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    ANALYSIS PACKAGE
    11.
    发明申请
    ANALYSIS PACKAGE 有权
    分析包

    公开(公告)号：US20160231263A1

    公开(公告)日：2016-08-11

    申请号：US14848312

    申请日：2015-09-08

    Applicant: KABUSHIKI KAISHA TOSHIBA

    Inventor： Hiroshi HAMASAKI ,  Michihiko NISHIGAKI ,  Yutaka ONOZUKA ,  Kentaro KOBAYASHI ,  Hiroko MIKI ,  Naofumi NAKAMURA

    IPC: G01N27/00 ,  B01L3/00

    CPC classification number: B01L3/5027 ,  B01L2200/0647 ,  B01L2300/0645 ,  B01L2300/0681 ,  B01L2300/0816 ,  B01L2300/0887 ,  B01L2400/0421 ,  B01L2400/086 ,  G01N15/1056 ,  G01N15/12 ,  G01N33/48707 ,  G01N33/4875 ,  G01N2015/1006

    Abstract: According to one embodiment, an analysis package including a board including an electrical terminal, an analysis chip provided at the board, the chip including a detector for detecting a particle, a flow channel of a sample liquid for particle detection to the detector, and a liquid receiver for introducing the sample liquid into the flow channel, a mold provided to cover the board on which the analysis chip is provided, the mold comprising an opening above the liquid receiver, a first shield layer provided on a back surface of the board, and a second shield layer provided to be attachable and detachable on an opposite side to the analysis chip of the mold, the second shield layer being electrically connected to a part of the electrical terminal.

    Abstract translation: 根据一个实施例，一种分析包装，包括包括电子端子的板，设置在板上的分析芯片，包括用于检测颗粒的检测器的芯片，用于检测器的用于颗粒检测的样品液体的流动通道，以及 用于将样品液体引入流动通道的液体接收器，设置成覆盖设置有分析芯片的板的模具，模具包括在液体接收器上方的开口，设置在板的背面上的第一屏蔽层， 以及第二屏蔽层，其设置成在与所述模具的分析芯片相反的一侧上可附接和拆卸，所述第二屏蔽层电连接到所述电端子的一部分。

    METHOD FOR INSPECTING PROBE MOLECULE
    13.
    发明公开
    METHOD FOR INSPECTING PROBE MOLECULE 审中-公开

    公开(公告)号：US20240027350A1

    公开(公告)日：2024-01-25

    申请号：US18172063

    申请日：2023-02-21

    Applicant: KABUSHIKI KAISHA TOSHIBA

    Inventor： Hiroko MIKI ,  Yoshiaki SUGIZAKI ,  Hideyuki TOMIZAWA

    IPC: G01N21/65 ,  G01J3/44

    CPC classification number: G01N21/65 ,  G01J3/44

    Abstract: A method for inspecting probe molecule includes evaluating the formation of the probe molecule at the surface of the graphene by comparing an intensity ratio a1/b1, and an intensity ratio a2/b2. The intensity al is of a peak of the first Raman spectrum having a peak top positioned in a first band of not less than 1200 cm−1 and not more than 1500 cm−1. The intensity b1 is of a peak of the first Raman spectrum having a peak top positioned in a second band of not less than 1510 cm−1 and not more than 1800 cm−1. The intensity a2 is of a peak of the second Raman spectrum having a peak top positioned in the first band. The intensity b2 is of a peak of the second Raman spectrum having a peak top positioned in the second band.

    CHEMICAL SENSOR MODULE AND METHOD FOR IDENTIFYING SAMPLE SUBSTANCES
    14.
    发明申请
    CHEMICAL SENSOR MODULE AND METHOD FOR IDENTIFYING SAMPLE SUBSTANCES 有权

    公开(公告)号：US20220308012A1

    公开(公告)日：2022-09-29

    申请号：US17445589

    申请日：2021-08-20

    Applicant: KABUSHIKI KAISHA TOSHIBA

    Inventor： Yoshiaki SUGIZAKI ,  Hiroko MIKI

    IPC: G01N27/414 ,  G01N1/40 ,  G01N33/00

    Abstract: A chemical sensor module includes first to n-th (n is a natural number of 2 or greater) graphene sensors; and an exposure mechanism exposing the first to n-th graphene sensors to first to n-th aqueous solutions containing a sample substance and having different concentrations of phosphate ion, magnesium ion, or sulfate ion. The chemical sensor module identifies the sample substance from the difference in electrical characteristics of the first to n-th graphene sensors.

    PARTICLE INSPECTION SYSTEM AND DRIVING METHOD EMPLOYED THEREIN
    15.
    发明申请
    PARTICLE INSPECTION SYSTEM AND DRIVING METHOD EMPLOYED THEREIN 审中-公开

    公开(公告)号：US20170122859A1

    公开(公告)日：2017-05-04

    申请号：US15408702

    申请日：2017-01-18

    Applicant: KABUSHIKI KAISHA TOSHIBA

    Inventor： Michihiko NISHIGAKI ,  Hiroshi HAMASAKI ,  Naofumi NAKAMURA ,  Kentaro KOBAYASHI ,  Hiroko MIKI

    IPC: G01N15/10 ,  G01N15/12

    Abstract: According to one embodiment, a particle inspection system includes a voltage driving circuit which applies a driving voltage for a particle inspection to a particle inspection chip, a current-voltage conversion circuit which converts, into a voltage signal, a current signal output from the particle inspection chip when the driving voltage is applied to the particle inspection chip, a detection circuit which detects, based on the voltage signal, whether the sample liquid is introduced into a detection region of the particle inspection chip, and an analysis circuit which analyzes the fine particle, in the sample liquid based on the voltage signal. The voltage driving circuit varies the driving voltage based on the detection result of the detection circuit.

    ANALYSIS PACKAGE
    16.
    发明申请
    ANALYSIS PACKAGE 有权
    分析包

    公开(公告)号：US20160231265A1

    公开(公告)日：2016-08-11

    申请号：US14848351

    申请日：2015-09-09

    Applicant: KABUSHIKI KAISHA TOSHIBA

    Inventor： Hiroshi HAMASAKI ,  Michihiko NISHIGAKI ,  Yutaka ONOZUKA ,  Kentaro KOBAYASHI ,  Hiroko MIKI ,  Naofumi NAKAMURA

    IPC: G01N27/07 ,  B01L3/00

    CPC classification number: G01N27/07 ,  B01L3/5027 ,  B01L2200/0647 ,  B01L2300/0645 ,  B01L2300/0681 ,  B01L2300/0816 ,  B01L2300/0887 ,  B01L2400/0421 ,  B01L2400/086

    Abstract: According to one embodiment, an analysis package including an analysis chip provided on a main surface of a semiconductor substrate, the chip including a flow channel, both ends of which are open at peripheral parts of the substrate, and a microaperture which is provided in a middle of the flow channel and which allows a particle to pass therethrough, a package board on which the chip is mounted, liquid receivers provided on the package board, the liquid receivers being connected to openings, and electrodes, at least parts of which are provided on parts of bottom surfaces of the liquid receivers, the electrodes being provided at positions corresponding to an upstream side and a downstream side of the microaperture.

    Abstract translation: 根据一个实施例，一种分析包装，其包括设置在半导体基板的主表面上的分析芯片，该芯片包括其两端在基板的周边部分开口的流动通道和设置在该基板的周边部分的微孔 流动通道的中间并允许颗粒通过其中，其上安装有芯片的封装板，设置在封装板上的液体接收器，连接到开口的液体接收器和至少部分设置的电极 在液体接收器的底表面的一部分上，电极设置在对应于微孔的上游侧和下游侧的位置处。

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