Abstract:
The disclosure relates to detectors of the level of supply voltage in an integrated circuit. The disclosed detector is designed to detect the crossing of low levels of supply voltage. It comprises a first arm to define a first reference voltage and a second arm to define a second reference voltage, these two reference voltages varying differently as a function of the supply voltage and their curves of variation intersecting for a value of the supply voltage located close to a desired threshold. A comparator receives the two reference voltages. The first arm has a resistive divider bridge, an intermediate connector of which constitutes the first reference voltage. The second arm comprises a resistor series-connected with a native P type MOS transistor, the point of junction of this resistor and this transistor constituting the second reference voltage. A non-linear element may be parallel-connected to the resistor which constitutes the first reference voltage.
Abstract:
An EEPROM cell is described as having a screening metal structure formed of preference in the first metal layer and located in substantial overlaying relationship at the floating gate terminal. This defeats the possibility of anomalous readings being obtained by measuring the amount of charge on the floating gate terminal. An additional screening metal structure, to be formed in the third and following metal layers, may be provided to fully overlie the cell and provide additional protection against anomalous readings.
Abstract:
In a memory, a zone descriptor contains authorizations to act which may pertain to actions of reading, writing and erasure and which concerns memory words of a zone of the memory controlled by this descriptor. The zone descriptor also has an information element indicating the length of the memory zone by including the address of the next descriptor. An internal zone control signal is produced in order to store a mode of management of the memory zone and, an address corresponding to the end of the zone. The end of zone address is then compared with the addresses delivered by an address counter. A modification of the stored information is prompted when the end of a zone is reached.
Abstract:
An integrated circuit chip including a plurality of parallel wells of alternated conductivity types formed in the upper portion of a semiconductor substrate of a first conductivity type, and a device of protection against attacks including: between the wells, trenches with insulated walls filled with a conductive material, said trenches extending from the upper surface of the wells to the substrate; and a circuit capable of detecting a modification of the stray capacitance formed between said conductive material and a region of the chip.
Abstract:
The present invention relates to a non-volatile memory comprising a memory array comprising functional memory cells and non-functional memory cells linked to at least one non-functional word line. A word line address decoder comprises a special decoding section linked to the non-functional word line, for selecting the non-functional word line when a functional word line is read-selected, such that non-functional memory cells are selected simultaneously with the functional memory cells, and distort the reading of the functional memory cells. Application particularly to integrated circuits for smart cards.
Abstract:
A memory device may include a memory plane including a group of memory cells configured to store a block of bits including data bits and parity bits, and a detector for detecting a fault injection including a reader to read each bit, and a first checker to perform, when reading a block, a parity check based on the read value of each data and parity bit. The memory plane may include reference memory cells arranged between some of the memory cells to create packets of m memory cells. Each reference memory cell may store a reference bit and each packet of m memory cells may store m bits of the associated block, when m is greater than 1, with different parities. The detector may further include a second checker to perform, when reading the block, a check on the value of each reference bit.
Abstract:
The present invention relates to a non-volatile memory comprising a memory array comprising functional memory cells and non-functional memory cells linked to at least one non-functional word line. A word line address decoder comprises a special decoding section linked to the non-functional word line, for selecting the non-functional word line when a functional word line is read-selected, such that non-functional memory cells are selected simultaneously with the functional memory cells, and distort the reading of the functional memory cells. Application particularly to integrated circuits for smart cards.
Abstract:
A method processes parallel electrical signals, using parallel processing circuits that process successive cycles of electrical signals according to a rule for allocating electrical signals to the processing circuits. The method comprises, between the processing cycles, a step of modifying the rule for allocating electrical signals to the processing circuits, so that a processing circuit processes electrical signals of different ranks during different processing cycles. The method can be applied particularly to secure a memory during read phases of the memory and of an integrated circuit with a microprocessor using such a memory.
Abstract:
The present invention relates to a non-volatile memory comprising a memory array comprising functional memory cells and non-functional memory cells linked to at least one non-functional word line. A word line address decoder comprises a special decoding section linked to the non-functional word line, for selecting the non-functional word line when a functional word line is read-selected, such that non-functional memory cells are selected simultaneously with the functional memory cells, and distort the reading of the functional memory cells. Application particularly to integrated circuits for smart cards.
Abstract:
An integrated circuit chip including a plurality of parallel wells of alternated conductivity types formed in the upper portion of a semiconductor substrate of a first conductivity type, and a device of protection against attacks including: between the wells, trenches with insulated walls filled with a conductive material, said trenches extending from the upper surface of the wells to the substrate; and a circuit capable of detecting a modification of the stray capacitance formed between said conductive material and a region of the chip.