摘要:
Example embodiments provide a semiconductor device and a method of forming the same. According to the method, a capping insulation pattern may be formed to cover the top surface of a filling insulation pattern in a trench. The capping insulation pattern may have an etch selectivity according to the filling insulation pattern. As a result, the likelihood that the filling insulation layer may be etched by various cleaning processes and the process removing the buffer insulation pattern may be reduced or prevented.
摘要:
There are provided an organic light emitting diode (OLED) display driving apparatus and a driving method thereof, in which the OLED display panel driving apparatus of a passive matrix type is configured such that its scan driving circuit has 3-state output, and the cathode lines, selected when the scan driving circuit performs a scan operation, maintain grounding, and after data-applied OLED emits light, are switched in a high voltage, and execute a refresh operation to initialize the pixel charges, and with the high impedance state maintained, non-selective common cathode lines turn into a high impedance state so as to remove the parasitic capacitance elements, and reduce the capacitance element functioning as the load of the data driving circuit connected to the OLED anode lines, and without the use of precharge method of maintaining the anode lines above a predetermined voltage quickly by using a voltage source, and applying data by using a current source, the anode lines can be charged within a short time just by necessary current for the lightening of the OLED so as to reduce the power consumption of the data driving circuit, and increase the operation speed.
摘要:
A method of fabricating a semiconductor integrated circuit device, including providing a semiconductor substrate, sequentially forming an etching target layer and a hard mask layer on the semiconductor substrate, forming first etch masks on the hard mask layer, the first etch masks including a plurality of first line patterns spaced apart from one another at a first pitch and extending in a first direction, forming first hard mask patterns by etching the hard mask layer using the first etch masks, forming second etch masks on the first hard mask patterns, the second etch masks including a plurality of second line patterns spaced apart from one another at a second pitch and extending in a second direction different from the first direction, forming second hard mask patterns by etching the first hard mask patterns using the second etch masks, forming spacers on sidewalls of the second hard mask patterns, and patterning the etching target layer using the second hard mask patterns having the spacers.
摘要:
Disclosed is a gate shift register, which can perform a bi-directional shift operation with a reduced number of switching devices. The gate shift register includes a plurality of stages to receive a plurality of gate shift clocks and sequentially output a scan pulse. A kth stage includes a scan direction controller including first and second forward TFTs and first and second reverse TFTs to convert a scan direction in response to carry signals of previous stages input through first and second input terminals and carry signals of next stages input through third and fourth input terminals, a node controller including first to eighteenth TFTs to control charging and discharge operations of Q1, Q2, QB1 and QB2 nodes, and an output unit including first and second pull-up TFTs and first to fourth pull-down TFTs to output two scan pulses based on voltage levels of the Q1, Q2, QB1 and QB2 nodes.
摘要:
Devices and methods of fabricating a conductive pattern of such devices comprise a non-single crystalline semiconductor pattern formed on a single crystalline semiconductor substrate, an insulating spacer formed on a sidewall of the non-single crystalline semiconductor pattern, the non-single crystalline semiconductor pattern selectively recessed using a cyclic selective epitaxial growth (SEG) process, and a silicide layer formed on the recessed non-single crystalline semiconductor pattern.
摘要:
A method of forming a via contact structure using a dual damascene process is disclosed. According to one embodiment a sacrificial layer is formed on an insulating interlayer during the formation of a preliminary via hole. The sacrificial layer has the same composition as a layer filling the preliminary via hole in a subsequent trench formation process. The sacrificial layer and the layer filling the preliminary via hole are simultaneously removed after the trench formation process is carried out. According to another embodiment, a thin capping oxide layer is formed on an insulating interlayer during the formation of a preliminary via hole. The thin capping oxide layer is removed together with a sacrificial layer after a trench formation process is carried out.
摘要:
A semiconductor wafer processing apparatus may include a chuck and/or a focus ring. The chuck may be configured to hold a wafer. The focus ring may be disposed surrounding a rim of the chuck. The focus ring may include a first section formed of a first material and a second section formed of a second material. The first material and the second material may have different conductivities. A method of forming a semiconductor wafer processing apparatus may include forming a first section of a focus ring from a first material, forming a second section of the focus ring from a second material having a different conductivity than the first material, combining the first and second sections to form a focus ring, and/or arranging the focus ring so as to surround a chuck.
摘要:
The present invention discloses a method of fabricating interconnection lines for a semiconductor device. The method includes forming an interlayer insulating layer on a semiconductor substrate. A via hole is formed through the interlayer insulating layer. A via filling material is formed to fill the via hole. A photoresist pattern is formed on the via filling material. The via filling material and the interlayer insulating layer are anisotropically etched using the photoresist pattern as an etch mask to form a trench. A residual portion of the via filling material is removed using two wet etch processes. After removing the residual portion of the via filling material, a conductive layer pattern is formed in the via hole and the trench.
摘要:
Provided are a semiconductor device including a reliable interconnect and a method of manufacturing the same. The semiconductor device includes a substrate, an inter-metal dielectric (IMD) pattern having an opening, an amorphous metallic nitride layer formed on the inner surface of the opening, a diffusion barrier layer formed on the amorphous metallic nitride layer, and a conductive layer filled into the opening having the diffusion barrier layer.
摘要:
An integrated circuit device is manufactured by forming a pattern on a substrate. The pattern may include two or more mesa regions. The pattern and the substrate are coated with a spin on glass layer and then the spin on glass layer is dissolved so that the spin on glass layer is recessed from upper surfaces of the mesa regions opposite the substrate. Before dissolving the spin on glass layer, a thermal treatment may be applied to remove a solvent from the spin on glass layer.