OPTICAL FIBER CONNECTOR
    12.
    发明申请
    OPTICAL FIBER CONNECTOR 审中-公开
    光纤连接器

    公开(公告)号:US20130064509A1

    公开(公告)日:2013-03-14

    申请号:US13229383

    申请日:2011-09-09

    Abstract: An optical fiber connector apparatus may include a ferrule having a hollow through its center. The hollow is sized and shaped to receive an optical fiber such that an end of each of the optical fiber is located at an endface of the ferrule. The endface of the ferrule is partitioned into a first section and a second section. The first section is perpendicular to an axis of the ferrule and the second section is angled with respect to the first section. When the connector is assembled, the ferrule can butt couple to a similarly configured second ferrule such that the perpendicular second portions of the endfaces of the ferrules are physically touching. The angle of the angled portions sets a distance between portions of the endfaces corresponding to endfaces of optical fibers received in the ferrules thereby setting a gap between the fiber endfaces.

    Abstract translation: 光纤连接器装置可以包括其中心具有中空的套圈。 该空心的尺寸和形状适于接收光纤,使得每个光纤的端部位于套圈的端面。 套圈的端面分为第一部分和第二部分。 第一部分垂直于套圈的轴线,并且第二部分相对于第一部分成角度。 当连接器组装时,套圈可以对接到类似配置的第二套圈,使得套圈端面的垂直第二部分物理接触。 成角度部分的角度设置了与套筒中容纳的光纤的端面对应的端部部分之间的距离,从而在光纤端面之间设置间隙。

    Systems and methods for reducing detected intensity non-uniformity in a laser beam
    14.
    发明申请
    Systems and methods for reducing detected intensity non-uniformity in a laser beam 有权
    减少激光束检测强度不均匀的系统和方法

    公开(公告)号:US20070211467A1

    公开(公告)日:2007-09-13

    申请号:US11370605

    申请日:2006-03-08

    Abstract: A method of increasing the spatial uniformity of the detected intensity of a beam of light from a laser in a system including the laser and a light detector. In one embodiment the method includes the steps of generating a beam of light with the laser; and moving the beam of light and the light detector relative to each other, such that the detector averages the spatial intensity of the beam of light over time. In another embodiment the invention relates to a system for increasing the detected spatial uniformity of the intensity of a beam of light. In one embodiment the system comprises a light detector; a laser source for generating the beam of light; and a means for moving the beam of light and the detector relative to one another such that the detector averages the intensity of the light beam over time

    Abstract translation: 一种增加在包括激光器和光检测器的系统中来自激光器的光束的检测强度的空间均匀性的方法。 在一个实施例中,该方法包括以下步骤:用激光产生光束; 并且相对于彼此移动光束和光检测器,使得检测器随时间平均光束的空间强度。 在另一个实施例中,本发明涉及一种用于增加检测到的光束的强度的空间均匀性的系统。 在一个实施例中,系统包括光检测器; 用于产生光束的激光源; 以及用于相对于彼此移动光束和检测器的装置,使得检测器随着时间平均光束的强度

    Method Of Instrument Standardization For A Spectroscopic Device
    15.
    发明申请
    Method Of Instrument Standardization For A Spectroscopic Device 有权
    光谱仪器标准化方法

    公开(公告)号:US20070046933A1

    公开(公告)日:2007-03-01

    申请号:US11552361

    申请日:2006-10-24

    CPC classification number: G01J3/28 G01J3/42

    Abstract: In a spectroscopic process a sample for producing a test spectral line or spectrum of at least one component contained in the sample is stimulated and the transmitted and/or emitted electromagnetic rays are used to create the test spectral line or spectrum. In order to improve such a spectroscopic process to such an extent that variations of certain parameters, which alter the shape and/or occurrence of a spectral line, are compensated, a comparison spectral line or spectrum of a known comparison material is produced under substantially the same parameters as the sample. The comparison spectral line or spectrum is compared with an ideal comparison spectral line or spectrum in order to calculate a transfer function, and the transfer function is applied to the test spectral line or spectrum in order to calculate a corrected test spectral line or spectrum.

    Abstract translation: 在分光过程中,刺激用于产生测试谱线或样品中包含的至少一种组分的光谱的样品,并且使用透射和/或发射的电磁波来产生测试光谱线或光谱。 为了改进这种光谱过程,使得补偿了改变光谱线的形状和/或出现的某些参数的变化,已知比较材料的比较光谱线或光谱基本上在 与样品相同的参数。 将比较谱线或频谱与理想的比较谱线或频谱进行比较,以计算传递函数,并将传递函数应用于测试谱线或频谱,以便计算校正的测试谱线或频谱。

    Light source
    17.
    发明申请

    公开(公告)号:US20060038991A1

    公开(公告)日:2006-02-23

    申请号:US11233454

    申请日:2005-09-22

    CPC classification number: G01N21/3103 G01N2021/3118

    Abstract: A light source for an atomizing device, specifically an atom absorption spectrometer comprising one, two, or more lamps, whose ray can be selected by means of at least one two-dimensionally moveable optical selection element, and which can be directed in the direction of atomizing device. Fine-tuning is thereby achieved quickly with little constructive expenditure and with low costs. A very high degree of accuracy is possible from the selector through a rotational and highly adjustable rotation spindle.

    Modular carriage assembly for use with high-speed, high-performance, printing device
    18.
    发明授权
    Modular carriage assembly for use with high-speed, high-performance, printing device 有权
    模块化支架组件,用于高速,高性能的打印设备

    公开(公告)号:US06257699B1

    公开(公告)日:2001-07-10

    申请号:US09425103

    申请日:1999-10-13

    CPC classification number: B41J2/1752 B41J2/15 B41J2202/19 B41J2202/20

    Abstract: A printing device having a print carriage assembly that reduces a carriage excursion along a carriage scan axis and/or reduces a width of a printing flat zone along a media feed axis, is disclosed. The print carriage assembly has a frame that traverses across a media along a carriage scan axis. The media travels along a media feed axis that is substantially perpendicular to the carriage scan axis. A first print cartridge subassembly includes a first base secured to the frame and a plurality of first print elements secured to the first base. Each of the first print elements includes a first nozzle array for ejecting an ink composition. The plurality of first print elements are spaced apart along the carriage scan axis and are offset along the media feed axis. A second print cartridge subassembly includes a second base secured to the frame and a plurality of second print elements secured to the second base. Each of the second print elements have a second nozzle array for ejecting an ink composition. The plurality of second print elements are spaced apart along the carriage scan axis and are offset along the media feed axis. The print carriage assembly reduces a carriage excursion along a carriage scan axis and/or reduces a width of a printing flat zone along a media feed axis.

    Abstract translation: 公开了一种具有打印托架组件的打印装置,该打印托架组件沿着托架扫描轴减少托架偏移和/或减小沿着介质进给轴线的印刷平坦区域的宽度。 打印托架组件具有沿着托架扫描轴线穿过介质的框架。 介质沿着基本上垂直于托架扫描轴的介质进给轴行进。 第一打印墨盒子组件包括固定到框架的第一基座和固定到第一基座的多个第一打印元件。 每个第一印刷元件包括用于喷射油墨组合物的第一喷嘴阵列。 多个第一打印元件沿着滑架扫描轴线间隔开并且沿着介质进给轴线偏移。 第二打印盒子组件包括固定到框架的第二底座和固定到第二底座的多个第二打印元件。 每个第二印刷元件具有用于喷射油墨组合物的第二喷嘴阵列。 多个第二打印元件沿着滑架扫描轴线间隔开并且沿着介质进给轴线偏移。 打印托架组件减小了沿滑架扫描轴线的滑架偏移和/或减小了沿着介质进给轴线的印刷平坦区域的宽度。

    Apparatus and method for measuring variations in thickness of an optical
interference element
    19.
    发明授权
    Apparatus and method for measuring variations in thickness of an optical interference element 失效
    用于测量光学干涉元件的厚度变化的装置和方法

    公开(公告)号:US5528370A

    公开(公告)日:1996-06-18

    申请号:US412804

    申请日:1995-03-29

    CPC classification number: G01B11/06

    Abstract: In a system for measuring variations in thickness of an optical etalon, a light source and a diffraction grating are mounted on a base structure with an axle. A lever arm is affixed to the axle, and a micrometer is held in contact with the lever arm. The grating directs a into an optical path a wavelength of radiation dependent on orientation of the grating. The etalon is supported in the optical path to effect a fringe pattern representing variations in thickness of in the etalon. The orientation is varied with the micrometer so as to vary the wavelength to the etalon and thereby positioning of the fringe pattern across the etalon which is viewed through a microscope. The micrometer measures the variation of orientation and thereby variation in thickness across the interference element.

    Abstract translation: 在用于测量光学标准具的厚度变化的系统中,光源和衍射光栅安装在具有轴的基座结构上。 杠杆臂固定在轴上,测微计与杠杆臂保持接触。 光栅将取决于光栅取向的辐射波长引导到光路中。 标准具在光路中支持,以实现表示标准具厚度变化的条纹图案。 取向随着千分尺而变化,从而将波长改变为标准具,从而将条纹图案定位在通过显微镜观察的标准具之间。 测微计测量取向的变化,从而测量干涉元件的厚度变化。

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