VOLTAGE REGULATOR BYPASS CIRCUITRY USABLE DURING DEVICE TESTING OPERATIONS

    公开(公告)号:US20190094296A1

    公开(公告)日:2019-03-28

    申请号:US15713168

    申请日:2017-09-22

    CPC classification number: G01R31/2896 G01R31/2856 G01R31/2886 H03K19/20

    Abstract: Disclosed herein is circuitry for bypassing a medium voltage regulator during testing. The circuitry includes a low voltage regulator to, in operation, generate a first voltage within a first voltage range for powering first circuitry, and a medium voltage regulator to, in operation, generate a second voltage within a second voltage range greater than the first voltage range for powering second circuitry. A low voltage regulator bypass circuit generates a low voltage regulator bypass signal that operates to selectively bypass the low voltage regulator. A medium voltage regulator bypass circuit bypasses the medium voltage regulator as a function of the low voltage regulator bypass signal and an external voltage regulator select signal, the bypass of the medium voltage regulator being such that an external voltage can be applied to the second circuitry.

    CIRCUITRY FOR TESTING NON-MASKABLE VOLTAGE MONITOR FOR POWER MANAGEMENT BLOCK

    公开(公告)号:US20190086474A1

    公开(公告)日:2019-03-21

    申请号:US15710172

    申请日:2017-09-20

    Abstract: A method of operating an electronic device during test mode operation of a duplicated voltage monitor includes sensing a functional supply voltage with a voltage monitor, deasserting an output of the voltage monitor if the functional supply voltage is exceeds a threshold, and asserting output of the voltage monitor if the functional supply voltage falls below the threshold. A test supply voltage is sensed with the duplicate voltage monitor, output of the duplicate voltage monitor is deasserted if the test supply voltage exceeds a threshold, and output of the duplicate voltage monitor is asserted if the test supply voltage falls below the threshold. Output of the duplicate voltage monitor is monitored to thereby determine the threshold based upon assertion of the output of the duplicate voltage monitor, and performing a logical operation between outputs of the voltage monitor and the duplicate voltage monitor to generate a power on reset signal.

    Circuit for level shifting a clock signal using a voltage multiplier

    公开(公告)号:US10211727B1

    公开(公告)日:2019-02-19

    申请号:US16028814

    申请日:2018-07-06

    Inventor: Vikas Rana

    Abstract: A voltage multiplier circuit operates in response to a received clock signal to perform a voltage multiplication operation on an input voltage to generate an output voltage. The voltage multiplier circuit includes a pair of intermediate nodes that are capacitively coupled to receive, respectively, opposite phases of a clock signal. A first CMOS driver circuit is coupled to one of the intermediate nodes and has an output configured to generate one phase of a level shifted output clock signal. A second CMOS driver circuit is coupled to another one of the intermediate nodes and has an output configured to generate another phase of the level shifted output clock signal.

    Non-volatile memory (NVM) with dummy rows supporting memory operations

    公开(公告)号:US10127990B1

    公开(公告)日:2018-11-13

    申请号:US15652564

    申请日:2017-07-18

    Inventor: Vikas Rana

    Abstract: A memory array includes rows and columns with memory cell portion and a dummy cell portion. Bit lines are connected to the memory cells and to the dummy cell portion. The dummy cell portion includes a first row of dummy cells and a second row of dummy cells. The dummy cells in the first row have a first connection to a corresponding bit line of a first bit line group of the bit lines and a second connection to a first source line. The dummy cells in the second row have a first connection to a corresponding bit line of a second bit line group of the plurality of bit lines and a second connection to a second source line. The dummy cells are selectively actuated to couple voltages at the first and second source lines to the first and second bit line groups, respectively, depending on memory operating mode.

    FRACTION-N DIGITAL PLL CAPABLE OF CANCELING QUANTIZATION NOISE FROM SIGMA-DELTA MODULATOR

    公开(公告)号:US20180287620A1

    公开(公告)日:2018-10-04

    申请号:US15471483

    申请日:2017-03-28

    Abstract: A phase locked loop (PLL) circuit disclosed herein includes a phase detector receiving a reference frequency signal and a feedback frequency signal, and configured to output a digital signal indicative of a phase difference between the reference frequency signal and the feedback frequency signal. A digital loop filter filters the digital signal. A digital to analog converter converts the filtered digital signal to a control signal. An oscillator generates a PLL clock signal based on the control signal. A sigma-delta modulator modulates a divider signal as a function of a frequency control word. A divider divides the PLL clock signal based on the divider signal, and generates a noisy feedback frequency signal based thereupon. A noise filtering block removes quantization noise from the noisy feedback frequency signal to thereby generate the feedback frequency signal.

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