Abstract:
Techniques for use of carbon nanotubes as an anti-tampering feature and for use of randomly metallic or semiconducting carbon nanotubes in the generation of a physically unclonable cryptographic key generation are provided. In one aspect, a cryptographic key having an anti-tampering feature is provided which includes: an array of memory bits oriented along at least one bit line and at least one word line, wherein each of the memory bits comprises a memory cell, wherein the cryptographic key is stored in the memory cell, and wherein the memory cell is connected to the at least one bit line; and a metallic carbon nanotube interconnect which connects the memory cell to the at least one word line. A cryptographic key and method for processing the cryptographic key are also provided.
Abstract:
A structure and method of testing degradation of semiconductor devices by stressing an array of several semiconductor devices at the same time and measuring the resulting degradation separately for each individual device to obtain an estimate of its expected lifetime is provided. The devices may be subjected to stress that is either in a pulsed state or in a DC state. An on-chip pulse generator may be used for stressing in the pulsed state.
Abstract:
Embodiments are directed to a system for measuring a degradation characteristic of a plurality of electronic components. The system includes a parallel stress generator communicatively coupled to the plurality of electronic components, and a serial electronic measuring component communicatively coupled to the plurality of electronic components. The parallel stress generator is configured to generate a plurality of stress signals, apply the plurality of stress signals in parallel to the plurality of electronic components and remove the plurality of stress signals from the plurality of electronic components. The serial electronic measuring component is configured to, subsequent to the removal of the plurality of stress signals, sequentially measure the degradation characteristic of each one of the plurality of electronic components in order to determine their degradation resulting from the applied stress signals.
Abstract:
Methods and systems for measuring a duty cycle of a signal include applying a first branch of an input signal directly to a latch. A delay of a second branch of the input signal is incrementally increased, with the second branch being applied to the latch, until the latch changes its output. A delay, corresponding to the latch's changed output, is divided by a period of the input signal to determine a duty cycle of the input signal.
Abstract:
Methods and systems of detecting chip degradation are described. A processor may execute a test on a device at a first time, where the test includes executable instructions for the device to execute a task under specific conditions relating to a performance attribute. The processor may receive performance data indicating a set of outcomes from the task executed by the device during the test. The processor may determine a first value of a parameter of the performance attribute based on the identified subset. The processor may compare the first value with a second value of the parameter of the performance attribute. The second value is based on an execution of the test on the device at a second time. The processor may determine a degradation status of the device based on the comparison of the first value with the second value.
Abstract:
Embodiments are directed to a system for synchronizing switching events. The system includes a controller, a clock generator communicatively coupled to the controller and a delay chain communicatively coupled to the controller. The delay chain is configured to perform a plurality of delay chain switching events in response to an input to the delay chain. The controller is configured to initiate a synchronization phase that includes enabling the clock generator to provide as an input to the delay chain a clock generator output at a synchronization frequency, wherein the clock generator output passing through the delay chain synchronizes the plurality of delay chain switching events to occur at the synchronization frequency resulting in a frequency of an output of the delay chain being synchronized to the synchronization frequency of the clock generator output.
Abstract:
A method of assembling a remote sensor system to detect a gas or chemical and a remote sensor system are described. The method includes fabricating a sensor, the sensor outputting a sensor signal that changes upon contact of the sensor with the gas or chemical and the sensor having an input port for a clock signal, coupling a capacitor to the sensor, the capacitor output voltage resulting from the sensor signal output by the sensor, and coupling a mixer to the capacitor and a low frequency oscillator, the mixer configured to mix the capacitor output voltage with the low frequency oscillator output to generate an output signal. The method also includes coupling an antenna to the mixer, the antenna configured to transmit the output signal indicating detection of the gas or chemical.
Abstract:
A software signature transceiver includes a signature receiver configured to couple to a programmable electronic device and sense a signature signal generated by the programmable electronic device, wherein the signature signal varies according to computer program codes executed by the programmable electronic device, and a signature transmitter operably connected to the signature receiver, the signature transmitter configured to transmit a signature transmission signal corresponding to the signature signal. A corresponding method to use the software signature transceiver and a software monitoring device to determine whether unknown software is executing on a programmable electronic device is also disclosed herein. A corresponding system comprising the programmable electronic device, the software signature transceiver, and a software monitoring device is also disclosed herein.
Abstract:
Methods and systems for measuring a duty cycle of a signal include applying a first branch of an input signal directly to a latch. A delay of a second branch of the input signal is incrementally increased, with the second branch being applied to the latch, until the latch changes its output. A delay, corresponding to the latch's changed output, is divided by a period of the input signal to determine a duty cycle of the input signal.
Abstract:
A method for gaining access beyond a restricted access gateway includes an access key sequence stored on memory of a device. The access key sequence includes a sequence of key entries and key touch movements. An entered request sequence including keys activated by touch on a keyboard of the device and directions of touch movements made on the keyboard is recorded. With an access controller, it is determined whether the recorded entered request sequence matches the access key sequence. Access beyond the restricted access gateway is granted to functions when the recorded entered request sequence matches the access key sequence.