Replication of a first interface onto a second interface and related systems, methods, and devices

    公开(公告)号:US11067628B2

    公开(公告)日:2021-07-20

    申请号:US16577267

    申请日:2019-09-20

    Abstract: Disclosed herein are systems, methods, and devices that enable access to a first interface control circuit via test probes of a second interface. In some embodiments a memory device includes a first interface including first ports that are inaccessible to a test probe. The memory device also includes a first interface control circuit configured to control operation of the first interface. The memory device further includes a second interface including second ports. At least a portion of the second ports include test pads that are accessible to the test probe. In addition, the memory device includes a multiplexer configured to operably couple the first interface and at least a portion of the second interface to the first interface control circuit. The multiplexer is configured to selectively enable test probe access to the first interface control circuit via the test pads.

    REPLICATION OF A FIRST INTERFACE ONTO A SECOND INTERFACE AND RELATED SYSTEMS, METHODS, AND DEVICES

    公开(公告)号:US20210088583A1

    公开(公告)日:2021-03-25

    申请号:US16577267

    申请日:2019-09-20

    Abstract: Disclosed herein are systems, methods, and devices that enable access to a first interface control circuit via test probes of a second interface. In some embodiments a memory device includes a first interface including first ports that are inaccessible to a test probe. The memory device also includes a first interface control circuit configured to control operation of the first interface. The memory device further includes a second interface including second ports. At least a portion of the second ports include test pads that are accessible to the test probe. In addition, the memory device includes a multiplexer configured to operably couple the first interface and at least a portion of the second interface to the first interface control circuit. The multiplexer is configured to selectively enable test probe access to the first interface control circuit via the test pads.

    Memory device with write data bus control

    公开(公告)号:US10943625B2

    公开(公告)日:2021-03-09

    申请号:US16721515

    申请日:2019-12-19

    Abstract: Apparatuses and methods for transmitting data between a plurality of chips are described. An example apparatus includes: a first chip, wherein the first chip includes a receiver that receives a data strobe signal and further generates an internal strobe signal responsive, at least in part, to the data strobe signal, the internal strobe signal including a first edge and a second edge following the first edge; a buffer circuit coupled to a set of input terminals and captures first data at the set of input terminals responsive, at least in part, to the first edge of the internal strobe signal and further captures second data at the set of input terminals responsive, at least in part, to the second edge of the internal strobe signal; a driver coupled between the buffer circuit and a set of data terminals and configured to be activated to provide the first and second data from the buffer circuit to the set of data terminals responsive, at least in part, to a control signal; and a width expanding circuit that provides the control signal responsive, at least in part, to the internal strobe signal.

    Semiconductor device having a test circuit

    公开(公告)号:US10790039B1

    公开(公告)日:2020-09-29

    申请号:US16584520

    申请日:2019-09-26

    Abstract: Disclosed herein is an apparatus that includes a first semiconductor chip including a data I/O terminal, a test terminal, a first data input node, a first data output node, a read circuit, a write circuit, and a test circuit configured to transfer a test data supplied from the test terminal to the read circuit, and a second semiconductor chip including a second data input node connected to the first data output node, a second data output node connected to the first data input node, and a memory cell array. The test circuit is configured to activate the read circuit, the write circuit and the memory cell array so that the test data is written into the memory cell array via the read circuit, the data I/O terminal, the write circuit, the first data output node, and the second data input node.

    Shared error detection and correction memory

    公开(公告)号:US10468114B2

    公开(公告)日:2019-11-05

    申请号:US16013290

    申请日:2018-06-20

    Abstract: Apparatuses and methods for an interface chip that interfaces with chips are described. An example apparatus includes: first terminals; circuit groups, each of the circuit groups including circuit blocks being configured to electrically couple to the first terminals; a control circuit that selects one of the circuit groups and electrically couple the first terminals to the circuit blocks of the one of the circuit groups; terminal groups, each of the terminal groups including second terminals, each of the terminal groups being provided correspondingly to each of the circuit groups, the second terminals of each of the terminal groups being smaller in number than the circuit blocks of a corresponding one of the circuit groups; and a remapping circuit that couples the second terminals of each of the terminal groups to selected ones of the circuit blocks of the corresponding one of the circuit groups.

    MEMORY DEVICE WITH WRITE DATA BUS CONTROL
    16.
    发明申请

    公开(公告)号:US20190122708A1

    公开(公告)日:2019-04-25

    申请号:US16225303

    申请日:2018-12-19

    Abstract: Apparatuses and methods for transmitting data between a plurality of chips are described. An example apparatus includes: a first chip, wherein the first chip includes a receiver that receives a data strobe signal and further generates an internal strobe signal responsive, at least in part, to the data strobe signal, the internal strobe signal including a first edge and a second edge following the first edge; a buffer circuit coupled to a set of input terminals and captures first data at the set of input terminals responsive, at least in part, to the first edge of the internal strobe signal and further captures second data at the set of input terminals responsive, at least in part, to the second edge of the internal strobe signal; a driver coupled between the buffer circuit and a set of data terminals and configured to be activated to provide the first and second data from the buffer circuit to the set of data terminals responsive, at least in part, to a control signal; and a width expanding circuit that provides the control signal responsive, at least in part, to the internal strobe signal.

    SHARED ERROR DETECTION AND CORRECTION MEMORY
    17.
    发明申请

    公开(公告)号:US20180301202A1

    公开(公告)日:2018-10-18

    申请号:US16013290

    申请日:2018-06-20

    Abstract: Apparatuses and methods for an interface chip that interfaces with chips are described. An example apparatus includes: first terminals; circuit groups, each of the circuit groups including circuit blocks being configured to electrically couple to the first terminals; a control circuit that selects one of the circuit groups and electrically couple the first terminals to the circuit blocks of the one of the circuit groups; terminal groups, each of the terminal groups including second terminals, each of the terminal groups being provided correspondingly to each of the circuit groups, the second terminals of each of the terminal groups being smaller in number than the circuit blocks of a corresponding one of the circuit groups; and a remapping circuit that couples the second terminals of each of the terminal groups to selected ones of the circuit blocks of the corresponding one of the circuit groups.

    Shared error detection and correction memory

    公开(公告)号:US10008287B2

    公开(公告)日:2018-06-26

    申请号:US15217719

    申请日:2016-07-22

    Abstract: Apparatuses and methods for an interface chip are described. An example apparatus includes a first chip. The first chip includes, on a single semiconductor substrate, first terminals, circuit groups, and terminal groups corresponding to the circuit groups, each of the circuit groups including circuit blocks. A control circuit in the first chip selects one of the circuit groups and electrically couples the first terminals to the circuit blocks of the selected circuit group. Second terminals are included in each of the terminal groups. A number of all of the second terminals in each of the terminal groups is smaller than a number of all of the circuit blocks in the corresponding circuit group. The first chip further includes, for example, a remapping circuit.

    Semiconductor layered device with data bus

    公开(公告)号:US11120849B2

    公开(公告)日:2021-09-14

    申请号:US16459439

    申请日:2019-07-01

    Abstract: Apparatuses and methods of data communication between semiconductor chips are described. An example apparatus includes: a first semiconductor chip and a second semiconductor chips that are stacked with each other via through substrate vias (TSVs) provided in one of the first semiconductor chip and the second semiconductor chip. The first semiconductor chip and the second semiconductor chips communicate with each other by use of data bus inversion data that have been encoded using a DBI algorithm.

    Shared error detection and correction memory

    公开(公告)号:US10854310B2

    公开(公告)日:2020-12-01

    申请号:US16436767

    申请日:2019-06-10

    Abstract: Apparatuses and methods for an interface chip that interfaces with chips are described. An example apparatus includes: first terminals; circuit groups, each of the circuit groups including circuit blocks being configured to electrically couple to the first terminals; a control circuit that selects one of the circuit groups and electrically couple the first terminals to the circuit blocks of the one of the circuit groups; terminal groups, each of the terminal groups including second terminals, each of the terminal groups being provided correspondingly to each of the circuit groups, the second terminals of each of the terminal groups being smaller in number than the circuit blocks of a corresponding one of the circuit groups; and a remapping circuit that couples the second terminals of each of the terminal groups to selected ones of the circuit blocks of the corresponding one of the circuit groups.

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