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公开(公告)号:US11860734B2
公开(公告)日:2024-01-02
申请号:US17736154
申请日:2022-05-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sungrae Kim , Sunghye Cho , Yeonggeol Song , Kijun Lee , Myungkyu Lee
CPC classification number: G06F11/1068 , G06F11/0772 , G06F11/1048 , H03M13/1108
Abstract: A semiconductor memory device includes a memory cell array, an on-die error correction code (ECC) engine, and a control logic circuit. The on-die ECC engine, based on an ECC, in a write operation, performs an ECC encoding on main data to generate first parity data, selectively replaces a portion of the first parity data with a poison flag to generate second parity data based on a poison mode signal, provides the main data to a normal cell region in a target page of the memory cell array, and provides the first parity data to a parity cell region in the target page or provides the poison flag and the second parity data to the parity cell region. The control logic circuit controls the on-die ECC engine and generates the poison mode signal, based on a command and an address from a memory controller.
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公开(公告)号:US11829614B2
公开(公告)日:2023-11-28
申请号:US17842981
申请日:2022-06-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yeonggeol Song , Sungrae Kim , Kijun Lee , Myungkyu Lee , Eunae Lee , Sunghye Cho
CPC classification number: G06F3/0626 , G06F3/064 , G06F3/0679 , G06F11/1068
Abstract: A semiconductor memory device includes a buffer die and a plurality of memory dies. An error correction code (ECC) engine in one of the memory dies performs an RS encoding on a main data to generate a parity data and performs a RS decoding, using a parity check matrix, on the main data and the parity data. The parity check matrix includes sub matrixes and each of the sub matrixes corresponds to two different symbols. Each of the sub matrixes includes two identity sub matrixes and two same alpha matrixes, the two identity sub matrixes are disposed in a first diagonal direction of the sub matrix and the two same alpha matrixes are disposed in a second diagonal direction. A number of high-level value elements in a y-th row of the parity check matrix is the same as a number of high-level value elements in a (y+p)-th row.
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公开(公告)号:US11689224B2
公开(公告)日:2023-06-27
申请号:US17199803
申请日:2021-03-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Eunae Lee , Kijun Lee , Yeonggeol Song , Myungkyu Lee , Seokha Hwang
CPC classification number: H03M13/1575 , G06F11/1076 , H03M13/1525
Abstract: An error correction device according to the technical idea of the present disclosure includes a syndrome generation circuit configured to receive data and generate a plurality of syndromes for the data, a partial coefficient generation circuit configured to generate partial coefficient information on a part of a coefficient of an error location polynomial by using the data while the plurality of syndromes are generated, an error location determination circuit configured to determine the coefficient of the error location polynomial based on the plurality of syndromes and the partial coefficient information, and obtain a location of an error in the data by using the error location polynomial, and an error correction circuit configured to correct the error in the data according to the location of the error.
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公开(公告)号:US20230037996A1
公开(公告)日:2023-02-09
申请号:US17718422
申请日:2022-04-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sungrae Kim , Myungkyu Lee , Kijun Lee , Sunghye Cho
Abstract: An operating method of a memory device includes storing position information regarding a codeword including an erasure and erasure information including position information regarding the erasure in a memory region, loading the position information regarding the codeword to a row decoder and a column decoder, determining whether a read address corresponding to a read instruction is identical to the position information regarding the codeword including the erasure, in response to the read instruction from a host, transmitting the position information of the erasure to an error correction code (ECC) decoder, when the read address is identical to the position information regarding the codeword including the erasure, and correcting, by the ECC decoder, an error in a codeword received from a memory cell array using the position information regarding the erasure.
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公开(公告)号:US11106535B2
公开(公告)日:2021-08-31
申请号:US16926000
申请日:2020-07-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sunghye Cho , Kijun Lee , Yeonggeol Song , Sungrae Kim , Chanki Kim , Myungkyu Lee , Sanguhn Cha
Abstract: An error correction circuit includes an error correction code (ECC) encoder and an ECC decoder. The ECC encoder generates, based on a main data, a parity data using an ECC represented by a generation matrix and stores a codeword including the main data and the parity data in a target page. The ECC decoder reads the codeword from the target page as a read codeword based on an externally provided address to generate different syndromes based on the read codeword and a parity check matrix which is based on the ECC, and applies the different syndromes to the main data in the read codeword to correct a single bit error when the single bit error exists in the main data or to correct two bit errors when the two bit errors occur in adjacent two memory cells in the target page.
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16.
公开(公告)号:US20240233798A9
公开(公告)日:2024-07-11
申请号:US18327335
申请日:2023-06-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myungkyu Lee , Eunae Lee , Sunghye Cho , Kyomin Sohn , Kijun Lee
IPC: G11C11/406 , G06F12/02
CPC classification number: G11C11/406 , G06F12/0223
Abstract: A semiconductor memory device includes a memory cell array with a plurality of rows of memory cells therein, and a row hammer management (RHM) circuit including a hammer address queue. The RHM circuit is configured to: (i) receive first access row addresses from an external memory controller during a reference time interval, (ii) store a first row address randomly selected from the first access row addresses and second row addresses consecutively received from the memory controller after selecting the first row address, in the hammer address queue as candidate hammer addresses, and (iii) sequentially output the candidate hammer addresses as a hammer address. A refresh control circuit is provided to receive the hammer address and to perform a hammer refresh operation on one or more victim memory cell rows, which are physically adjacent to a memory cell row corresponding to the hammer address.
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17.
公开(公告)号:US20240185942A1
公开(公告)日:2024-06-06
申请号:US18482300
申请日:2023-10-06
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myungkyu Lee , Seongmuk Kang , Sunghye Cho , Daehyun Kim , Kyomin Sohn , Kijun Lee
Abstract: A memory device includes a memory cell array and an error correction code (ECC) circuit. The ECC circuit, which is configured to correct an error in a data code read out from the memory cell array, includes: (i) a syndrome calculating unit configured to operate a plurality of syndromes based on the data code and an H-matrix, (ii) an error location detecting unit configured to generate an error vector based on the plurality of syndromes, and (iii) an error correcting unit configured to correct an error within the data code based on the error vector, and output corrected data.
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18.
公开(公告)号:US20240135980A1
公开(公告)日:2024-04-25
申请号:US18327335
申请日:2023-05-31
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myungkyu Lee , Eunae Lee , Sunghye Cho , Kyomin Sohn , Kijun Lee
IPC: G11C11/406 , G06F12/02
CPC classification number: G11C11/406 , G06F12/0223
Abstract: A semiconductor memory device includes a memory cell array with a plurality of rows of memory cells therein, and a row hammer management (RHM) circuit including a hammer address queue. The RHM circuit is configured to: (i) receive first access row addresses from an external memory controller during a reference time interval, (ii) store a first row address randomly selected from the first access row addresses and second row addresses consecutively received from the memory controller after selecting the first row address, in the hammer address queue as candidate hammer addresses, and (iii) sequentially output the candidate hammer addresses as a hammer address. A refresh control circuit is provided to receive the hammer address and to perform a hammer refresh operation on one or more victim memory cell rows, which are physically adjacent to a memory cell row corresponding to the hammer address.
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公开(公告)号:US20240096395A1
公开(公告)日:2024-03-21
申请号:US18470471
申请日:2023-09-20
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sunghye Cho , Eunae Lee , Jungmin You , Yeonggeol Song , Kyomin Sohn , Kijun Lee , Myungkyu Lee
IPC: G11C11/406 , G11C11/4078
CPC classification number: G11C11/40622 , G11C11/40611 , G11C11/4078
Abstract: A device, an operating method of a memory controller, a memory device, and a compute express link (CXL) memory expansion device all for managing a row hammer are provided. The device includes a volatile memory and a memory controller that is configured to detect, based on input row addresses, a pattern size of a row hammer attack pattern and a row distribution of row hammer addresses, to determine, according to a type of the row distribution, whether to perform refresh management, and for every L access corresponding to the pattern size, to provide, to the volatile memory, a refresh management command and a target row address, where L is an integer greater than or equal to 1.
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公开(公告)号:US11881277B2
公开(公告)日:2024-01-23
申请号:US17718422
申请日:2022-04-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sungrae Kim , Myungkyu Lee , Kijun Lee , Sunghye Cho
CPC classification number: G11C29/44 , G06F11/1016 , G11C15/04 , G11C17/165 , H03M13/1108 , H03M13/1168 , H03M13/1575
Abstract: An operating method of a memory device includes storing position information regarding a codeword including an erasure and erasure information including position information regarding the erasure in a memory region, loading the position information regarding the codeword to a row decoder and a column decoder, determining whether a read address corresponding to a read instruction is identical to the position information regarding the codeword including the erasure, in response to the read instruction from a host, transmitting the position information of the erasure to an error correction code (ECC) decoder, when the read address is identical to the position information regarding the codeword including the erasure, and correcting, by the ECC decoder, an error in a codeword received from a memory cell array using the position information regarding the erasure.
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