Abstract:
A method of controlling a pixel array includes reading out image data from pixel cells of a row i of the of the pixel array with second transfer control signals that are coupled to be received by transfer transistors included in the pixels cells of the row of the of the pixel array that is being read out. Exposure times for pixel cells are independently controlled in other rows of the pixel array that are not being read out with first transfer control signals coupled to be received by transfer transistors included in the pixel cells in the other rows of the of the pixel array that are not being read out while the image data is read out from the pixel cells of row i of the pixel array.
Abstract:
A process including forming an a backside-illuminated (BSI) image sensor in a substrate, the image sensor including a pixel array formed in or near a front surface of the substrate and one or more circuit blocks formed in the substrate near the pixel array, each circuit block including at least one support circuit. An interconnect layer is formed on the front surface of the substrate that includes a dielectric within which are embedded traces and vias, wherein the traces and vias electrically couple the pixel array to at least one of the one or more support circuits. An isolation trench is formed surrounding at least one of the one or more circuit blocks to isolate the pixel array and other circuit blocks from noise generated by the at least one support circuit within the circuit block surrounded by the isolation trench. Other embodiments are disclosed and claimed.
Abstract:
An example imaging sensor system includes a Single-Photon Avalanche Diode (SPAD) imaging array formed in a first semiconductor layer of a first wafer. The SPAD imaging array includes an N number of pixels, each including a SPAD region formed in a front side of the first semiconductor layer. The first wafer is bonded to a second wafer at a bonding interface between a first interconnect layer of the first wafer and the second interconnect layer of the second wafer. An N number of digital counters are formed in a second semiconductor layer of the second wafer. Each of the digital counters are configured to count output pulses generated by a respective SPAD region.
Abstract:
An image sensor system includes an image sensor and a host controller. The image sensor includes a power input terminal, a data terminal, a clock input terminal, and a ground terminal. The host controller is coupled to the power input terminal to provide power to the image sensor, the data terminal to receive analog image data from the image sensor, the clock input terminal to provide a clock signal to the image sensor, and the ground terminal. The ground terminal serves as a common reference between the image sensor and one or more circuits of the host controller. The system also includes logic that is configured to transfer the analog image data from the image sensor to the host controller through the data terminal of the image sensor and to transfer one or more digital control signals between the image sensor and the host controller through the data terminal.
Abstract:
A multiple image sensor image acquisition system includes a clock control unit to generate a synchronization clock signal. The synchronization clock signal has a prolonged constant cycle during which the synchronization clock signal is held at a constant level for a period of time corresponding to multiple clock cycles. A first image sensor is coupled with the clock control unit to receive the synchronization clock signal and has a first synchronization unit that is operable to synchronize operation for the first image sensor based on detection of an end of the prolonged constant cycle. A second image sensor is coupled with the clock control unit to receive the synchronization clock signal and has a second synchronization unit that is operable to synchronize operation for the second image sensor based on detection of the end of the prolonged constant cycle. The image sensors are synchronized operationally.
Abstract:
An imaging system includes a pixel array with odd and even pixel cells. Each of the odd and even pixel cells includes a photodiode, a floating diffusion, a transfer transistor, a reset transistor, a lateral overflow integration capacitor (LOFIC), and an overflow gate (OFG) transistor. The imaging system further includes a readout circuit with a sample and hold (SH) circuit and an analog to digital converter. The OFG transistor of each of the odd and even pixel cells is configured to direct the image charge photogenerated by the respective photodiode away from the respective transfer transistor and reduce photodiode exposure shift during LOFIC readouts during a global transfer period.
Abstract:
An imaging system includes a pixel array with odd and even pixel cells. Each of the odd and even pixel cells includes a photodiode, a floating diffusion, a transfer transistor, a reset transistor, a lateral overflow integration capacitor (LOFIC), and an overflow gate (OFG) transistor. The imaging system further includes a readout circuit with a sample and hold (SH) circuit and an analog to digital converter. The OFG transistor of each of the odd and even pixel cells is configured to direct the image charge photogenerated by the respective photodiode away from the respective transfer transistor and reduce photodiode exposure shift during LOFIC readouts during a global transfer period.
Abstract:
A pixel array includes pixel cells, each including photodiodes. A source follower is coupled to generate an image signal in response image charge generated by the photodiodes. A first row select transistor is coupled to the source follower to output the image signal of the pixel cell. Pixel cells are organized into columns including a first column and a second column. The first row select transistors of the pixel cells of the first and second columns of pixel cells are coupled to first and second column bitlines, respectively. The pixel cells of the second column of pixel cells further include a second row select transistor coupled to the source follower to output the respective image signal to the first column bitline.
Abstract:
A pixel array includes pixel cells disposed in semiconductor material. Each of the pixel cells includes photodiodes, and a floating diffusion to receive image charge from the photodiodes. A source follower is coupled to the floating diffusion to generate an image signal in response image charge from the photodiodes. Drain regions of first and second row select transistors are coupled to a source of the source follower. A common junction is disposed in the semiconductor material between gates of the first and second row select transistors such that the drains of the first and second row select transistors are shared and coupled together through the semiconductor material of the common junction. The pixel cells are organized into a rows and columns with bitlines.
Abstract:
An event driven pixel includes a photodiode configured to photogenerate charge in response to incident light received from an external scene. A photocurrent to voltage converter is coupled to the photodiode to convert photocurrent generated by the photodiode to a voltage. A filter amplifier is coupled to the photocurrent to voltage converter to generate a filtered and amplified signal in response to the voltage received from the photocurrent to voltage converter. A threshold comparison stage is coupled to the filter amplifier to compare the filtered and amplified signal received from the filter amplifier with thresholds to asynchronously detect events in the external scene in response to the incident light. A digital time stamp generator is coupled to asynchronously generate a digital time stamp in response to the events asynchronously detected in the external scene by the threshold comparison stage.