摘要:
Described herein are techniques for determining a board parasitic capacitance of a crystal oscillator circuit. A crystal's frequency is measured under load condition off-circuit. After coupling the crystal to the oscillator circuit, external capacitors may be adjusted to produce frequencies approximating the off-circuit measurement with upper and lower margins. Calculation of the load capacitor values at the exact frequency measured off-circuit allows for derivation of the board parasitic capacitance by subtracting the calculated capacitor values from the original total load value used in the off-circuit measurement.
摘要:
Apparatus and methods are disclosed for evaluating degradation of a transistor in a cross coupled pair of an RF oscillator independently. A MOS device can be coupled between a separated center-tap inductor. By appropriately sizing the MOS device and turning the MOS device on during operation of RF oscillator, a good contact can again be made that allows the oscillator to operate at design performance. By turning the MOS device off, the supplies can be separates such that I-V characteristics of both transistors of the cross-coupled pair may be obtained.
摘要:
Techniques for determining a frequency profile of a quartz crystal in real time. Quartz crystals are subjected to a series of temperature cycles at various temperature rates and the crystal frequencies, crystal temperature parameters, and the temperature rates are monitored as the crystal is subjected to the temperature cycles. The monitored frequencies are grouped correlated with the monitored temperature parameters and temperature rates. A system for determining the frequency of a quartz crystal includes a processor adapted to perform the frequency profiling techniques.
摘要:
The effects of electromigration have been shown to lead to damage of metal electrodes of electronic devices such as thin film resonator (TFR) devices in only a few hours, for a test input power that is within the operational range of these devices. It has been determined that this failure is sensitive to the frequency of the input power. The present invention provides a method and apparatus for determining high power reliability in electronic devices, so as to enable an accurate determination of the failure time of the electronic device, and hence projected lifetime. This determination is independent from the frequency of an input power applied to the electronic device as part of the method for testing the device. Based on the above results, a TFR device has been developed, which includes a protective or electromigration-reducing layer such as titanium being deposited atop an electrode of the device. The TFR device with the modified electrode structure can operate at higher power levels and has a longer operational lifetime than what is currently available.
摘要:
A method for determining a resonant frequency of a mechanical device having a first mass and at least one second mass mechanically coupled to the first mass comprises the steps of: providing a control signal to a voltage-controlled oscillator (VCO) to control the frequency of an output thereof; translating a phase shifted output of the VCO into an oscillatory force which is applied to one of the first and second masses to cause the mechanical device to respond; measuring the response of the mechanical device and generating a response signal representative thereof in frequency and amplitude; generating an error signal proportional to the phase difference between a signal representative of the output of the VCO and the measured response signal; adjusting the control signal to cause the oscillatory force applied to the one mass to sweep within a calculated frequency range rendering the amplitude of the response signal to approach and exceed a calculated threshold value; and when the calculated threshold is exceeded by the amplitude of the response signal, finely adjusting the control signal to the VCO until the value of the measured error signal is equal substantially to a calculated final error value, whereupon the frequency of the response signal is the resonant frequency of the mechanical device.
摘要:
A filter is composed of plural resonators formed on one surface of a dielectric substrate and a ground plane formed on the other surface. A resonant frequency of each resonator is accurately measured individually and independently from other resonators. Other resonators not selected for measurement are all short-circuited or covered with a conductive member to shift their resonant frequency to a region that does not interfere with the resonant frequency of the resonator under measurement. Also, a coupling coefficient of an arbitrary pair of resonators is accurately measured under no interference from other resonators in the similar manner.
摘要:
A digital device for testing and calibrating the oscillation frequency of an integrated oscillator, integrated in an integrated circuit of a type that includes at least one storage and control section, a plurality of connection pins connected bidirectionally to the storage and control section, and an external generator delivering a reference signal of known duration to at least a first digital input pin of the plurality of connection pins. The testing and calibrating device has as input at least first and second control parameters corresponding to limiting values of a predetermined range of values of the oscillation frequency sought for the integrated oscillator circuit, and it includes a circuit for comparing the signal of known duration and the signal from the integrated oscillator circuit; a circuit connected to the compare means, for generating calibration values for the signal from the integrated oscillator circuit; and a circuit for forcing storage of final calibration values of the signal from the integrated oscillator circuit into the storage and control section.
摘要:
An embodiment of the present invention includes the use of a single connection to measure the resonance frequency of main cells or side cells of a resonant structure, such as a linear accelerator cavity structure. Only one antenna is require to perform both the tasks of exciting a cavity structure and picking up the resonant frequency signal. According to an embodiment of the present invention, a first antenna probe is inserted into the main cells of a linear accelerator cavity structure. The first antenna probe includes an antenna window which may be positioned approximately in the center of a main cell adjacent to a target side cell in order to measure the resonance frequency of a target side cell. All non-target side cells adjacent to the main cell aligned with the window antenna are then shorted. For example, the non-target cells may be shorted by metal surrounding the first antenna probe at locations other than the antenna window. A signal is sent and a resonance frequency is noted. In order to measure the resonance frequency of a target main cell according to an embodiment of the present invention, a second antenna probe is inserted into a side cell adjacent to the target main cell. The main cells adjacent to the target main cell are then shorted and side cells adjacent to the target main cell are also shorted. A signal is sent and the resonance frequency of the target main cell is then measured.
摘要:
The present invention discloses a method for obtaining frequency parameters to determine the resonator inductances of a crystal. Under this method, a plurality of frequencies are applied to a first electrode. This application is performed once while the second electrode and the common electrode are connected by a short circuit, and then again when the second electrode and the common electrode are capactively connected or open circuited. During each application of the plurality of frequencies to the crystal, the phase response for the output of the resonator circuit is monitored. Then the time response of the crystal is determined. Next, the time delay relative maxima for the time response is determined. Finally, the frequencies at which the time delay relative maxima occur are determined. These frequencies correspond to the inflection points where the change in phase goes from monotonically increasing to monotonically decreasing. This process is repeated with the crystal turned around in the test fixture to obtain a second set of frequencies. These frequencies are then used to calculate the resonator inductances of the crystal. Alternatively, all of the critical frequencies can be determined with the second electrode and the common electrode connected by a short circuit. In this case, however, the critical frequencies correspond to the time delay maxima and minima for the time response. This method is applicable regardless of the frequencies of the resonators or the amount of frequency separation between the resonators.
摘要:
A method and apparatus for measuring the settling time of frequency changes in a voltage controlled oscillator (VCO) are disclosed. A signal splitter is responsive to the VCO for splitting the output signal between first and second channels. A delay circuit in one of the channels introduces a delay and corresponding phase shift of one signal relative to the other, and a phase detector produces a phase signal proportional to the phase shift indicative of the settling time of the VCO. A control circuit coupled to the phase detector and the VCO produces a step voltage initiating signal for changing the VCO output frequency. A detector responsive to the initiating signal and the phase signal produces an output indicative of the settling time with respect to the control signal in the modulation domain.