

    Abstract: One embodiment of a photodetecting semiconductor apparatus is provided with a sensor chip, a resin-sealed package in which the sensor chip is resin-sealed with a transparent resin, and a color filter disposed on the surface of the sensor chip, with a sensor circuit unit and a light-sensitive element group being formed in the sensor chip. The light-sensitive element group is configured with a color light-sensitive element having a sensitivity peak for color and an infrared light-sensitive element having a sensitivity peak for infrared light. The color light-sensitive element includes a red light-sensitive element having a sensitivity peak for red, a green light-sensitive element having a sensitivity peak for green, and a blue light-sensitive element having a sensitivity peak for blue.

    Abstract translation: 光检测半导体装置的一个实施例设置有传感器芯片，其中传感器芯片用透明树脂树脂密封的树脂密封封装和设置在传感器芯片表面上的滤色器，传感器电路 单元和感光元件组形成在传感器芯片中。 感光元件组配置有具有用于颜色的灵敏度峰值的彩色感光元件和具有用于红外光的灵敏度峰值的红外光敏元件。 彩色感光元件包括具有红色灵敏度峰值的红色感光元件，具有用于绿色的灵敏度峰值的绿色感光元件和具有蓝色灵敏度峰值的蓝色感光元件。

    Near-field optical apparatus and method using photodetector array
    162.
    发明授权
    Near-field optical apparatus and method using photodetector array 有权
    近场光学装置和使用光电检测器阵列的方法

    公开(公告)号：US07719685B2

    公开(公告)日：2010-05-18

    申请号：US11946885

    申请日：2007-11-29

    Applicant: Chian Chiu Li

    Inventor： Chian Chiu Li

    IPC: G01N21/64 ,  G01J3/51

    CPC classification number: G01J1/4228 ,  G01J1/0209 ,  G01J3/0259 ,  G01J3/2803 ,  G01Q60/22 ,  G01Q70/06

    Abstract: An imaging-type near-field optical microscope mainly comprises a light source and a photodetector array. The array functions as imaging array where each cell or photodetector has subwavelength dimensions. A sample under test is disposed in optical near field of the photodetectors, e.g., on surface of the array. As a result of subwavelength dimensions and near-field effect, resolution can break the diffraction limit and even reach nanoscale. The microscope has a fast speed, works with soft sample and sample in solution, and is capable of dynamic observations. In addition, the array surface doubles as a platform for molecule manipulation.

    Abstract translation: 成像型近场光学显微镜主要包括光源和光电检测器阵列。 该阵列用作成像阵列，其中每个单元或光电检测器具有亚波长尺寸。 被测试样品设置在光电检测器的光学近场中，例如在阵列的表面上。 由于亚波长尺寸和近场效应，分辨率可能会破坏衍射极限，甚至达到纳米尺度。 显微镜具有快速的速度，与溶液中的软样品和样品一起使用，并且能够进行动态观察。 此外，阵列表面还可作为分子操纵的平台。

    PROCESS FOR CREATING TITLED MICROLENS
    165.
    发明申请
    PROCESS FOR CREATING TITLED MICROLENS 有权
    制备微量微晶的方法

    公开(公告)号：US20090109541A1

    公开(公告)日：2009-04-30

    申请号：US12323111

    申请日：2008-11-25

    Applicant: Ulrich C. Boettiger ,  Jin Li

    Inventor： Ulrich C. Boettiger ,  Jin Li

    IPC: G02B27/10

    CPC classification number: H04N5/2254 ,  G01J1/02 ,  G01J1/0209 ,  G01J1/04 ,  G01J1/0411 ,  G02B3/0018 ,  G02B3/0043 ,  H01L27/14627

    Abstract: A microlens structure that includes a wedge formed to support and tilt the microlens is disclosed. The wedge results from heating a layer of patterned flowable material. The degree and direction of incline given to the wedge can be controlled in part by the type of patterning that is performed.

    Abstract translation: 公开了一种微透镜结构，其包括形成为支撑和倾斜微透镜的楔形物。 通过加热图案化的可流动材料层产生楔形。 施加到楔形物的斜面的程度和方向可以部分地由所执行的图案化的类型来控制。

    Near-Field Optical Apparatus And Method Using Photodetector Array
    166.
    发明申请
    Near-Field Optical Apparatus And Method Using Photodetector Array 有权
    近场光学仪器和使用光电检测器阵列的方法

    公开(公告)号：US20080144029A1

    公开(公告)日：2008-06-19

    申请号：US11946885

    申请日：2007-11-29

    Applicant: Chian Chiu Li

    Inventor： Chian Chiu Li

    IPC: G01J3/447 ,  G01J3/28

    CPC classification number: G01J1/4228 ,  G01J1/0209 ,  G01J3/0259 ,  G01J3/2803 ,  G01Q60/22 ,  G01Q70/06

    Abstract: An imaging-type near-field optical microscope mainly comprises a light source and a photodetector array. The array functions as imaging array where each cell or photodetector has subwavelength dimensions. A sample under test is disposed in optical near field of the photodetectors, e.g., on surface of the array. As a result of subwavelength dimensions and near-field effect, resolution can break the diffraction limit and even reach nanoscale. The microscope has a fast speed, works with soft sample and sample in solution, and is capable of dynamic observations. In addition, the array surface doubles as a platform for molecule manipulation.

    Abstract translation: 成像型近场光学显微镜主要包括光源和光电检测器阵列。 该阵列用作成像阵列，其中每个单元或光电检测器具有亚波长尺寸。 被测试样品设置在光电检测器的光学近场中，例如在阵列的表面上。 由于亚波长尺寸和近场效应，分辨率可能会破坏衍射极限，甚至达到纳米尺度。 显微镜具有快速的速度，与溶液中的软样品和样品一起使用，并且能够进行动态观察。 此外，阵列表面还可作为分子操纵的平台。

    Photovoltage Detector
    167.
    发明申请
    Photovoltage Detector 审中-公开
    光电检测器

    公开(公告)号：US20070252085A1

    公开(公告)日：2007-11-01

    申请号：US11663636

    申请日：2005-09-23

    Applicant: Johan Stiens ,  Gennady Shkerdin ,  Vladimir Kotov

    Inventor： Johan Stiens ,  Gennady Shkerdin ,  Vladimir Kotov

    IPC: G01J5/20 ,  G01J1/42

    CPC classification number: G01J1/4228 ,  G01J1/02 ,  G01J1/0209 ,  G01J1/0214 ,  G01J1/4257 ,  G01J1/44 ,  H01L27/1446 ,  H01L27/14649 ,  H01L27/16 ,  H01L31/101 ,  H01L37/00

    Abstract: A method and system for detecting and monitoring a temporal and spatial distribution of a light beam are provided. A semiconductor substrate (120) having a given doping concentration range is partially exposed to an incident laser beam (150). Each part of the semiconductor structure (120) which is exposed to the laser beam is provided with an electrical contact (145), which outputs a voltage which is directly related to the optical power or energy incident on the exposed area. The thermo-voltage is produced by the laser induced thermal gradients. The sensitivity and inter-pixel cross-talk is determined by pixel pitch, doping concentration and window opening (110). Depending of the design, each pixel might be sensitive to the temporal variation of the laser beam.

    Abstract translation: 提供了用于检测和监视光束的时间和空间分布的方法和系统。 具有给定掺杂浓度范围的半导体衬底（120）部分地暴露于入射激光束（150）。 暴露于激光束的半导体结构（120）的每个部分设置有电触点（145），其输出与入射在暴露区域上的光功率或能量直接相关的电压。 热电压由激光诱导的热梯度产生。 灵敏度和像素间串扰通过像素间距，掺杂浓度和开窗来确定（110）。 根据设计，每个像素可能对激光束的时间变化敏感。

    Fourier spectrometer with a modular mirror, integrated on
    168.
    发明申请
    Fourier spectrometer with a modular mirror, integrated on 审中-公开
    傅里叶光谱仪带有模块化反射镜，集成在一起

    公开(公告)号：US20070165237A1

    公开(公告)日：2007-07-19

    申请号：US11587290

    申请日：2005-04-20

    Applicant: Dietmar Knipp ,  Helmut Stiebig

    Inventor： Dietmar Knipp ,  Helmut Stiebig

    IPC: G01B9/02 ,  G01J3/45

    CPC classification number: G01J3/26 ,  G01J1/0209 ,  G01J3/0256

    Abstract: The invention relates to a Fourier spectrometer (1), for determining spectral information of an incident optical input signal (2) and a method for producing such a Fourier spectrometer. The aim of said invention is to allow the accurate production of a small-sized and compact Fourier spectrometer, by means of which, in particular, both 1D and 2D spectrometer arrays may be produced. Said aim is achieved, whereby a Fourier spectrometer is provided, said spectrometer comprising a support layer (4) which is transparent to the optical input signal, a sensor (2), for producing an electrical output signal, which is placed on the support layer and is at least partially transparent to the optical input signal, a reflective layer (3), placed on the sensor side opposite to the support layer, for reflecting the incident optical input signal (2) and producing an optically standing wave from the incident input signal and reflected input signal as well as a cavity (7), located between the sensor and reflective layer, for allowing a modulation of the distance between the sensor and reflective layer, whereby said sensor is embodied for scanning the intensity of the standing wave and for producing an output signal, containing the spectral information of the input signal. The support layer, the sensor and the reflective layer are together integrated into a semiconductor component (1) and oriented substantially parallel to each other and perpendicular to the incident optical input signal, for the production of the optically standing wave.

    Abstract translation: 本发明涉及一种用于确定入射光输入信号（2）的光谱信息的傅立叶光谱仪（1）和用于产生这种傅立叶光谱仪的方法。 所述发明的目的是允许精确生产小型和小巧的傅立叶光谱仪，借此，可以产生特别是1D和2D光谱仪阵列。 实现所述目的，由此提供傅立叶光谱仪，所述光谱仪包括对光输入信号透明的支撑层（4），用于产生电输出信号的传感器（2），其被放置在支撑层 并且对于光输入信号至少部分透明，反射层（3）放置在与支撑层相反的传感器侧上，用于反射入射光输入信号（2）并从入射输入端产生光学驻波 信号和反射输入信号以及位于传感器和反射层之间的空腔（7），用于允许传感器和反射层之间的距离的调制，由此所述传感器被实现为扫描驻波的强度， 用于产生包含输入信号的频谱信息的输出信号。 支撑层，传感器和反射层一起集成到半导体部件（1）中并且基本上彼此平行并且垂直于入射光学输入信号取向，用于产生光学驻波。

    Detector array structure for eliminating channel spectrum
    169.
    发明授权
    Detector array structure for eliminating channel spectrum 有权

    公开(公告)号：US06573505B2

    公开(公告)日：2003-06-03

    申请号：US09873813

    申请日：2001-06-04

    Applicant: Isaac Richman

    Inventor： Isaac Richman

    IPC: G01J506

    CPC classification number: G01J1/02 ,  G01J1/0209 ,  G01J1/0214 ,  G01J1/04 ,  G01J1/0477 ,  G01J1/4228 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/2803 ,  G01J3/45

    Abstract: A detector array that eliminates the channel spectrum effect. In one embodiment the detector consists of a charge couple device (CCD) detector having a photoactive layer supported on a wedge-shaped substrate. Incident radiation impinging any of the pixels and passing through the substrate to the wedge-shaped surface thereof is reflected back at an angle away from the pixel from which it passed through. An infrared array and a single element detector each including a wedge-shaped substrate are also disclosed. The detectors do not require costly signal processing equipment and further can be constructed in accordance with well known manufacturing techniques and with little or no additional cost beyond that normally associated with producing such devices.

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