Calculating A Parasitic Capacitance of an Oscillator Circuit
    11.
    发明申请
    Calculating A Parasitic Capacitance of an Oscillator Circuit 有权
    计算振荡电路的寄生电容

    公开(公告)号:US20110156725A1

    公开(公告)日:2011-06-30

    申请号:US12649590

    申请日:2009-12-30

    IPC分类号: G01R27/26

    CPC分类号: G01R31/2824

    摘要: Described herein are techniques for determining a board parasitic capacitance of a crystal oscillator circuit. A crystal's frequency is measured under load condition off-circuit. After coupling the crystal to the oscillator circuit, external capacitors may be adjusted to produce frequencies approximating the off-circuit measurement with upper and lower margins. Calculation of the load capacitor values at the exact frequency measured off-circuit allows for derivation of the board parasitic capacitance by subtracting the calculated capacitor values from the original total load value used in the off-circuit measurement.

    摘要翻译: 这里描述了用于确定晶体振荡器电路的板寄生电容的技术。 晶体的频率是在负载条件下测量的。 在将晶体耦合到振荡器电路之后,可以调整外部电容器以产生接近具有上部和下部边缘的非线性测量的频率。 在测得的非正常频率下的精确频率下的负载电容值的计算允许通过从在电路测量中使用的原始总负载值减去计算的电容值来推导电路板的寄生电容。

    METHOD AND APPARATUS FOR EVALUATING THE EFFECTS OF STRESS ON AN RF OSCILLATOR
    12.
    发明申请
    METHOD AND APPARATUS FOR EVALUATING THE EFFECTS OF STRESS ON AN RF OSCILLATOR 有权
    用于评估应力在RF振荡器上的影响的方法和装置

    公开(公告)号:US20100164533A1

    公开(公告)日:2010-07-01

    申请号:US12352795

    申请日:2009-01-13

    IPC分类号: G01R27/26 G01R31/26

    CPC分类号: G01R31/2617 G01R31/2824

    摘要: Apparatus and methods are disclosed for evaluating degradation of a transistor in a cross coupled pair of an RF oscillator independently. A MOS device can be coupled between a separated center-tap inductor. By appropriately sizing the MOS device and turning the MOS device on during operation of RF oscillator, a good contact can again be made that allows the oscillator to operate at design performance. By turning the MOS device off, the supplies can be separates such that I-V characteristics of both transistors of the cross-coupled pair may be obtained.

    摘要翻译: 公开了用于评估RF振荡器的交叉耦合对中的晶体管的劣化的装置和方法。 MOS器件可以耦合在分离的中心抽头电感器之间。 通过在RF振荡器工作期间适当调整MOS器件并使MOS器件导通,可以再次进行良好的接触,使得振荡器能够以设计性能工作。 通过关闭MOS器件,可以分离电源,使得可以获得交叉耦合对的两个晶体管的I-V特性。

    FREQUENCY CHARACTERIZATION OF QUARTZ CRYSTALS
    13.
    发明申请
    FREQUENCY CHARACTERIZATION OF QUARTZ CRYSTALS 有权
    QUARTZ晶体的频率特性

    公开(公告)号:US20050146244A1

    公开(公告)日:2005-07-07

    申请号:US10707723

    申请日:2004-01-07

    摘要: Techniques for determining a frequency profile of a quartz crystal in real time. Quartz crystals are subjected to a series of temperature cycles at various temperature rates and the crystal frequencies, crystal temperature parameters, and the temperature rates are monitored as the crystal is subjected to the temperature cycles. The monitored frequencies are grouped correlated with the monitored temperature parameters and temperature rates. A system for determining the frequency of a quartz crystal includes a processor adapted to perform the frequency profiling techniques.

    摘要翻译: 实时测定石英晶体频率分布的技术。 石英晶体在各种温度下进行一系列温度循环,并且晶体经受温度循环后,晶体频率,晶体温度参数和温度速率都被监测。 监测的频率与监测的温度参数和温度变化相关。 用于确定石英晶体的频率的系统包括适于执行频率分析技术的处理器。

    Method and apparatus for determining and/or improving high power reliability in thin film resonator devices, and a thin film resonator device resultant therefrom
    14.
    发明授权
    Method and apparatus for determining and/or improving high power reliability in thin film resonator devices, and a thin film resonator device resultant therefrom 有权
    用于确定和/或改善薄膜谐振器装置中的高功率可靠性的方法和装置,以及由此产生的薄膜谐振器装置

    公开(公告)号:US06674291B1

    公开(公告)日:2004-01-06

    申请号:US09669681

    申请日:2000-09-26

    IPC分类号: G01R2702

    摘要: The effects of electromigration have been shown to lead to damage of metal electrodes of electronic devices such as thin film resonator (TFR) devices in only a few hours, for a test input power that is within the operational range of these devices. It has been determined that this failure is sensitive to the frequency of the input power. The present invention provides a method and apparatus for determining high power reliability in electronic devices, so as to enable an accurate determination of the failure time of the electronic device, and hence projected lifetime. This determination is independent from the frequency of an input power applied to the electronic device as part of the method for testing the device. Based on the above results, a TFR device has been developed, which includes a protective or electromigration-reducing layer such as titanium being deposited atop an electrode of the device. The TFR device with the modified electrode structure can operate at higher power levels and has a longer operational lifetime than what is currently available.

    摘要翻译: 已经显示电迁移的影响导致仅在几个小时内对诸如薄膜谐振器(TFR)器件的电子器件的金属电极的损坏,用于在这些器件的工作范围内的测试输入功率。 已经确定这种故障对输入功率的频率敏感。 本发明提供一种用于确定电子设备中的高功率可靠性的方法和装置,以便能够准确地确定电子设备的故障时间,并因此能够预测寿命。 作为用于测试设备的方法的一部分,该确定与施加到电子设备的输入功率的频率无关。 基于上述结果,已经开发了一种TFR器件,其包括保护或电迁移减少层,例如钛沉积在器件的电极上。 具有改进的电极结构的TFR器件可以在更高的功率水平下工作,并且具有比目前可用的更长的工作寿命。

    Crystal resonant frequency sensor
    15.
    发明授权
    Crystal resonant frequency sensor 有权
    晶体谐振频率传感器

    公开(公告)号:US06348795B2

    公开(公告)日:2002-02-19

    申请号:US09904403

    申请日:2001-07-12

    IPC分类号: G01V300

    CPC分类号: G01R31/2824 G01R29/22

    摘要: A method for determining a resonant frequency of a mechanical device having a first mass and at least one second mass mechanically coupled to the first mass comprises the steps of: providing a control signal to a voltage-controlled oscillator (VCO) to control the frequency of an output thereof; translating a phase shifted output of the VCO into an oscillatory force which is applied to one of the first and second masses to cause the mechanical device to respond; measuring the response of the mechanical device and generating a response signal representative thereof in frequency and amplitude; generating an error signal proportional to the phase difference between a signal representative of the output of the VCO and the measured response signal; adjusting the control signal to cause the oscillatory force applied to the one mass to sweep within a calculated frequency range rendering the amplitude of the response signal to approach and exceed a calculated threshold value; and when the calculated threshold is exceeded by the amplitude of the response signal, finely adjusting the control signal to the VCO until the value of the measured error signal is equal substantially to a calculated final error value, whereupon the frequency of the response signal is the resonant frequency of the mechanical device.

    摘要翻译: 一种用于确定具有第一质量的机械装置和机械耦合到第一质量的至少一个第二质量的机械装置的谐振频率的方法包括以下步骤:向压控振荡器(VCO)提供控制信号以控制 其输出; 将VCO的相移输出转换成施加到第一和第二质量中的一个的振荡力,以使机械装置响应; 测量机械装置的响应并产生其频率和幅度的响应信号; 产生与表示VCO的输出的信号与所测量的响应信号之间的相位差成比例的误差信号; 调整所述控制信号以使施加到所述一个质量块的振荡力在计算的频率范围内扫描,使得所述响应信号的幅度接近并超过所计算的阈值; 并且当所计算的阈值超过响应信号的幅度时,将控制信号精细地调整到VCO直到所测量的误差信号的值基本上等于所计算的最终误差值,于是响应信号的频率为 谐振频率的机械装置。

    Method of measuring resonant frequency of a resonator and coupling degree of two resonators
    16.
    发明授权
    Method of measuring resonant frequency of a resonator and coupling degree of two resonators 失效
    测量谐振器的谐振频率和两个谐振器的耦合度的方法

    公开(公告)号:US06329824B1

    公开(公告)日:2001-12-11

    申请号:US09349450

    申请日:1999-07-08

    IPC分类号: G01R2704

    CPC分类号: G01R31/2824

    摘要: A filter is composed of plural resonators formed on one surface of a dielectric substrate and a ground plane formed on the other surface. A resonant frequency of each resonator is accurately measured individually and independently from other resonators. Other resonators not selected for measurement are all short-circuited or covered with a conductive member to shift their resonant frequency to a region that does not interfere with the resonant frequency of the resonator under measurement. Also, a coupling coefficient of an arbitrary pair of resonators is accurately measured under no interference from other resonators in the similar manner.

    摘要翻译: 滤波器由形成在电介质基板的一个表面上的多个谐振器和形成在另一个表面上的接地平面组成。 每个谐振器的谐振频率与其他谐振器分别独立地精确测量。 未选择用于测量的其它谐振器全部短路或用导电部件覆盖,以将它们的谐振频率移动到不干扰正在测量的谐振器的谐振频率的区域。 此外,任何一对谐振器的耦合系数都以类似的方式在不受其他谐振器干扰的情况下被精确地测量。

    Device for testing and calibrating the oscillation frequency of an integrated oscillator
    17.
    发明申请
    Device for testing and calibrating the oscillation frequency of an integrated oscillator 有权
    用于测试和校准集成振荡器的振荡频率的装置

    公开(公告)号:US20010044702A1

    公开(公告)日:2001-11-22

    申请号:US09833754

    申请日:2001-04-11

    IPC分类号: G06F019/00 G01R035/00

    CPC分类号: G01R31/2824

    摘要: A digital device for testing and calibrating the oscillation frequency of an integrated oscillator, integrated in an integrated circuit of a type that includes at least one storage and control section, a plurality of connection pins connected bidirectionally to the storage and control section, and an external generator delivering a reference signal of known duration to at least a first digital input pin of the plurality of connection pins. The testing and calibrating device has as input at least first and second control parameters corresponding to limiting values of a predetermined range of values of the oscillation frequency sought for the integrated oscillator circuit, and it includes a circuit for comparing the signal of known duration and the signal from the integrated oscillator circuit; a circuit connected to the compare means, for generating calibration values for the signal from the integrated oscillator circuit; and a circuit for forcing storage of final calibration values of the signal from the integrated oscillator circuit into the storage and control section.

    摘要翻译: 一种用于测试和校准集成振荡器的振荡频率的数字装置,其集成在包括至少一个存储和控制部分的类型的集成电路中,多个连接销双向连接到存储和控制部分,以及外部 将已知持续时间的参考信号传送到多个连接引脚中的至少第一数字输入引脚。 测试和校准装置具有至少第一和第二控制参数的输入,对应于针对集成振荡器电路寻求的振荡频率的预定值范围的限制值,并且其包括用于将已知持续时间的信号和 来自集成振荡电路的信号; 连接到比较装置的电路,用于产生来自集成振荡电路的信号的校准值; 以及用于强制将来自集成振荡器电路的信号的最终校准值存储到存储和控制部分中的电路。

    SYSTEM AND METHOD FOR TUNING A RESONANT STRUCTURE
    18.
    发明申请
    SYSTEM AND METHOD FOR TUNING A RESONANT STRUCTURE 有权
    用于调谐谐振结构的系统和方法

    公开(公告)号:US20010013785A1

    公开(公告)日:2001-08-16

    申请号:US09165523

    申请日:1998-10-02

    发明人: CHONG GUO YAO

    IPC分类号: G01R027/04 G01R027/32

    摘要: An embodiment of the present invention includes the use of a single connection to measure the resonance frequency of main cells or side cells of a resonant structure, such as a linear accelerator cavity structure. Only one antenna is require to perform both the tasks of exciting a cavity structure and picking up the resonant frequency signal. According to an embodiment of the present invention, a first antenna probe is inserted into the main cells of a linear accelerator cavity structure. The first antenna probe includes an antenna window which may be positioned approximately in the center of a main cell adjacent to a target side cell in order to measure the resonance frequency of a target side cell. All non-target side cells adjacent to the main cell aligned with the window antenna are then shorted. For example, the non-target cells may be shorted by metal surrounding the first antenna probe at locations other than the antenna window. A signal is sent and a resonance frequency is noted. In order to measure the resonance frequency of a target main cell according to an embodiment of the present invention, a second antenna probe is inserted into a side cell adjacent to the target main cell. The main cells adjacent to the target main cell are then shorted and side cells adjacent to the target main cell are also shorted. A signal is sent and the resonance frequency of the target main cell is then measured.

    摘要翻译: 本发明的实施例包括使用单个连接来测量诸如线性加速器腔结构的谐振结构的主单元或侧单元的谐振频率。 只需要一个天线来执行激发腔结构和拾取谐振频率信号的任务。 根据本发明的实施例,将第一天线探针插入到线性加速器腔结构的主单元中。 第一天线探针包括天线窗口,其可以位于与目标侧单元相邻的主单元的大致中心附近,以便测量目标侧单元的谐振频率。 然后与窗口天线对准的与主单元相邻的所有非目标侧单元被短路。 例如,在非天线窗口之外的位置处,非目标单元可能被围绕第一天线探针的金属短路。 发送信号并记录共振频率。 为了测量根据本发明的实施例的目标主单元的谐振频率,第二天线探针插入到与目标主单元相邻的侧单元中。 然后与目标主电池相邻的主电池短路,与主电池相邻的侧电池也短路。 发送信号,然后测量目标主单元的谐振频率。

    Method for measuring the inductance of each resonator of a coupled-dual
resonator crystal
    19.
    发明授权
    Method for measuring the inductance of each resonator of a coupled-dual resonator crystal 失效
    用于测量耦合双谐振器晶体的每个谐振器的电感的方法

    公开(公告)号:US5587663A

    公开(公告)日:1996-12-24

    申请号:US407078

    申请日:1995-03-20

    IPC分类号: G01R31/28 G01R29/22

    CPC分类号: G01R31/2824

    摘要: The present invention discloses a method for obtaining frequency parameters to determine the resonator inductances of a crystal. Under this method, a plurality of frequencies are applied to a first electrode. This application is performed once while the second electrode and the common electrode are connected by a short circuit, and then again when the second electrode and the common electrode are capactively connected or open circuited. During each application of the plurality of frequencies to the crystal, the phase response for the output of the resonator circuit is monitored. Then the time response of the crystal is determined. Next, the time delay relative maxima for the time response is determined. Finally, the frequencies at which the time delay relative maxima occur are determined. These frequencies correspond to the inflection points where the change in phase goes from monotonically increasing to monotonically decreasing. This process is repeated with the crystal turned around in the test fixture to obtain a second set of frequencies. These frequencies are then used to calculate the resonator inductances of the crystal. Alternatively, all of the critical frequencies can be determined with the second electrode and the common electrode connected by a short circuit. In this case, however, the critical frequencies correspond to the time delay maxima and minima for the time response. This method is applicable regardless of the frequencies of the resonators or the amount of frequency separation between the resonators.

    摘要翻译: 本发明公开了一种获得频率参数以确定晶体谐振器电感的方法。 在该方法下,向第一电极施加多个频率。 在第二电极和公共电极通过短路连接的同时执行该应用一次,然后当第二电极和公共电极被capactally连接或断开时再次执行。 在向晶体施加多个频率期间,监视谐振器电路的输出的相位响应。 然后确定晶体的时间响应。 接下来,确定时间响应的时间延迟相对最大值。 最后,确定发生时间延迟相对最大值的频率。 这些频率对应于相位变化从单调递增到单调递减的拐点。 在测试夹具中转动的晶体重复该过程以获得第二组频率。 然后使用这些频率来计算晶体的谐振电感。 或者,所有临界频率可以通过第二电极和通过短路连接的公共电极来确定。 然而,在这种情况下,临界频率对应于时间响应的时间延迟最大值和最小值。 无论谐振器的频率或谐振器之间的频率分离量如何,均可使用该方法。

    Frequency analyzer for sub-microsecond testing
    20.
    发明授权
    Frequency analyzer for sub-microsecond testing 失效
    频率分析仪用于亚微秒级测试

    公开(公告)号:US5485101A

    公开(公告)日:1996-01-16

    申请号:US47527

    申请日:1993-04-14

    申请人: Mark Hynes

    发明人: Mark Hynes

    摘要: A method and apparatus for measuring the settling time of frequency changes in a voltage controlled oscillator (VCO) are disclosed. A signal splitter is responsive to the VCO for splitting the output signal between first and second channels. A delay circuit in one of the channels introduces a delay and corresponding phase shift of one signal relative to the other, and a phase detector produces a phase signal proportional to the phase shift indicative of the settling time of the VCO. A control circuit coupled to the phase detector and the VCO produces a step voltage initiating signal for changing the VCO output frequency. A detector responsive to the initiating signal and the phase signal produces an output indicative of the settling time with respect to the control signal in the modulation domain.

    摘要翻译: 公开了一种用于测量压控振荡器(VCO)中的频率变化的建立时间的方法和装置。 信号分离器响应于VCO来分离第一和第二通道之间的输出信号。 一个通道中的延迟电路相对于另一个信号引入延迟和相应的相移,并且相位检测器产生与表示VCO的建立时间的相移成比例的相位信号。 耦合到相位检测器和VCO的控制电路产生用于改变VCO输出频率的阶跃电压启动信号。 响应于起始信号和相位信号的检测器产生指示相对于调制域中的控制信号的建立时间的输出。