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公开(公告)号:US20250003062A1
公开(公告)日:2025-01-02
申请号:US18755620
申请日:2024-06-26
Applicant: ASM IP Holding B.V.
Inventor: Shujin Huang , Junwei Su , Yang Wang
Abstract: A material layer deposition method includes receiving, at a controller operatively connected to a semiconductor processing system, a process recipe including a precoat thickness parameter. An expected precoat thickness using the precoat thickness parameter using the controller and the expected precoat thickness is compared to a predetermined precoat thickness value using the controller. A precoat material layer is deposited onto a substrate support arranged within the semiconductor processing system using the process recipe when the expected precoat thickness is less than the predetermined precoat thickness value and user output is provided to a user display operatively associated with the controller when the expected precoat thickness is greater than the predetermined precoat thickness value. Semiconductor processing systems and computer program products are also provided.
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公开(公告)号:US12024775B2
公开(公告)日:2024-07-02
申请号:US18207322
申请日:2023-06-08
Applicant: ASM IP Holding B.V.
Inventor: Sonti Sreeram , Junwei Su , Loc Vinh Tran
IPC: C23C16/455 , H01J37/32
CPC classification number: C23C16/45587 , C23C16/45557 , C23C16/45561 , C23C16/45563 , H01J37/32449 , H01J37/32458
Abstract: A gas distribution system, a reactor system including the gas distribution system, and method of using the gas distribution system and reactor system are disclosed. The gas distribution system can be used in gas-phase reactor systems to independently monitor and control gas flow rates in a plurality of channels of a gas distribution system coupled to a reaction chamber.
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公开(公告)号:US20230313377A1
公开(公告)日:2023-10-05
申请号:US18207322
申请日:2023-06-08
Applicant: ASM IP Holding B.V.
Inventor: Sonti Sreeram , Junwei Su , Loc Vinh Tran
IPC: C23C16/455
CPC classification number: C23C16/45587 , C23C16/45557 , C23C16/45561 , C23C16/45563 , H01J37/32458
Abstract: A gas distribution system, a reactor system including the gas distribution system, and method of using the gas distribution system and reactor system are disclosed. The gas distribution system can be used in gas-phase reactor systems to independently monitor and control gas flow rates in a plurality of channels of a gas distribution system coupled to a reaction chamber.
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公开(公告)号:US20230002895A1
公开(公告)日:2023-01-05
申请号:US17810094
申请日:2022-06-30
Applicant: ASM IP HOLDING B.V.
Inventor: Rutvij Naik , Junwei Su , Wentao Wang , Chuqin Zhou , Xing Lin
IPC: C23C16/458 , C23C16/455
Abstract: Systems of reducing devitrification within a chemical vapor deposition system can include a susceptor support ring that is configured to be positioned between a gas inlet and a gas outlet of a chamber passage. An example system can also include a getter support comprising a support base and one or more recesses therein. Each of the one or more recesses can be arranged to receive corresponding one or more support elements that are configured to support the getter plate. At least a portion of the getter support may include a coating comprising silicon carbide (SiC) having a thickness of at least about 50 microns. The getter support may be arranged to be disposed a maximum distance of between about 1 mm and about 10 mm from the susceptor support ring.
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公开(公告)号:US20210310125A1
公开(公告)日:2021-10-07
申请号:US17352011
申请日:2021-06-18
Applicant: ASM IP Holding B.V.
Inventor: Mingyang Ma , Junwei Su , Alexandros Demos , Xing Lin , Sam Kim , Gregory Michael Bartlett
IPC: C23C16/52 , C23C16/455 , B01J4/00 , C23C16/44 , H01J37/32
Abstract: A gas injection system, a reactor system including the gas injection system, and methods of using the gas injection system and reactor system are disclosed. The gas injection system can be used in gas-phase reactor systems to independently monitor and control gas flow rates in a plurality of channels of a gas injection system coupled to a reaction chamber.
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公开(公告)号:US11053591B2
公开(公告)日:2021-07-06
申请号:US16055532
申请日:2018-08-06
Applicant: ASM IP Holding B.V.
Inventor: Mingyang Ma , Junwei Su , Alexandros Demos , Xing Lin , Sam Kim , Gregory Michael Bartlett
IPC: H01J37/32 , C23C16/52 , C23C16/455 , B01J4/00 , C23C16/44
Abstract: A gas injection system, a reactor system including the gas injection system, and methods of using the gas injection system and reactor system are disclosed. The gas injection system can be used in gas-phase reactor systems to independently monitor and control gas flow rates in a plurality of channels of a gas injection system coupled to a reaction chamber.
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公开(公告)号:US12234554B2
公开(公告)日:2025-02-25
申请号:US17810094
申请日:2022-06-30
Applicant: ASM IP HOLDING B.V.
Inventor: Rutvij Naik , Junwei Su , Wentao Wang , Chuqin Zhou , Xing Lin
IPC: C23C16/458 , C23C16/455
Abstract: Systems of reducing devitrification within a chemical vapor deposition system can include a susceptor support ring that is configured to be positioned between a gas inlet and a gas outlet of a chamber passage. An example system can also include a getter support comprising a support base and one or more recesses therein. Each of the one or more recesses can be arranged to receive corresponding one or more support elements that are configured to support the getter plate. At least a portion of the getter support may include a coating comprising silicon carbide (SiC) having a thickness of at least about 50 microns. The getter support may be arranged to be disposed a maximum distance of between about 1 mm and about 10 mm from the susceptor support ring.
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公开(公告)号:USD1030687S1
公开(公告)日:2024-06-11
申请号:US29840698
申请日:2022-05-31
Applicant: ASM IP Holding B.V.
Designer: Shujin Huang , Junwei Su , Wentao Wang , Xing Lin
Abstract: FIG. 1 is a front perspective view of a susceptor, showing our new design;
FIG. 2 is a bottom perspective view thereof;
FIG. 3 is right side view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is front view thereof;
FIG. 6 is back view thereof;
FIG. 7 is a top view thereof; and,
FIG. 8 is a bottom view thereof.-
公开(公告)号:USD1028913S1
公开(公告)日:2024-05-28
申请号:US29797476
申请日:2021-06-30
Applicant: ASM IP HOLDING B.V.
Designer: Rutvij Naik , Junwei Su , Wentao Wang , Chuqin Zhou , Xing Lin
Abstract: FIG. 1 is a top perspective view of a semiconductor deposition reactor ring;
FIG. 2 is a bottom perspective view thereof;
FIG. 3 is a front view thereof;
FIG. 4 is a back view thereof;
FIG. 5 is a left view thereof;
FIG. 6 is a right view thereof;
FIG. 7 is a top view thereof; and,
FIG. 8 is a bottom view thereof.
The broken lines in the drawings illustrate portions of the semiconductor deposition reactor ring that form no part of the claimed design.-
20.
公开(公告)号:US20230386874A1
公开(公告)日:2023-11-30
申请号:US18324411
申请日:2023-05-26
Applicant: ASM IP Holding, B.V.
Inventor: Shujin Huang , Junwei Su , Wentao Wang , Xing Lin
IPC: H01L21/673 , H01L21/687 , H01L21/02 , H01L21/3213
CPC classification number: H01L21/67316 , H01L21/68742 , H01L21/02293 , H01L21/3213
Abstract: A substrate support includes a disc body with upper and lower surfaces spaced apart by a thickness. The upper surface has a circular concavity extending about a rotation axis, an annular ledge portion radially outward of the concavity extending circumferentially about the concavity, and an annular rim portion radially outward of the ledge portion extending circumferentially about the ledge portion. The concavity has a circular perforated portion and an annular unperforated portion. The perforated portion extends about the rotation axis and defines two or more perforations to issue an etchant into a cavity defined between the concavity and a backside of a substrate seated on the substrate support. The unperforated portion is radially outward of the perforated portion and extends circumferentially about the perforated portion to limit etching of the backside of the substrate by the etchant. Semiconductor processing systems and material layer deposition methods are also described.
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