公开(公告)号：US20100039643A1

公开(公告)日：2010-02-18

申请号：US12496788

申请日：2009-07-02

申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

IPC分类号： G01J3/28

CPC分类号： G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J2003/1861 ,  G02F1/134309

摘要： A spectrometer system includes an optical assembly for collimating light, a micro-ring grating assembly having a plurality of coaxially-aligned ring gratings, an aperture device defining an aperture circumscribing a target focal point, and a photon detector. An electro-optical layer of the grating assembly may be electrically connected to an energy supply to change the refractive index of the electro-optical layer. Alternately, the gratings may be electrically connected to the energy supply and energized, e.g., with alternating voltages, to change the refractive index. A data recorder may record the predetermined spectral characteristic. A method of detecting a spectral characteristic of a predetermined wavelength of source light includes generating collimated light using an optical assembly, directing the collimated light onto the micro-ring grating assembly, and selectively energizing the micro-ring grating assembly to diffract the predetermined wavelength onto the target focal point, and detecting the spectral characteristic using a photon detector.

摘要翻译： 光谱仪系统包括用于准直光的光学组件，具有多个同轴对准的环形光栅的微环格栅组件，限定限定目标焦点的孔的孔装置和光子检测器。 光栅组件的电光层可电连接到能量源以改变电光层的折射率。 或者，光栅可以电连接到能量供应并且例如用交流电压通电，以改变折射率。 数据记录器可以记录预定的光谱特性。 检测源光的预定波长的光谱特性的方法包括使用光学组件产生准直光，将准直光引导到微环格栅组件上，以及选择性地激励微环格栅组件以将预定波长衍射到 目标焦点，并使用光子检测器检测光谱特性。

公开(公告)号：US20100039641A1

公开(公告)日：2010-02-18

申请号：US12487735

申请日：2009-06-19

申请人： Yeonjoon Park ,  Glen C. King ,  James R. Elliott ,  Sang H. Choi

发明人： Yeonjoon Park ,  Glen C. King ,  James R. Elliott ,  Sang H. Choi

IPC分类号： G01J3/04 ,  G01J3/28

CPC分类号： G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0237 ,  G01J3/0256 ,  G02B5/005 ,  G02B5/1876

摘要： A spectrometer includes a micro-ring grating device having coaxially-aligned ring gratings for diffracting incident light onto a target focal point, a detection device for detecting light intensity, one or more actuators, and an adjustable aperture device defining a circular aperture. The aperture circumscribes a target focal point, and directs a light to the detection device. The aperture device is selectively adjustable using the actuators to select a portion of a frequency band for transmission to the detection device. A method of detecting intensity of a selected band of incident light includes directing incident light onto coaxially-aligned ring gratings of a micro-ring grating device, and diffracting the selected band onto a target focal point using the ring gratings. The method includes using an actuator to adjust an aperture device and pass a selected portion of the frequency band to a detection device for measuring the intensity of the selected portion.

摘要翻译： 光谱仪包括具有用于将入射光衍射到目标焦点的同轴对准环形光栅的微环格栅装置，用于检测光强度的检测装置，一个或多个致动器以及限定圆形孔径的可调节孔径装置。 光圈限定目标焦点，并将光引导到检测装置。 使用致动器可选择性地调节孔径装置，以选择频带的一部分以传输到检测装置。 检测入射光的所选频带的强度的方法包括将入射光引导到微环光栅装置的同轴对准的环形光栅上，并使用环形光栅将所选择的带衍射到目标焦点上。 该方法包括使用致动器来调节孔径装置并将频带的选定部分传递到用于测量所选部分的强度的检测装置。

公开(公告)号：US20090231677A1

公开(公告)日：2009-09-17

申请号：US12047465

申请日：2008-03-13

申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

IPC分类号： G02F1/29

CPC分类号： G02B3/14 ,  G02F2001/291

摘要： An optical assembly includes a zone plate and electro-optic material disposed on one side of the zone plate. The electro-optic material's index of refraction is controlled to adjust the optical properties of the optical assembly.

摘要翻译： 光学组件包括设置在区域板一侧的区域板和电光材料。 电光材料的折射率被控制以调整光学组件的光学特性。

公开(公告)号：US08294989B2

公开(公告)日：2012-10-23

申请号：US12512344

申请日：2009-07-30

申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

IPC分类号： G02B27/44

CPC分类号： G03B27/32 ,  G03F7/70316 ,  G03F7/70383

摘要： An optical apparatus includes an optical diffraction device configured for diffracting a predetermined wavelength of incident light onto adjacent optical focal points, and a photon detector for detecting a spectral characteristic of the predetermined wavelength. One of the optical focal points is a constructive interference point and the other optical focal point is a destructive interference point. The diffraction device, which may be a micro-zone plate (MZP) of micro-ring gratings or an optical lens, generates a constructive ray point using phase-contrasting of the destructive interference point. The ray point is located between adjacent optical focal points. A method of generating a densely-accumulated ray point includes directing incident light onto the optical diffraction device, diffracting the selected wavelength onto the constructive interference focal point and the destructive interference focal point, and generating the densely-accumulated ray point in a narrow region.

摘要翻译： 光学装置包括被配置为将预定波长的入射光衍射到相邻的光学焦点上的光学衍射装置，以及用于检测预定波长的光谱特性的光子检测器。 其中一个光学焦点是一个建设性的干涉点，另一个光学焦点是一个破坏性的干涉点。 可以是微环形光栅的微区域（MZP）或光学透镜的衍射装置使用相消干涉点的相位对应产生建设性的射线点。 射线点位于相邻的光学焦点之间。 产生密集累积的射线点的方法包括将入射光引导到光学衍射装置上，将所选择的波长衍射到构造干涉焦点和破坏性干涉焦点上，并在狭窄区域中产生密集累积的射线点。

公开(公告)号：US08257491B2

公开(公告)日：2012-09-04

申请号：US12288379

申请日：2008-10-20

申请人： Yeonjoon Park ,  Sang Hyouk Choi ,  Glen C. King ,  James R. Elliott

发明人： Yeonjoon Park ,  Sang Hyouk Choi ,  Glen C. King ,  James R. Elliott

IPC分类号： C30B33/06 ,  C30B23/00 ,  C30B25/00 ,  C30B28/12 ,  C30B28/14

CPC分类号： G01N23/207

摘要： Growth conditions are developed, based on a temperature-dependent alignment model, to enable formation of cubic group IV, group II-V and group II-VI crystals in the [111] orientation on the basal (0001) plane of trigonal crystal substrates, controlled such that the volume percentage of primary twin crystal is reduced from about 40% to about 0.3%, compared to the majority single crystal. The control of stacking faults in this and other embodiments can yield single crystalline semiconductors based on these materials that are substantially without defects, or improved thermoelectric materials with twinned crystals for phonon scattering while maintaining electrical integrity. These methods can selectively yield a cubic-on-trigonal epitaxial semiconductor material in which the cubic layer is substantially either directly aligned, or 60 degrees-rotated from, the underlying trigonal material.

摘要翻译： 开发基于温度依赖性取向模型的生长条件，以使得能够在三面晶体基底的（0001）面上形成[111]取向的立方体IV族，II-V族和II-VI族晶体， 控制使得与多数单晶相比，原生双晶的体积百分比从约40％降低至约0.3％。 本实施例和其它实施例中堆垛层错的控制可以产生基本上没有缺陷的这些材料的单晶半导体，或者具有用于声子散射的具有孪晶晶体的改进的热电材料，同时保持电气完整性。 这些方法可以选择性地产生立方晶三面体外延半导体材料，其中立方体层基本上与下面的三角形材料直接对准或者60度旋转。

公开(公告)号：US08094306B2

公开(公告)日：2012-01-10

申请号：US12487735

申请日：2009-06-19

申请人： Yeonjoon Park ,  Glen C. King ,  James R. Elliott ,  Sang H. Choi

发明人： Yeonjoon Park ,  Glen C. King ,  James R. Elliott ,  Sang H. Choi

IPC分类号： G01J3/28

CPC分类号： G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0237 ,  G01J3/0256 ,  G02B5/005 ,  G02B5/1876

摘要： A spectrometer includes a micro-ring grating device having coaxially-aligned ring gratings for diffracting incident light onto a target focal point, a detection device for detecting light intensity, one or more actuators, and an adjustable aperture device defining a circular aperture. The aperture circumscribes a target focal point, and directs a light to the detection device. The aperture device is selectively adjustable using the actuators to select a portion of a frequency band for transmission to the detection device. A method of detecting intensity of a selected band of incident light includes directing incident light onto coaxially-aligned ring gratings of a micro-ring grating device, and diffracting the selected band onto a target focal point using the ring gratings. The method includes using an actuator to adjust an aperture device and pass a selected portion of the frequency band to a detection device for measuring the intensity of the selected portion.

摘要翻译： 光谱仪包括具有用于将入射光衍射到目标焦点的同轴对准环形光栅的微环格栅装置，用于检测光强度的检测装置，一个或多个致动器以及限定圆形孔径的可调节孔径装置。 光圈限定目标焦点，并将光引导到检测装置。 使用致动器可选择性地调节孔径装置，以选择频带的一部分以传输到检测装置。 检测入射光的所选频带的强度的方法包括将入射光引导到微环光栅装置的同轴对准的环形光栅上，并使用环形光栅将所选择的带衍射到目标焦点上。 该方法包括使用致动器来调节孔径装置并将频带的选定部分传递到用于测量所选部分的强度的检测装置。

公开(公告)号：US20100027746A1

公开(公告)日：2010-02-04

申请号：US12288380

申请日：2008-10-20

申请人： Yeonjoon PARK ,  Sang Hyouk Choi ,  Glen C. King ,  James R. Elliott ,  Albert L. Dimarcantonio

发明人： Yeonjoon PARK ,  Sang Hyouk Choi ,  Glen C. King ,  James R. Elliott ,  Albert L. Dimarcantonio

IPC分类号： G01N23/207 ,  G01N23/20

CPC分类号： G01N23/207

摘要： A new X-ray diffraction (XRD) method is provided to acquire XY mapping of the distribution of single crystals, poly-crystals, and twin defects across an entire wafer of rhombohedral super-hetero-epitaxial semiconductor material. In one embodiment, the method is performed with a point or line X-ray source with an X-ray incidence angle approximating a normal angle close to 90°, and in which the beam mask is preferably replaced with a crossed slit. While the wafer moves in the X and Y direction, a narrowly defined X-ray source illuminates the sample and the diffracted X-ray beam is monitored by the detector at a predefined angle. Preferably, the untilted, asymmetric scans are of {440} peaks, for twin defect characterization.

摘要翻译： 提供了一种新的X射线衍射（XRD）方法，以获得在整个菱面体超异质外延半导体材料晶圆上单晶，多晶和双缺陷分布的XY映射。 在一个实施例中，该方法用具有接近90°的法线角的X射线入射角的点或线X射线源进行，其中光束掩模优选地被交叉的狭缝代替。 当晶片在X和Y方向上移动时，狭窄定义的X射线源照射样品，并且由检测器以预定角度监测衍射的X射线束。 优选地，对于双缺陷表征，直到不对称扫描为{440}峰。

公开(公告)号：US20120200696A1

公开(公告)日：2012-08-09

申请号：US13020194

申请日：2011-02-03

申请人： Yeonjoon Park ,  Sang Hyouk Choi ,  Glen C. King ,  James R. Elliott ,  Albert L. Dimarcantonio

发明人： Yeonjoon Park ,  Sang Hyouk Choi ,  Glen C. King ,  James R. Elliott ,  Albert L. Dimarcantonio

IPC分类号： H04N7/18

CPC分类号： G01P5/26 ,  G01P5/00 ,  G01S1/14 ,  G01S17/95 ,  Y02A90/19

摘要： A lock-in imaging system is configured for detecting a disturbance in air. The system includes an airplane, an interferometer, and a telescopic imaging camera. The airplane includes a fuselage and a pair of wings. The airplane is configured for flight in air. The interferometer is operatively disposed on the airplane and configured for producing an interference pattern by splitting a beam of light into two beams along two paths and recombining the two beams at a junction point in a front flight path of the airplane during flight. The telescopic imaging camera is configured for capturing an image of the beams at the junction point. The telescopic imaging camera is configured for detecting the disturbance in air in an optical path, based on an index of refraction of the image, as detected at the junction point.

摘要翻译： 锁定成像系统被配置为检测空气中的干扰。 该系统包括飞机，干涉仪和伸缩成像相机。 飞机包括机身和一对机翼。 飞机配置为在空中飞行。 干涉仪可操作地设置在飞机上并且被配置用于通过沿着两条路径将光束分成两束而产生干涉图案，并且在飞行中在飞机的前飞行路径中的接合点处重新组合两个波束。 伸缩成像照相机被配置为在接合点捕获光束的图像。 所述伸缩成像照相机被配置为基于在所述连接点检测到的所述图像的折射率来检测光路中的空气中的干扰。

公开(公告)号：US08174695B2

公开(公告)日：2012-05-08

申请号：US12508018

申请日：2009-07-23

申请人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

发明人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

IPC分类号： G01J3/28

CPC分类号： G01J3/2823 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/18 ,  G01N21/6452 ,  G01N21/6454 ,  G01N21/648 ,  G01N2021/6421 ,  G01N2021/6478 ,  G02B5/188

摘要： A spectrometer system includes an array of micro-zone plates (MZP) each having coaxially-aligned ring gratings, a sample plate for supporting and illuminating a sample, and an array of photon detectors for measuring a spectral characteristic of the predetermined wavelength. The sample plate emits an evanescent wave in response to incident light, which excites molecules of the sample to thereby cause an emission of secondary photons. A method of detecting the intensity of a selected wavelength of incident light includes directing the incident light onto an array of MZP, diffracting a selected wavelength of the incident light onto a target focal point using the array of MZP, and detecting the intensity of the selected portion using an array of photon detectors. An electro-optic layer positioned adjacent to the array of MZP may be excited via an applied voltage to select the wavelength of the incident light.

摘要翻译： 光谱仪系统包括每个具有同轴对准的环形光栅的微区域阵列（MZP），用于支撑和照射样品的样品板，以及用于测量预定波长的光谱特性的光子检测器阵列。 样品板响应于入射光发射ev逝波，其激发样品的分子，从而引起次级光子的发射。 检测入射光的所选波长的强度的方法包括将入射光引导到MZP阵列上，使用MZP阵列将入射光的选定波长衍射到目标焦点，并检测所选择的 部分使用光子检测器阵列。 可以通过施加的电压激发邻近MZP阵列定位的电光层，以选择入射光的波长。

公开(公告)号：US08018815B2

公开(公告)日：2011-09-13

申请号：US12490747

申请日：2009-06-24

申请人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

发明人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

IPC分类号： G11B7/00

CPC分类号： G11B7/1353 ,  G11B7/1374 ,  G11B2007/0006 ,  G11B2007/13722

摘要： An embodiment generally relates to an optical device suitable for use with an optical medium for the storage and retrieval of data. The optical device includes an illumination means for providing a beam of optical radiation of wavelength λ and an optical path that the beam of optical radiation follows. The optical device also includes a diffractive optical element defined by a plurality of annular sections. The plurality of annular sections having a first material alternately disposed with a plurality of annular sections comprising a second material. The diffractive optical element generates a plurality of focal points and densely accumulated ray points with phase contrast phenomena and the optical medium is positioned at a selected focal point or ray point of the diffractive optical element.

摘要翻译： 实施例一般涉及适合与光学介质一起使用以用于存储和检索数据的光学装置。 该光学装置包括用于提供波长λ的光束的照射装置和光辐射束跟随的光路。 光学装置还包括由多个环形部分限定的衍射光学元件。 所述多个环形部分具有交替设置有包括第二材料的多个环形部分的第一材料。 衍射光学元件产生具有相位对比现象的多个焦点和密集累积的光点，并且光学介质位于衍射光学元件的选定焦点或射线点处。