摘要:
A ferroelectric memory comprising a plurality of memory cells each including a ferroelectric capacitor and a switch transistor, and operating in a test mode in which, after polarized data is written into the memory cell by applying a first electric potential difference between both electrodes of ferroelectric capacitors of the plurality of memory cells, and before reading of the polarized data from the memory cells is carried out, a second electric potential difference smaller than the first electric potential difference is applied between both the electrodes of the ferroelectric capacitors in a direction opposite to that at the time of writing the polarized data.
摘要:
A chain type ferroelectric random access memory has a memory cell unit comprising ferroelectric memory cells electrically connected in series to each other, a plate line connected to an electrode of the memory cell unit, a bit line connected to the other electrode of the memory cell unit via a switching transistor, a sense amplifier which amplifies the voltages of this bit line and its complementary bit line, and a transistor inserted between the switching transistor and the sense amplifier, and that a value, being the minimum value of the gate voltage in the transistor obtained during elevation of the plate line voltage and comparative amplification, is smaller than a value, being the maximum value of the gate voltage in the transistor obtained during fall of the plate line voltage and comparative amplification. With these features, decrease in the accumulated charge of polarization in the memory cell is reduced and occurrence of disturb is prevented during read/write operations.
摘要:
A control circuit is configured to execute an erasing operation on a selected cell unit in a selected memory block. In the erasing operation, the control circuit raises the voltage of the bodies of the first memory transistors included in the selected cell unit to a first voltage, sets the voltage of the bodies of the first memory transistors included in the non-selected cell unit to a second voltage lower than the first voltage, and applies a third voltage equal to or lower than the second voltage to the gates of the first memory transistors included in the selected cell unit and the non-selected cell unit.
摘要:
A driver circuit and a precharge circuit apply, in a test mode, a fixed potential to a bit-line, while applying a second plate-line voltage to a plate-line. Then, the bit-line is switched from a first bit-line precharge potential to a floating state, and the plate-line voltage is raised from the second plate-line voltage to a plate-line voltage.
摘要:
According to an aspect of the present invention, there is provided a reference voltage generation circuit including: a first transistor having a first gate, a first source and a first drain; a second transistor having a second gate connected to the first gate, a second source connected to the first source and a second drain; a first diode connected between a ground and a V− node; a first resistor connected between the V− node and the first drain; a second diode and a second resistor connected between the ground and a V+ node; a third resistor connected between the V+ node and the first drain; an operational amplifier including input ports connected to the V+ node and the V− node and an output port connected to the first gate and the second gate; and a fourth resistor connected between the ground and the second drain.
摘要:
An internal voltage generator according to an embodiment generates a reference voltage used for detecting data stored in a semiconductor memory. A first AD converter is configured to convert an external voltage supplied to the semiconductor memory into a first digital value. A second AD converter is configured to convert a temperature characteristic voltage that changes depending on a temperature of the semiconductor memory into a second digital value. An adder is configured to receive a reference voltage trimming address that specifies the reference voltage, the first digital value, and the second digital value, and to output a third digital value obtained by performing a weighted addition of the reference voltage trimming address, the first digital value, and the second digital value. A driver is configured to output the reference voltage responding to the third digital value.
摘要:
An internal power supply voltage generation circuit 100 has a first charge pump circuit which steps up the external power supply voltage in response to the first clock signal and outputs a first stepped up voltage from the first voltage stepup output terminal; a second charge pump circuit which steps up the first stepup voltage in response to the second clock signal and outputs a second stepped up voltage from the second voltage stepup output terminal, the second stepped up voltage being higher than the first stepped up voltage; a first voltage stepdown circuit which steps down the first stepped up voltage and outputs a first stepped down voltage; and a second voltage stepdown circuit which steps down the second stepped up voltage and outputs a second stepped down voltage, the second stepped down voltage being higher than the first stepped up voltage.
摘要:
A circuit for detecting a power-on voltage of power supply encompasses a voltage divider connected between a first power supply and a second power supply, the potential of the second power supply is lower than the potential of the first power supply, and a detecting circuit connected between the first power supply and the second power supply. The voltage divider includes a series circuit encompassing a diode, a first dividing resistor connected to the diode and a second dividing resistor connected between the first dividing resistor and the second power supply. The detecting circuit includes a pMOS transistor whose gate electrode is connected to a connection node between the first dividing resistor and the second dividing resistor, a source resistor connected between the first power supply and the source electrode of the pMOS transistor and a drain resistor connected to the drain electrode of the pMOS transistor and the second power supply.
摘要:
A power supply voltage control circuit supplying a power supply voltage to a memory cell array, including word lines extending along row direction, bit lines extending along column direction, plate lines extending along the row direction, and a plurality of unit cells disposed at intersections of word lines and bit lines, includes a word line control circuit for supplying a first voltage to the word lines; and a plate line control circuit for supplying a second voltage to the plate lines; and the power supply voltage control circuit provides an amount of current flow from the first voltage so as to keep the first voltage potential almost constant during increasing a value of the second voltage in a power-on sequence, firstly increasing a value of the higher voltage of two potential voltages: the first voltage and the second voltage capacitive coupled, and then increasing a value of the lower second voltage.
摘要:
Disclosed is a voltage generating circuit which steps down a voltage to output a stepped down voltage. The voltage generating circuit includes first and second transistors. The drains of the first and second transistors are connected to a higher voltage power supply. The gate of the first transistor is connected to the gate of the second transistor. The voltage of the gate of the first transistor is controlled by a control circuit such that a voltage of the source of the first transistor can reach a predetermined voltage. A stepped down voltage is outputted from the source of the second transistor.