摘要:
An internal address generating circuit sequentially generates internal addresses in the burst read operation, with an external address being set as an initial value. A memory core has plural memory cells and sequentially outputs, in response to activation of a column selection signal, data read from the memory cells corresponding to the internal addresses in the burst read operation. In the burst read operation, a column control circuit in a memory core control circuit repeats activation of the column selection signal for a certain period during an activation period of an external control signal and forcibly deactivates the column selection signal in synchronization with deactivation of the external control signal. In the burst read operation, an operation state control circuit in the memory core control circuit deactivates an operation state control signal after a predetermined time has elapsed from the deactivation of the external control signal.
摘要:
A semiconductor device receiving a stable external power voltage includes a reduced-voltage-generation circuit which generates an internally reduced power voltage, an input circuit which operates based on the internally reduced power voltage, causing the internally reduced power voltage to fluctuate, a clock-control circuit which generates an internal clock signal, an output circuit which outputs a data signal to an exterior of the device at output timings responsive to the internal clock signal, a clock-delivery circuit which conveys the internal clock signal from the clock-control circuit to the output circuit, and operates based on the external power voltage such as to make the output timings substantially unaffected by fluctuation of the internally reduced power voltage.
摘要:
A semiconductor storage device includes an external terminal to which a first signal is supplied, a core circuit, and an access operation control circuit that generates a signal indicating an access operation mode to the core circuit for subsequent cycles based on a pulse width of the first signal.
摘要:
A semiconductor memory device includes memory blocks, a main word decoder to set a main word line to a first potential for activation, a second potential, or a third potential, a circuit to generate a cyclic signal that indicates timing at intervals, a block selecting circuit to select a memory block to be accessed, a successive-selection circuit to select the memory blocks one after another, and a circuit configured to control the main word decoder such that unselected ones of the main word lines of a memory block selected by the block selecting circuit are set to the third potential, such that the main word lines of the selected memory block are maintained at the third potential after access, and such that the main word lines of a memory block selected by the successive-selection circuit are set to the second potential at the timing indicated by the cyclic signal.
摘要:
A magnetic recording disk having a substrate, a magnetic layer formed on the substrate, a protective layer formed on the magnetic layer and a lubricant layer formed on the protective layer, the lubricant layer containing a perfluoropolyether compound having an end moiety containing a phosphazene ring and a perfluoropolyether compound having an end moiety containing a hydroxyl group, or the lubricant layer containing a perfluoropolyether compound having an end moiety containing a hydroxyl group on the protective layer side and a perfluoropolyether compound having an end moiety containing a phosphazene ring on the other surface side, and a process for manufacturing each of these magnetic recording disks.
摘要:
A semiconductor storage device comprises a timing control circuit that generates a signal for controlling at least one of a read operation and a write operation; an input-signal pad; a plurality of control-signal pads; and a switch circuit coupled to at least one of the plurality of control-signal pads. The switch circuit generates a first control signal to be supplied to the timing control circuit based on a signal from the input-signal pad in a first mode.
摘要:
A semiconductor storage device includes an external terminal to which a first signal is supplied, a core circuit, and an access operation control circuit that generates a signal indicating an access operation mode to the core circuit for subsequent cycles based on a pulse width of the first signal.
摘要:
A semiconductor memory device, in which a burst operation is performed using a memory core, has a read/write trigger signal generating circuit and a read/write signal generating circuit. The read/write trigger signal generating circuit generates a read/write signal request from a predetermined timing signal during the burst operation. The read/write signal generating circuit receives an output signal from the read/write trigger signal generating circuit and outputs a read/write signal after a core operation just prior to receipt of the output signal is complete and the subsequent activation of a row side is complete.
摘要:
A semiconductor integrated circuit device includes a clock buffer circuit receiving a clock signal, a data buffer circuit receiving a data signal, an output circuit outputting the data signal from the data buffer circuit in accordance with the clock signal from the clock buffer circuit, and an adjustment circuit adjusting timings of the clock signal and the data signals.
摘要:
Each sub word line is coupled to a gate of a transfer transistor of a memory cell. A first switch of a sub word decoder couples the sub word line to a high level voltage line when a main word line is in an activation level. A second switch couples the sub word line to a low level voltage line when the main word line is in an inactivation level. A third switch couples the sub word line to the low level voltage line when a word reset signal line is in an activation level. A reset control circuit disables the inactivation of the main word line or the activation of the word reset signal line during a test mode. One of the second and third switches is forcibly turned off, and thereby, an operation failure of a sub word decoder can be detected easily.