摘要:
A method, apparatus, and computer program product are provided for implementing packet ordering in a network processor. Packets are received and placed on a receive queue and a queue entry is provided for each received packet. The queue entry includes for each autoroute packet, an autoroute indication and a selected transmit queue. An associated ordering queue is provided with the receive queue. A software-handled packet is dequeued from the receive queue and the dequeued software-handled packet is placed on the ordering queue. Each autoroute packet reaching a head of the receive queue is automatically moved to the selected ordering queue.
摘要:
A boundary configuration (Common Input/output CIO) for Generalized Scan Designs (GSD) in a single clock chip design includes at least one generalized scan design internal latch; a boundary scan clock input to the internal latch; an input/output cell connected to the internal latch; and at least one control line between the internal latch and the input/output cell. The CIO GSD is arranged and configured to operate in various modes including a function mode, a RUNBIST/INTEST/LBIST mode, an EXTEST/WIRETEST mode, a SAMPLE/PRELOAD mode, etc. In a different version, a MUX controller is connected to the internal latch. The MUX controller selects data from one of at least two control lines and sending the selected data to at least one internal logic unit of the chip for a test operation.
摘要:
A system and method for reducing simultaneous switching during scan-based testing of a system logic design. System logic is divided into clusters of system logic, and one or more scan chains are associated with each logic cluster. Each of the logic clusters are concurrently scan tested, yet circuitry in the scan chains associated with a cluster are triggered at different times than the circuitry in the scan chains of other clusters. Offset scan control signals provide the triggering for the scan chains of different clusters. Release and capture functions are also controlled to reduce simultaneous release and capture switching in different clusters.
摘要:
A mechanism is provided to reuse functional data buffers. With Extreme Data Rate (XDR™) Dynamic Random Access Memory (DRAM), test patterns are employed to dynamically calibrate data with the clock. To perform this task, data buffers are employed to store data and commands for the calibration patterns. However, there are different procedures and requirements for transmission and reception calibrations. Hence, to reduce the amount of hardware needed to perform transmission and reception calibrations, the data buffers employ additional front end circuitry to reuse the buffers for both tasks.
摘要:
Managing write-to-read turnarounds in an early read after write memory system is presented. Memory controller logic identifies a write operation's bank set, allows a different bank set read operation to issue prior to the write operation's completion, and allows a same bank set read operation to issue once the write operation completes. The memory controller includes operation counter logic, operation selection logic, operation acceptance logic, command formatting logic, and memory interface logic. The operation counter logic receives new-operation-related signals from the operation acceptance logic and, in turn, provides signals to the operation selection logic and the operation acceptance logic as to when to issue a read operation that corresponds to either an even DRAM bank or an odd DRAM bank.
摘要:
Separate handling of read and write operations of Read-Modify-Write Commands in an XDR™ memory system is provided. This invention allows the system to issue other commands between the reads and writes of a RMW. This insures that the dataflow time from read to write is not a penalty. A RMW buffer is used to store the read data and a write buffer is used to store the write data. A MUX is used to merge the read data and the write data, and transmit the merged data to the target DRAM via the XIO. The RMW buffer can also be used for scrubbing commands.
摘要:
Separate handling of read and write operations of Read-Modify-Write Commands in an XDR™ memory system is provided. This invention allows the system to issue other commands between the reads and writes of a RMW. This insures that the dataflow time from read to write is not a penalty. A RMW buffer is used to store the read data and a write buffer is used to store the write data. A MUX is used to merge the read data and the write data, and transmit the merged data to the target DRAM via the XIO. The RMW buffer can also be used for scrubbing commands.
摘要:
A mapping area including a packet work area and a corresponding set of packet segment registers are provided. A packet segment register is loaded with a Packet ID (PID) and a packet translation unit maps packet data into the corresponding packet work area. Packets include one or more data buffers. Data buffers are chained together using a corresponding buffer descriptor for each data buffer. Each buffer descriptor points to the corresponding data buffer and to a next buffer descriptor. Each buffer descriptor includes an offset for a next packet data. A translate address is compared to the offset of each buffer descriptor to identify the data buffer containing the translate address. A buffer sharing counter (BSC) is allocated for a shared data buffer. Each buffer descriptor pointing to the shared data includes a pointer to the buffer sharing counter (BSC).
摘要:
A data processing system, circuit arrangement, program product, and method thereof utilize a multi-path scan interface that is capable of providing multiple scan paths into a plurality of scan ring segments in an integrated circuit device. The multi-path scan interface utilizes one or more multiplexers coupled between scan in and scan out ports and at least one scan ring segment to provide alternate scan paths depending upon select signals supplied to each multiplexer. With such a configuration, a standardized scan interface may developed for interfacing with a wide variety of scan ring segments, and optionally, for multiple purposes. As a result, the amount of custom circuitry necessary to provide access to scan ring segments is significantly reduced.
摘要:
A method and apparatus for handling variable data word widths and array depths in an array built-in self-test system for testing a plurality of memory arrays using a single controller. Each array includes a predetermined row and column address depth and data word width. Each array further includes a scan register. A universal test data word is generated and sent to the scan register of each array. The universal length test data word has a length dependent upon the maximum row address depth, maximum column address depth and/or the maximum data word width. A portion of the test data word which exceeds the column address depth, row address depth and/or the data word width of a particular array is shifted off the end of the scan register of the particular array.