公开(公告)号：US20230197401A1

公开(公告)日：2023-06-22

申请号：US18083630

申请日：2022-12-19

Applicant: JEOL Ltd.

Inventor： Munehiro Kozuka

IPC: H01J37/21 ,  H01J37/305

CPC classification number: H01J37/21 ,  H01J37/305 ,  H01J2237/083 ,  H01J2237/20214 ,  H01J2237/24578 ,  H01J2237/30477 ,  H01J2237/31749

Abstract: Provided is a sample milling apparatus capable of milling various samples efficiently. The sample milling apparatus includes an anode, a cathode for emitting electrons which are made to collide with gas molecules so that ions are generated, an extraction electrode for causing the generated ions to be extracted as an ion beam, and a focusing electrode disposed between the cathode and the extraction electrode and applied with a focusing voltage. The spatial profile of the ion beam is controlled by varying the focusing voltage applied to the focusing electrode.

公开(公告)号：US11674913B2

公开(公告)日：2023-06-13

申请号：US17383532

申请日：2021-07-23

Applicant: JEOL Ltd.

Inventor： Takaomi Yokoyama ,  Takanori Murano

IPC: G01N23/2252 ,  G01N23/2209 ,  G01N23/2276

CPC classification number: G01N23/2252 ,  G01N23/2209 ,  G01N23/2276 ,  G01N2223/079

Abstract: Spectrums are measured by irradiating an electron beam on a sample while varying an accelerating potential and by detecting X-rays emitted from the sample. A normalizer unit normalizes the spectrums and thereby calculates normalized spectrums. A difference calculator unit calculates difference spectrums based on the normalized spectrums. A search unit performs a search in a database for each comparison difference spectrum, and identifies compounds contained in the sample.

公开(公告)号：US11668662B2

公开(公告)日：2023-06-06

申请号：US17381571

申请日：2021-07-21

Applicant: JEOL Ltd.

Inventor： Yasuaki Yamamoto ,  Takanori Murano

IPC: G01N23/2252 ,  G01N23/2209

CPC classification number: G01N23/2252 ,  G01N23/2209 ,  G01N2223/079

Abstract: Characteristic X-rays (soft X-rays) from a sample are detected using a spectroscope to thereby generate a plurality of intensity spectrums arranged in order of time sequence. A contour map creation unit creates a contour map by converting, in accordance with a color conversion condition, the plurality of intensity spectrums into a plurality of one-dimensional maps, and arranging the plurality of one-dimensional maps in order of time sequence. When displaying the contour map, a waveform array and a difference contour map may also be displayed. Based on the contour map, a timepoint at which a state change occurs in the sample is determined.

公开(公告)号：US20230140037A1

公开(公告)日：2023-05-04

申请号：US17974836

申请日：2022-10-27

Applicant: JEOL Ltd.

Inventor： Shinichi Mukousaka ,  Junkei Kou ,  Kiyotaka Konuma

IPC: H01J49/10 ,  H01J49/42 ,  H01J49/00

Abstract: Ions ejected from a collision cell are detected by a detector. An evaluation unit generates a temporary calibration curve based on an intensity of a detection signal and evaluates an ion accumulation time of the collision cell based on the temporary calibration curve. When the evaluation unit determines signal saturation, the ion accumulation time of the collision cell is reduced. When the evaluation unit determines sensitivity insufficiency, the ion accumulation time of the collision cell is increased.

公开(公告)号：US20230135564A1

公开(公告)日：2023-05-04

申请号：US17974678

申请日：2022-10-27

Applicant: JEOL Ltd.

Inventor： Kenichi Hachitani ,  Nobuaki Nemoto ,  Junpei Hamatsu ,  Fumihiro Yamazaki ,  Takayuki Suzuki

IPC: G01R33/46

Abstract: In a frequency converter, a transmission signal having a first frequency component and a second frequency component is multiplied by a local signal, to thereby frequency-convert the transmission signal. In a power amplifier, the frequency-converted transmission signal is amplified. A demultiplexing circuit generates a first transmission signal and a second transmission signal from the amplified transmission signal. A controller is configured to set for a transmission section a frequency set suitable for two irradiation frequencies.

公开(公告)号：US20230127255A1

公开(公告)日：2023-04-27

申请号：US17973993

申请日：2022-10-26

Applicant: JEOL Ltd.

Inventor： Kazunori Somehara ,  Yuji Kohno

IPC: H01J37/147 ,  H01J37/10 ,  H01J37/26 ,  H01J37/28

Abstract: An electron microscope includes an electron source for emitting an electron beam, an illumination lens for focusing the beam, an aberration corrector for correcting aberrations, an illumination deflector assembly disposed between the illumination lens and the aberration corrector and operating to deflect the beam and to vary its tilt relative to a sample, a scanning deflector for scanning the sample with the beam, an objective lens, a detector for detecting electrons transmitted through the sample and producing an image signal, a control section for controlling the illumination deflector assembly, and an image generating section for receiving the image signal and generating a differential phase contrast (DPC) image. The tilt of the beam is varied by the illumination deflector assembly such that the image generating section generates a plurality of DPC images at different tilt angles of the beam and creates a final image based on the DPC images.

公开(公告)号：US20230112623A1

公开(公告)日：2023-04-13

申请号：US17961020

申请日：2022-10-06

Applicant: JEOL Ltd.

Inventor： Seketsu Fukuzawa ,  Koji Takahashi ,  Yoshiyuki Itoh ,  Masaki Takiwaki ,  Shugo Tsuda ,  Masayoshi Mochizuki ,  Taku Yoshiya

IPC: C07F9/54

Abstract: Provided is a phosphonium compound represented by Formula (I): in Formula (I), R1, R2, and R3 are independently from each other, an alkyl group or an aryl group, the alkyl group is a substituted or unsubstituted, linear or branched alkyl group having 1 to 20 carbon atoms or a substituted or unsubstituted cyclic alkyl group having 5 to 20 carbon atoms, the aryl group is a substituted or unsubstituted aryl group having 6 to 20 carbon atoms; X is a reactive group having a hydrazide group, a halide group, a pseudohalide group, or a thioester group; and Y− is an anion having a total charge of −1, or Y− is absence.

公开(公告)号：US11609191B2

公开(公告)日：2023-03-21

申请号：US16934340

申请日：2020-07-21

Applicant: JEOL Ltd.

Inventor： Kazunori Tsukamoto ,  Shigeru Honda

IPC: G01N23/2209 ,  G01N23/2208 ,  G01N23/2252

Abstract: An analyzer includes a wavelength-dispersive X-ray spectrometer and a control unit that controls the wavelength-dispersive X-ray spectrometer, the control unit performing: processing of acquiring an analysis result of preparatory analysis performed on a specimen to be analyzed; processing of setting spectroscopic conditions for WDS analysis using the wavelength-dispersive X-ray spectrometer based on the analysis result of the preparatory analysis; and processing of performing the WDS analysis on the specimen to be analyzed under the set spectroscopic conditions.

公开(公告)号：US20230014614A1

公开(公告)日：2023-01-19

申请号：US17865632

申请日：2022-07-15

Applicant: JEOL Ltd.

Inventor： Nari Tsutagawa ,  Takashi Sato ,  Yohei Daino ,  Kozo Koiwa ,  Yuhei Kaneko ,  Masahiko Kawakami

IPC: B22F10/362 ,  B22F12/41 ,  B22F12/49 ,  B22F12/50 ,  B22F10/28 ,  B22F10/366 ,  B33Y10/00 ,  B33Y30/00

Abstract: An apparatus includes a build plate, a powder application apparatus that applies metal powder onto the build plate to form a powder layer, a beam irradiation apparatus that irradiates the powder layer with an electron beam, and a control unit that controls the powder application apparatus and the beam irradiation apparatus. When the powder layer is preheated by irradiation with the electron beam, the control unit sets a beam size and an irradiation position of the electron beam such that lines of the electron beam do not overlap each other at least at a start of preheating, and controls the beam irradiation apparatus to gradually increase at least one of a beam current and the beam size of the electron beam from the start of preheating to an end of preheating.

公开(公告)号：US11536736B2

公开(公告)日：2022-12-27

申请号：US16827027

申请日：2020-03-23

Applicant: JEOL Ltd.

Inventor： Takeichirou Nakajima

IPC: G01N35/00 ,  G01N35/02

Abstract: An automatic analyzer includes an input reception unit that receives an operation to specify a search condition for sample information, an operation to execute search of the sample information, and an operation to specify whether only pieces of the sample information of samples under measurement among all samples are set as search targets; and a display control unit that, when the operation to execute search of the sample information is performed in a state in which only pieces of the sample information of samples under measurement are specified to be search targets, sets only pieces of the sample information of samples under measurement among the sample information of all samples as search targets based on the progress information, extracts pieces of the sample information of samples matching with a specified search condition, and causes the extracted pieces of the sample information to be displayed in a list form.