Abstract:
In a voltage converter which is disposed in a semiconductor integrated circuit so as to lower an external supply voltage and to feed the lowered voltage to a partial circuit of the integrated circuit; the voltage converter is constructed so as to produce an output voltage suited to an ordinary operation in the ordinary operation state of the semiconductor integrated circuit and an aging voltage in the aging test of the circuit.
Abstract:
A zoom lens barrel is provided including a cam ring which is threadedly engaged to a female helicoid formed in a stationary barrel, a linear movement guide member that is rotatable relative to the cam ring and movable in an optical axis direction together with the cam ring, and movable lens groups, including first, second and third lens groups that are guided in the optical axis direction by the linear movement guide member. The zoom lens barrel further includes a female helicoid formed on an inner peripheral surface of the cam ring to engage with a male helicoid of a first lens frame which holds the first lens group and a plurality of cam grooves formed on the cam ring to drive lens groups behind the first lens group.
Abstract:
In a voltage converter provided in a semiconductor memory and supplying an internal supply voltage to a circuit in the semiconductor memory, a circuit is provided for generating a first voltage whose dependency on an external supply voltage is regulated to a predetermined small value, while another circuit is provided for generating a second voltage whose dependency on the external supplying voltage is larger than the dependency of the first voltage. The voltage converter includes MOS transistors and differential amplifiers interconnected with one another, as well as voltage dividing means. The memory also includes a word line booster for boosting the internal supply voltage.
Abstract:
Practical structures of an ultra large scale semiconductor integrated (ULSI) circuit especially a dynamic random access memory of 16M bits or more are involved. The ULSI circuit uses internal operating voltages and how to construct a reference voltage generating circuit and a voltage limiter circuit in the ULSI circuit is a matter of importance. The operation of the reference voltage generating circuit and voltage limiter circuit can be stabilized, characteristics of these circuits are improved, and layout of these circuits as applied to memory cell array, peripheral circuits and the like can be improved. Improved methods of testing these circuits are provided.
Abstract:
A measuring apparatus of the present invention measures the constituent concentration of a specimen after loading into the apparatus a test piece having a test material which develops coloring as a result of a reaction with the constituents of a specimen. When the apparatus detects that the test piece having the test material has been loaded, it automatically begins to measure the constituent concentration of the specimen. That is, after the loading of the test piece is detected, a predetermined time period is measured. During this time measurement, the time period is displayed at a predetermined time interval. After the time measurement of this predetermined time period is terminated, the test material is irradiated with a light, and the intensity of the light from the test material is detected. The constituent concentration of the specimen applied to the test material can be determined on the basis of the reflected light intensity thus detected. Furthermore, this measuring apparatus can detect a reverse insertion of a test piece, and is constructed so as to disable the measurement of the constituent concentration of a specimen if supplementary information to be stored along with measurement information has not been set.
Abstract:
A waterproof lens including a lens frame located within a lens barrel. An inner peripheral flange is provided on the inner periphery of the lens barrel. The waterproof lens also has a tubular member which is detachably mounted to the inner peripheral flange for the purpose of intercepting light in a space between the lens barrel and the lens frame. An elastic waterproof ring is provided on the outer peripheral surface of the tubular member. The waterproof lens further includes a mechanism for sealing the transparent member and the inner peripheral flange in a water-tight manner.
Abstract:
Each of a plurality of memory arrays is divided into a plurality of memory mats MAT00L-MAT07L to MAT10R-MAT17R in directions in which word lines and bit lines extend. First common data lines, that is, sub-IO lines, are provided which correspond to these memory mats and which are disposed in parallel to the word lines. Bit lines designating the corresponding memory mats are selectively connected to the first common data lines. Second common data lines, that is, main IO line groups MIOG0-MIOG7, are also provided and are disposed in parallel to the bit lines. Designated sub-IO lines are selectively connected to the second common data lines. Moreover, a plurality of main amplifiers forming a main amplifier unit MAU0 are orderly arranged in the direction in which the bit lines extend. These include a first main amplifier comprising a static current mirror amplifier which requires a relatively large operating current and a second main amplifier comprising a dynamic CMOS latch amplifier which requires only a relatively small operating current. These main amplifiers are put to proper use in conformity with the operating mode involved. By virtue of these arrangements, the number of parallel bits in a multibit parallel test mode of a dynamic RAM becomes expandable without being restricted by the number of the sub-IO lines correspondingly provided for each memory mat.
Abstract:
In a semiconductor memory, switch circuits are provided so as to inhibit voltage and signal supplies to each of the normal memory blocks when so required. On the other hand, a ROM is provided on the chip so as to store the address of a defective memory block which consumes an excessively large stand-by current when the semiconductor memory is in the stand-by mode. The switch circuits are controlled by the output of the ROM so as to inhibit the voltage and signal supply to the defective memory block. Then, a spare memory block which is substituted for the defective normal memory block receives the voltage and signal supply.
Abstract:
Practical structures of an ultra large scale semiconductor integrated (ULSI) circuit especially a dynamic random access memory of 16M bits or more are involved. The ULSI circuit uses internal operating voltages and how to construct a reference voltage generating circuit and a voltage limiter circuit in the ULSI circuit is a matter of importance. The operation of the reference voltage generating circuit and voltage limiter circuit can be stabilized, characteristics of these circuits are improved, and layout of these circuits as applied to memory cell array, peripheral circuits and the like can be improved. Improved methods of testing these circuits are provided.
Abstract:
An organic polymer ferromagnetic material characterized in that the material comprises a polymer obtained by subjecting to plasma polymerization or oxidation polymerization a methane derivative having two substituents and represented by the formula ##STR1## wherein A is an electron accepting group, and B is an electron donating group, or by copolymerizing the methane derivative with a diarylmethane derivative represented by the formula ##STR2## wherein R.sup.1 is a substituted or unsubstituted phenyl group by plasma polymerization or oxidation polymerization.