Abstract:
A Schottky barrier tunnel transistor includes a gate electrode, and source and drain regions. The gate electrode is formed over a channel region of a substrate to form a Schottky junction with the substrate. The source and drain regions are formed in the substrate exposed on both sides of the gate electrode.
Abstract:
An ultra small-sized SOI MOSFET having a high integration density, low power consumption, but high performances, and a method of fabricating the same are provided. The method includes preparing a SOI substrate on which a monocrystalline silicon layer is formed, forming a first dielectric material layer doped with impurities of a first conductivity type on the SOI substrate, forming an opening to expose the monocrystalline silicon layer etching at least part of the first dielectric material layer, forming a channel region injecting impurities of a second conductivity type into the monocrystalline silicon layer exposed by the opening, forming a source region and a drain region in the monocrystalline silicon layer diffusing the impurities of the first dielectric material layer using heat treatment, forming a gate dielectric layer in the opening on the channel region, forming a gate electrode on the gate dielectric layer to fit in the opening, forming a second dielectric material layer on the entire surface of the SOI substrate on which the gate electrode is formed, forming contact holes to expose the gate electrode, the source region, and the drain region etching part of the second dielectric material layer, and forming metal interconnections to bury the contact holes.
Abstract:
A transistor in accordance with the invention comprises an ultra-thin Mo--C film functioning as a channel for an electron flow with two ends of the thin metal film functioning as source and drain terminals of the transistor, respectively; a piezoelectric film formed on the Mo--C film, for producing a force in accordance with an applied electric field provided by a gate voltage; and an electrode film formed on the piezoelectric film functioning as a gate of the transistor to which the gate voltage is applied to produce the applied electric field; and wherein a resistance of the Mo--C film between the source and drain terminals changes in accordance with the force produced in response to the applied gate voltage. This transistor can be used as an element of the three dimensional integrated circuit with a laminated structure.
Abstract:
Disclosed is the method of producing a piezo-device utilizing an ultra-thin Mo-C film as a piezoresistive material for a general class of improved piezo-device with the high sensitivity and the weak temperature dependence.
Abstract:
The prevent invention relates to an apparatus for receiving heterogeneous materials which is coupled to a hole part of a container in which a content such as liquid or the like is contained. The apparatus for receiving the heterogeneous materials includes a main body coupled and fixed to a hole part of a container and a receiving part having a storage space within the main body. In the inner storage space of the receiving part, a foldable connection part is disposed in an upper portion of the storage space and an opening part formed below the foldable connection part breaks a receiving part sealing part sealing a lower end of the receiving part to allow a content within the storage space of the receiving part to drop down into the container, thereby mixing the heterogeneous materials. Here, a foldable soft resin may be added to the foldable connection part.
Abstract:
A container for liquid, which discharges contents when the side surfaces thereof are pressed by the fingers. A coupling unit is assembled to the top of the container body so as to discharge the pressed contents. The coupling unit has an outlet comprising a check valve which opens/shuts by means of predetermined pressure. The coupling unit having the outlet is covered with a lid for protecting the outlet. The side surfaces of the container body have pressure adjustment surfaces that protrude inwardly. Predetermined gaps are maintained between the ends of the pressure adjustment surfaces and the side surfaces of the container body, located in front of the ends of the pressure adjustment surfaces.
Abstract:
Disclosed is a connection device to be coupled with a container neck in different standards for use. The connection device is formed with a mouth part at the upper side and a screw thread part at the lower side. The mouth part at the upper portion of the connection device is formed in a screw thread or other shape in the standard corresponding to a bottle lid, and the inside of the screw thread part is formed with a screw thread corresponding to the standard of the container neck. The screw thread is integrally formed or an elastic screw thread is additionally added for the coupling with the necks of a plurality of containers.
Abstract:
The present invention involves a method and apparatus for canceling the effects of magnetic field noise in a torque sensor by placing three sets of magnetic field sensors around a shaft, the first set of field sensors being placed in the central region of the shaft and the second and third sets of field sensors being placed on the right side and left side of the field sensors placed at the central region, respectively. A torque-induced magnetic field is not cancelled with this arrangement of field sensors but a magnetic near field from a near field source is cancelled.
Abstract:
A Schottky barrier tunnel transistor includes a gate electrode, and source and drain regions. The gate electrode is formed over a channel region of a substrate to form a Schottky junction with the substrate. The source and drain regions are formed in the substrate exposed on both sides of the gate electrode.
Abstract:
Provided is a method for fabricating a Schottky barrier tunnel transistor (SBTT) that can fundamentally prevent the generation of a gate leakage current caused by damage of spacers formed on both sidewalls of a gate electrode. The method for fabricating a Schottky barrier tunnel transistor, which includes: a) forming a silicon pattern and a sacrificial pattern on a buried oxide layer supported by a support substrate; b) forming a source/drain region on the buried oxide layer exposed on both sides of the silicon pattern, the source/drain region being formed of a metal layer and being in contact with both sidewalls of the silicon pattern; c) removing the sacrificial pattern to expose the top surface of the silicon pattern; and d) forming a gate insulating layer and a gate electrode on the exposed silicon pattern.