CESIUM PRIMARY ION SOURCE FOR SECONDARY ION MASS SPECTROMETER

    公开(公告)号:US20180240663A1

    公开(公告)日:2018-08-23

    申请号:US15948028

    申请日:2018-04-09

    Abstract: A primary ion source subassembly for use with a secondary ion mass spectrometer may include a unitary graphite ionizer tube and reservoir base. A primary ion source may include a capillary insert defining an ionizer aperture. An ionizer aperture may be centrally arranged in an outwardly protruding conical or frustoconical surface, and may be overlaid with a refractory metal coating or sheath. Parameters including ionizer surface shape, ionizer materials, ionizer temperature, and beam stop plate orifice geometry may be manipulated to eliminate ghost images. A graphite tube gasket with a dual tapered surface, or an externally threaded graphite tubular connecting body, may promote sealing of a source material cavity.

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