Test equipment diagnostics systems and methods

    公开(公告)号:US11714132B2

    公开(公告)日:2023-08-01

    申请号:US17219297

    申请日:2021-03-31

    IPC分类号: G01R31/319 G01R31/28

    摘要: Presented embodiments facilitate efficient and effective diagnostic of test system operations, including temperature control of test equipment components. In one embodiment a test equipment diagnostic method includes applying a known/expected first bit pattern to a test equipment component, applying a known/expected second bit pattern to a test equipment component, and performing a test equipment temperature control analysis based upon the results of applying the known/expected first bit pattern and known/expected second bit pattern. The first bit pattern and second bit pattern have known/expected respective thermal loads and corresponding respective first known/expected/expected temperature and second known/expected/expected temperature. In one embodiment, performing a test equipment temperature control analysis includes determining if temperature control components control a temperature of the test equipment component within acceptable tolerances. In one exemplary implementation, the test equipment component is a test control component (e.g., a field programmable gate array (FPGA), etc.).

    HIGH-TEMPERATURE TESTING DEVICE AND SYSTEM THEREOF

    公开(公告)号:US20190235005A1

    公开(公告)日:2019-08-01

    申请号:US16330097

    申请日:2017-06-16

    发明人: Cheng-Hang Ho

    IPC分类号: G01R31/00 G01R31/28

    CPC分类号: G01R31/003 G01R31/2875

    摘要: Disclosed are a high-temperature testing device, including a trolley, a furnace and a door body. The trolley includes a base and a display panel placing area defined at the base. The base includes a support table and a protruding block formed on an upper surface of and perpendicular to the support table; the display panel placing area is defined on the protruding block. A power supplier and a signal generator are both defined on the support table. A cavity is formed in the furnace body to match and receive the trolley. A first heat insulating plate and a second heat insulating plate are respectively defined on opposite inner walls at two sides of the furnace body. A gap is defined between opposite end portions of the first heat insulating plate and the second heat insulating plate, for the protruding block to pass through.

    ACTIVE WAFER PROBER PREHEAT-PRECOOL SYSTEM AND METHOD FOR TESTING WAFERS

    公开(公告)号:US20180321279A1

    公开(公告)日:2018-11-08

    申请号:US15971321

    申请日:2018-05-04

    发明人: WEN-YUAN HSU

    IPC分类号: G01R1/44 G01R1/073 G01R31/26

    摘要: An active wafer prober preheat-precool system comprises a wafer loading unit used to load at least one wafer; a probe card disposed corresponding to the wafer loading unit and used to test the wafer; a carrying mechanism including a central connector corresponding to the wafer loading unit and having a first opening, wherein the probe card is connected with the central connector and faces the wafer loading unit through the first opening; a peripheral connector having a second opening, wherein the central connector is detachably disposed inside the second opening; and a first temperature regulation unit disposed in the peripheral connector; and a control unit electrically connected with the first temperature regulation unit and controlling the first temperature regulation unit to adjust the temperature of the peripheral connector. The present invention also discloses a method for testing wafers.

    LENGTH ADJUSTABLE ARM AND MEMS POSITION DETECTION EQUIPMENT ROTATION TEST APPARATUS

    公开(公告)号:US20180299505A1

    公开(公告)日:2018-10-18

    申请号:US15486287

    申请日:2017-04-12

    IPC分类号: G01R31/28 B65G47/91

    摘要: A length adjustable arm and MEMS position detection equipment rotation test apparatus includes an extendible section and first and second rotary bodies provided at one end of a rotation device for variation of a feeding position of a first feeding component so that feeding component is capable of conducting various feeding ways. Further, a worktable is provided thereon with at least one rotation section, which has a surface on which a plurality of operation stations is mounted. As such, through circular change made by the rotation section in respect of the locations of the operation stations, an effect of effectively and efficiently burning or testing can be achieved. Further, the operation stations are provided, on a periphery thereof, with a turning section, and the turning section is operable to turn each of the operation stations in order to effectively conduct tests for various MEMS inertial components.

    TEMPERATURE-MEASURING APPARATUS, INSPECTION APPARATUS, AND CONTROL METHOD

    公开(公告)号:US20180136275A1

    公开(公告)日:2018-05-17

    申请号:US15799431

    申请日:2017-10-31

    IPC分类号: G01R31/28

    摘要: A temperature-measuring apparatus includes a heat source capable of changing a heat generation temperature, a temperature sensor that detects a temperature of a predetermined position other than a measurement target accommodated in a measurement subject, and a temperature computation portion that computes a temperature of the measurement target on the basis of heat balance characteristics of the temperature of the measurement target, a temperature of the heat source, and the temperature of the predetermined position, the temperature of the heat source, and the detected temperature of the predetermined position.