Abstract:
A body including a dielectric layer and internal electrodes disposed alternately with the dielectric layer interposed therebetween; and external electrodes disposed on the body, wherein the dielectric layer includes a main component containing calcium (Ca), strontium (Sr), zirconium (Zr) and titanium (Ti) and a sub-component containing manganese (Mn), yttrium (Y) and silicon (Si), wherein the dielectric layer includes a plurality of dielectric grains and grain boundaries disposed between adjacent dielectric grains, and at least a portion of the plurality of dielectric grains has a core-shell structure, a content of yttrium (Y) included in a core relative to 100 moles of zirconium (Zr) included in the core and a shell is defined as Yc, a content of yttrium (Y) included in the shell relative to 100 moles of zirconium (Zr) included in the core and the shell is defined as Ys, and Ys/Yc>9 is satisfied.
Abstract:
A camera module includes: a housing defining an internal space; a first lens module disposed in the internal space to move along an optical axis direction, the first lens module including at least one first bearing member; a second lens module disposed in the internal space to move along the optical axis direction, the second lens module including at least one second bearing member; a shaft disposed in the housing and supporting a first side of the first lens module and contacting the at least one first bearing member and supporting a first side of the second lens module and contacting the at least one second bearing member; at least one first ball member supporting a second side of the first lens module; and at least one second ball member supporting a second side of the second lens module.
Abstract:
A force sensing device includes a support member including: a sensor support portion to which a force sensor is coupled on one surface of the support member; and a frame coupling portion extending from the sensor support portion. The force sensing device further includes: a frame disposed to face another surface of the support member, and disposed to be spaced apart from the support member; and at least one spacing member disposed between the support member and the frame, and spacing the support member apart from the frame. The force sensor is not disposed in the frame coupling portion. The spacing member is disposed between the frame coupling portion and the frame.
Abstract:
A fan-out semiconductor package includes a wiring portion, semiconductor chips, a dummy chip, and an encapsulant. The wiring portion includes an insulating layer, conductive patterns formed on the insulating layer, and conductive vias penetrating through the insulating layer and connected to the conductive patterns. The semiconductor chips are disposed on one region of the wiring portion, and the dummy chip is disposed on another region thereof and has a thickness smaller than those of the semiconductor chips. The encapsulant encapsulates at least portions of the semiconductor chips and the dummy chip. An upper surface of the wiring portion is disposed below a center line of the fan-out semiconductor package, and the thickness t of the dummy chip is such that T/2≤t≤3T/2 in which T is a distance from the upper surface of the wiring portion to the center line of the fan-out semiconductor package.
Abstract:
A fan-out semiconductor package includes a semiconductor chip having an active surface on which a connection pad is disposed and an inactive surface opposing the active surface, an encapsulant sealing at least a portion of the inactive surface, a first connection member disposed on the active surface and including a redistribution layer and a first via electrically connecting the connection pad to the redistribution layer, a passivation layer disposed on the first connection member, and an under-bump metal layer including an external connection pad disposed on the passivation layer and a second via connecting the external connection pad to the redistribution layer. In a vertical direction, the first and second vias are disposed within the external connection pad and do not overlap each other.
Abstract:
A fan-out semiconductor package includes a semiconductor chip having an active surface on which a connection pad is disposed and an inactive surface opposing the active surface, an encapsulant sealing at least a portion of the inactive surface, a first connection member disposed on the active surface and including a redistribution layer and a first via electrically connecting the connection pad to the redistribution layer, a passivation layer disposed on the first connection member, and an under-bump metal layer including an external connection pad disposed on the passivation layer and a second via connecting the external connection pad to the redistribution layer. In a vertical direction, the first and second vias are disposed within the external connection pad and do not overlap each other.
Abstract:
The present invention provides a horizontal linear vibrator which can reduce the thickness but increase vibration strength while at the same time guaranteeing a sufficiently long lifetime and satisfactory responsivity. The horizontal linear vibrator includes a casing, a bracket, a vibration unit and springs. The casing defines an internal space therein. The bracket is disposed under the casing. A cylindrical coil is provided on the bracket. The vibration unit has a magnet, a yoke and a weight. The yoke contains the magnet therein and is open on the lower end thereof. The weight is coupled to the outer surface of the yoke. The springs are coupled to sidewall plates of the casing or the bracket. The springs elastically support the vibration unit to allow the vibration unit to vibrate in the horizontal direction.
Abstract:
Disclosed herein are an electronic component package and a method of manufacturing the same. The electronic component package includes: a substrate; a connection member provided on at least one surface of the substrate; an active element coupled to the substrate by the connection member; and a molding part covering an exposed surface of the active element, wherein the molding part is formed of a first material having a coefficient of thermal expansion of 8 to 15 ppm/° C. and thermal conductivity of 1 to 5 W/m° C. Therefore, warpage may be significantly decreased and heat radiation performance of the active element may be improved, as compared with the case of implementing the molding part using an EMC according to the related art.