Fabric Die to Fabric Die Interconnect for Modularized Integrated Circuit Devices

    公开(公告)号:US20240312909A1

    公开(公告)日:2024-09-19

    申请号:US18670390

    申请日:2024-05-21

    CPC classification number: H01L23/528 H01L23/49816 H03K19/17704

    Abstract: The presently disclosed programmable fabric die includes a direct fabric die-to-fabric die interconnect interface column disposed in a sector of programmable logic fabric. Each row of the interconnect interface column includes at least one interconnect interface that is electrically coupled to a microbump. The microbump is configured to be electrically coupled to another microbump of another interconnect interface of another fabric die through an interposer. The fabric die may include multiple interconnect interface columns that each extend deep into the sector, enabling low latency connections between the fabric dies and reducing routing congestion. In some embodiments, the fabric die may include interconnect interfaces that are instead distributed throughout logic blocks of the sector.

    Die to die interconnect structure for modularized integrated circuit devices

    公开(公告)号:US11062070B2

    公开(公告)日:2021-07-13

    申请号:US16368696

    申请日:2019-03-28

    Abstract: Systems or methods of the present disclosure may facilitate meeting connectivity demands between the dies of the modularized integrated circuits. Such an integrated circuit system may include a first die of programmable fabric circuitry that is communicatively coupled to a second die of modular periphery intellectual property (IP) tile via a modular interface. The modular interface may enable communication between a first microbump of the first die and a second microbump of the second die using a time-division multiplexing (TDM) technique. The modular interface may also enable communication between the first microbump and the second microbump using a wire-to-wire connection that does not comprise the TDM technique.

    Fabric Die to Fabric Die Interconnect for Modularized Integrated Circuit Devices

    公开(公告)号:US20210111116A1

    公开(公告)日:2021-04-15

    申请号:US17131464

    申请日:2020-12-22

    Abstract: The presently disclosed programmable fabric die includes a direct fabric die-to-fabric die interconnect interface column disposed in a sector of programmable logic fabric. Each row of the interconnect interface column includes at least one interconnect interface that is electrically coupled to a microbump. The microbump is configured to be electrically coupled to another microbump of another interconnect interface of another fabric die through an interposer. The fabric die may include multiple interconnect interface columns that each extend deep into the sector, enabling low latency connections between the fabric dies and reducing routing congestion. In some embodiments, the fabric die may include interconnect interfaces that are instead distributed throughout logic blocks of the sector.

    Addressable distributed memory in a programmable logic device

    公开(公告)号:US10936511B2

    公开(公告)日:2021-03-02

    申请号:US16232834

    申请日:2018-12-26

    Abstract: Systems and methods for providing capability of access to distributed memory blocks using a global address scheme in a programmable logic device. Each of the distributed memory blocks includes routing circuitry that receives data, and in a first mode, decodes whether the data is intended for a respective distributed memory block. In a second mode, the data may bypass routing circuitry. Furthermore, the data may be received at the distributed memory block via cascade connections of distributed memory blocks in a column and/or via register in the programmable fabric of the programmable logic device.

Patent Agency Ranking