摘要:
A method and apparatus for handling variable data word widths and array depths in an array built-in self-test system for testing a plurality of memory arrays using a single controller. Each array includes a predetermined row and column address depth and data word width. Each array further includes a scan register. A universal test data word is generated and sent to the scan register of each array. The universal length test data word has a length dependent upon the maximum row address depth, maximum column address depth and/or the maximum data word width. A portion of the test data word which exceeds the column address depth, row address depth and/or the data word width of a particular array is shifted off the end of the scan register of the particular array.
摘要:
A functional unit, such as an SRAM, in a single clock chip design that contains a scan path can be clocked on either rising edge and falling edge of the clock. The functional unit includes a clock signal having two phases and a plurality of latches for scanning. Two scan latches are added outside the array of the functional unit. In one clock phase, the two scan latches form a latch pair which is connected to the array at Scan-in side. In the other clock phase, one scan latch is connected to the array at the Scan-in side, and the other scan latch is connected to the array at the Scan-out side. In scan/hold operations, a first control signal for the array which is clocked at the falling edge of the clock leads a second control signal for the array which is clocked at the rising edge of the clock. In ABIST/functional operations, the first control signal for the array which is clocked at the falling edge of the clock trails the second control signal for the array which is clocked at the rising edge of the clock.
摘要:
A system and method for reducing simultaneous switching during scan-based testing of a system logic design. System logic is divided into clusters of system logic, and one or more scan chains are associated with each logic cluster. Each of the logic clusters are concurrently scan tested, yet circuitry in the scan chains associated with a cluster are triggered at different times than the circuitry in the scan chains of other clusters. Offset scan control signals provide the triggering for the scan chains of different clusters. Release and capture functions are also controlled to reduce simultaneous release and capture switching in different clusters.
摘要:
A data processing system, circuit arrangement, program product, and method thereof utilize a multi-path scan interface that is capable of providing multiple scan paths into a plurality of scan ring segments in an integrated circuit device. The multi-path scan interface utilizes one or more multiplexers coupled between scan in and scan out ports and at least one scan ring segment to provide alternate scan paths depending upon select signals supplied to each multiplexer. With such a configuration, a standardized scan interface may developed for interfacing with a wide variety of scan ring segments, and optionally, for multiple purposes. As a result, the amount of custom circuitry necessary to provide access to scan ring segments is significantly reduced.
摘要:
A system and method for conducting a repeatable logic test on at least one functional unit of an IC chip includes steps of selecting at least one functional unit of at least several functional units, propagating test data through a part or all functional units of the time domain; and capturing test data of the selected functional unit. The functional units are either selected or held inactive such that only the selected functional unit is allowed to capture the test results for determining a critical timing path within the selected functional unit and only the functional unit. By selecting different combination of the functional unit(s), a number of the critical timing paths are readily determined in the chip.
摘要:
A method and apparatus for managing write-to-read turnarounds in an early read after write memory system are presented. Memory controller logic identifies a write operation's bank set, allows a different bank set read operation to issue prior to the write operation's completion, and allows a same bank set read operation to issue once the write operation completes. The memory controller includes operation counter logic, operation selection logic, operation acceptance logic, command formatting logic, and memory interface logic. The operation counter logic receives new-operation-related signals from the operation acceptance logic and, in turn, provides signals to the operation selection logic and the operation acceptance logic as to when to issue a read operation that corresponds to either an even DRAM bank or an odd DRAM bank.
摘要:
Managing write-to-read turnarounds in an early read after write memory system is presented. Memory controller logic identifies a write operation's bank set, allows a different bank set read operation to issue prior to the write operation's completion, and allows a same bank set read operation to issue once the write operation completes. The memory controller includes operation counter logic, operation selection logic, operation acceptance logic, command formatting logic, and memory interface logic. The operation counter logic receives new-operation-related signals from the operation acceptance logic and, in turn, provides signals to the operation selection logic and the operation acceptance logic as to when to issue a read operation that corresponds to either an even DRAM bank or an odd DRAM bank.
摘要:
The present invention generally relates to memory controllers operating in a system containing a variable system clock. The memory controller may exchange data with a processor operating at a variable processor clock frequency. However the memory controller may perform memory accesses at a constant memory clock frequency. Asynchronous buffers may be provided to transfer data across the variable and constant clock domains. To prevent read buffer overflow while switching to a lower processor clock frequency, the memory controller may quiesce the memory sequencers and pace read data from the sequencers at a slower rate. To prevent write data under runs, the memory controller's data flow logic may perform handshaking to ensure that write data is completely received in the buffer before performing a write access.
摘要:
In a first aspect, a first method of interfacing a processor and memory is provided. The first method includes the steps of (1) providing a computer system including (a) a first memory; (b) a processor adapted to issue a functional command to the first memory; (c) a translation chip; (d) a cache memory coupled to the translation chip; (e) a first link adapted to couple the processor to the translation chip; and (f) a second link adapted to couple the translation chip to the first memory; and (2) calibrating the first link to transmit data between the processor and cache memory. Numerous other aspects are provided.
摘要:
A method, apparatus and computer program product are provided for implementing packet command instructions for network processing. A set of packet commands is provided. Each packet command defines a corresponding packet operation. A command from the set of packet commands is issued to perform the defined corresponding packet operation. A packet buffer structure hardware is provided for performing one or more predefined packet manipulation functions responsive to the issued command.