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11.
公开(公告)号:US20240257880A1
公开(公告)日:2024-08-01
申请号:US18104228
申请日:2023-01-31
Applicant: Silicon Storage Technology, Inc.
Inventor: Louisa Schneider , Xian Liu , Steven Lemke , Parviz Ghazavi , Jinho Kim , Henry A. Om'Mani , Hieu Van Tran , Nhan Do
IPC: G11C16/16 , H01L23/48 , H01L29/423 , H10B41/10 , H10B41/27
CPC classification number: G11C16/16 , H01L23/481 , H01L29/42328 , H10B41/10 , H10B41/27
Abstract: A memory cell array having rows and columns of memory cells with respective ones of the memory cells including spaced apart source and drain regions formed in a semiconductor substrate with a channel region extending there between, a floating gate over a first portion of the channel region, a select gate over a second portion of the channel region, and an erase gate over the source region. A strap region is disposed between first and second pluralities of the columns. For one memory cell row, a dummy floating gate is disposed in the strap region, an erase gate line electrically connects together the erase gates of the memory cells in the one row and in the first plurality of columns, wherein the erase gate line is aligned with the dummy floating gate with a row direction gap between the erase gate line and the dummy floating gate.
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12.
公开(公告)号:US11798619B2
公开(公告)日:2023-10-24
申请号:US17857113
申请日:2022-07-04
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Vipin Tiwari , Nhan Do
CPC classification number: G11C11/54 , G06N3/065 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/16 , G11C16/3418 , G11C2216/04
Abstract: Numerous examples for performing tuning of a page or a word of non-volatile memory cells in an analog neural memory are disclosed. In one example, a method comprises programming a word or page of non-volatile memory cells in an analog neural memory system; and identifying any fast bits in the word or page of non-volatile memory cells.
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13.
公开(公告)号:US11783904B2
公开(公告)日:2023-10-10
申请号:US17839294
申请日:2022-06-13
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Nha Nguyen , Vipin Tiwari , Nhan Do
CPC classification number: G11C16/3459 , G06F3/0688 , G06N3/063 , G06N3/08 , G11C16/10 , G11C16/26 , G11C16/3436 , G11C29/10
Abstract: In one example, a method is disclosed of compensating for leakage in an array of analog neural non-volatile memory cells, wherein the array is arranged in rows and columns, wherein each row is coupled to a word line and each column is coupled to a bitline, the method comprising measuring leakage for a column of analog neural non-volatile memory cells coupled to a bitline; storing the measured leakage value; and applying the measured leakage value during a read operation of the column of analog neural non-volatile memory cells to compensate for the leakage.
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14.
公开(公告)号:US11683933B2
公开(公告)日:2023-06-20
申请号:US17121555
申请日:2020-12-14
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: H01L27/11531 , G06N3/08 , G11C16/04 , H01L29/788
CPC classification number: H01L27/11531 , G06N3/08 , G11C16/0425 , H01L29/7883
Abstract: Numerous embodiments for reading a value stored in a selected memory cell in a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. In one embodiment, an input comprises a set of input bits that result in a series of input pulses applied to a terminal of the selected memory cell, further resulting in a series of output signals that are summed to determine the value stored in the selected memory cell. In another embodiment, an input comprises a set of input bits, where each input bit results in a single pulse or no pulse being applied to a terminal of the selected memory cell, further resulting in a series of output signals which are then weighted according to the binary bit location of the input bit, and where the weighted signals are then summed to determine the value stored in the selected memory cell.
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公开(公告)号:US20210020255A1
公开(公告)日:2021-01-21
申请号:US16569611
申请日:2019-09-12
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Nha Nguyen , Vipin Tiwari , Nhan Do
Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. The analog neural memory comprises one or more arrays of non-volatile memory cells. The testing circuitry and methods can be utilized during sort tests, qualification tests, and other tests to verify programming operations of one or more cells.
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公开(公告)号:US20210019608A1
公开(公告)日:2021-01-21
申请号:US16569647
申请日:2019-09-12
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stephen Trinh , Stanley Hong , Anh Ly , Steven Lemke , Nha Nguyen , Vipin Tiwari , Nhan Do
Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. The analog neural memory comprises one or more arrays of non-volatile memory cells. The testing circuitry and methods can be utilized during sort tests, qualification tests, and other tests to verify programming operations of one or more cells.
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公开(公告)号:US20200242453A1
公开(公告)日:2020-07-30
申请号:US16382051
申请日:2019-04-11
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G06N3/063 , H01L27/115
Abstract: A neural network device with synapses having memory cells each having source and drain regions in a semiconductor substrate with a channel region extending there between, a floating gate over an entirety of the channel region, and a first gate over the floating gate. First lines each electrically connect together the first gates in one of the memory cell rows, second lines each electrically connect together the source regions in one of the memory cell rows, and third lines each electrically connect together the drain regions in one of the memory cell columns. The synapses are configured to receive a first plurality of inputs as electrical voltages on the first lines or on the second lines, and to provide a first plurality of outputs as electrical currents on the third lines.
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公开(公告)号:US20200234758A1
公开(公告)日:2020-07-23
申请号:US16382045
申请日:2019-04-11
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G11C11/54 , H01L27/11521 , H01L29/423 , H01L29/788 , G06N3/04 , G11C16/10 , G11C16/14 , G11C16/04
Abstract: A neural network device with synapses having memory cells each having a floating gate and a first gate over first and second portions of a channel region disposed between source and drain regions, and a second gate over the floating gate or the source region. First lines each electrically connect the first gates in one of the memory cell rows, second lines each electrically connect the second gates in one of the memory cell rows, third lines each electrically connect the source regions in one of the memory cell columns, and fourth lines each electrically connect the drain regions in one of the memory cell columns. The synapses receive a first plurality of inputs as electrical voltages on the first or second lines, and provide a first plurality of outputs as electrical currents on the third or fourth lines.
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19.
公开(公告)号:US20200119028A1
公开(公告)日:2020-04-16
申请号:US16231231
申请日:2018-12-21
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: H01L27/11531 , H01L29/788 , G11C16/04 , G06N3/08
Abstract: Numerous embodiments of a precision tuning algorithm and apparatus are disclosed for precisely and quickly depositing the correct amount of charge on the floating gate of a non-volatile memory cell within a vector-by-matrix multiplication (VMM) array in an artificial neural network. Selected cells thereby can be programmed with extreme precision to hold one of N different values.
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公开(公告)号:US10276236B2
公开(公告)日:2019-04-30
申请号:US15597709
申请日:2017-05-17
Inventor: Santosh Hariharan , Hieu Van Tran , Feng Zhou , Xian Liu , Steven Lemke , Nhan Do , Zhixian Chen , Xinpeng Wang
Abstract: A memory device includes a metal oxide material disposed between and in electrical contact with first and second conductive electrodes, and an electrical current source configured to apply one or more electrical current pulses through the metal oxide material. For each of the one or more electrical current pulses, an amplitude of the electrical current increases over time during the electrical current pulse to form a conductive filament in metal oxide material.
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