摘要:
Provided are a reference current generating method and a current reference circuit. The reference current generating method includes generating a first current using a NMOS transistor and a second current using a PMOS transistor, calculating a current difference between the first and second currents, generating a third current which has a similar current/temperature slope as the second current by multiplying the current difference by a proportional constant, and generating a reference current by subtracting the third current from the second current.
摘要:
A semiconductor memory device for reducing ripple noise of a back-bias voltage, and a method of driving the semiconductor memory device include a word line driving circuit and a delay logic circuit. The word line driving circuit enables a sub-word line connected to a selected memory cell to a first voltage, and disables the sub-word line of a non-selected memory cell to a second voltage and a third voltage, in response to a sub-word line enable signal, a first word line driving signal, and a second word line driving signal. The delay logic circuit controls the semiconductor memory device so that an amount of charge of the sub-word line that is introduced to the third voltage is greater than an amount of charge of the sub-word line that is introduced to the second voltage by changing a transition point of time of the sub-word line enable signal with respect to a transition point of time of the first word line driving signal, during the disabling of the sub-word line.
摘要:
A memory device comprising: at least one bank of memory cells that receives a first clock for clocking commands and a second clock for clocking data, wherein the second clock is activated based on a first command and deactivated based on a second command. The memory device further including a clock activation circuit configured to generate an enable signal based on the first command and a disable signal based on the second command, and a clock generator configured to generate the second clock based on a reference clock upon receipt of the enable signal.
摘要:
Provided is a semiconductor memory device and method that can control internal supply voltages independently. The semiconductor memory device includes a memory cell array, a reference voltage generating unit, an internal reference voltage generating unit, and an internal supply voltage generating unit. The reference voltage generating unit outputs a reference voltage in response to an external voltage. The internal reference voltage generating unit converts the reference voltage into a plurality of internal reference voltages, and outputs the plurality of internal reference voltages. The internal supply voltage generating unit converts the plurality of internal reference voltages into a plurality of internal supply voltages, and outputs the plurality of internal supply voltages. A first internal reference voltage is used to generate a first internal supply voltage and a second internal reference voltage is used to generate a second internal supply voltage.
摘要:
Devices, circuits and methods for dual voltage generation using a single charge pump. The dual voltages can be the same or different, as they are for two different components of a device. An oscillator generates an oscillating signal, and a charge pump generates a pumping voltage at a pumping node responsive to the oscillating signal. A first switching circuit is coupled to the pumping node, and outputs from the pumping voltage a first voltage to the first component. A second switching circuit is coupled to the pumping node, and outputs from the pumping voltage a second voltage to the second component. The first and second output voltages may optionally be sensed. The oscillator may be triggered and the first and second switching circuits may be controlled as needed to maintain the sensed first and second voltages at desired values and/or ranges.
摘要:
Provided is a semiconductor memory device and method that can control internal supply voltages independently. The semiconductor memory device includes a memory cell array, a reference voltage generating unit, an internal reference voltage generating unit, and an internal supply voltage generating unit. The reference voltage generating unit outputs a reference voltage in response to an external voltage. The internal reference voltage generating unit converts the reference voltage into a plurality of internal reference voltages, and outputs the plurality of internal reference voltages. The internal supply voltage generating unit converts the plurality of internal reference voltages into a plurality of internal supply voltages, and outputs the plurality of internal supply voltages. A first internal reference voltage is used to generate a first internal supply voltage and a second internal reference voltage is used to generate a second internal supply voltage.
摘要:
A semiconductor memory device having a circuit precharging a data line comprises a first precharge circuit, which precharges a first data line pair to a first voltage level in a precharge operation state, and a second precharge circuit, which precharges a second data line pair to a second voltage level in a precharge operation state. The semiconductor memory device comprises a data input driver, which receives data and drives the data to the first data line pair, a switch, which in response to a selection signal, connects or disconnects the first data line pair with the second data line pair, and a charge-sharing control circuit, which in response to the selection signal makes one line of the first data line pair and one line of the second data line pair share charge. The semiconductor memory device reduces current consumption over repeated write/precharge operations.
摘要:
A memory device comprising: at least one bank of memory cells that receives a first clock for clocking commands and a second clock for clocking data, wherein the second clock is activated based on a first command and deactivated based on a second command. The memory device further including a clock activation circuit configured to generate an enable signal based on the first command and a disable signal based on the second command, and a clock generator configured to generate the second clock based on a reference clock upon receipt of the enable signal.
摘要:
A semiconductor memory device for reducing ripple noise of a back-bias voltage, and a method of driving the semiconductor memory device include a word line driving circuit and a delay logic circuit. The word line driving circuit enables a sub-word line connected to a selected memory cell to a first voltage, and disables the sub-word line of a non-selected memory cell to a second voltage and a third voltage, in response to a sub-word line enable signal, a first word line driving signal, and a second word line driving signal. The delay logic circuit controls the semiconductor memory device so that an amount of charge of the sub-word line that is introduced to the third voltage is greater than an amount of charge of the sub-word line that is introduced to the second voltage by changing a transition point of time of the sub-word line enable signal with respect to a transition point of time of the first word line driving signal, during the disabling of the sub-word line.
摘要:
Provided is a semiconductor device for performing charge pumping. The semiconductor device may include a first pumping unit, a second pumping unit, and a controller. The first pumping unit may be configured to output a boosted voltage via an output node by using a first input signal and the initial voltage, where the boosted voltage is greater than an initial voltage. The second pumping unit may be configured to output the boosted voltage via the output node by using a second input signal and the initial voltage. The controller may be configured to control the first and second pumping units. Each of the first and second pumping units may include an initialization unit, a boosting unit, and a transmission unit. The initialization unit may be configured to control a voltage of a boosting node to be equal to the initial voltage during an initialization operation. The boosting unit may be configured to boost the voltage of the boosting node based on the first and second input signals. Also, the transmission unit may be configured to control output of the boosted voltage.