Abstract:
A semiconductor integrated circuit may include an internal circuit, and a power-on reset circuit for generating a power-on reset signal to initialize the internal circuit at a power-on. At the power-on, the power-on reset circuit delays a transition of the power-on reset signal from a first level to a second level until a given time duration after the power supply voltage reaches a detection voltage.
Abstract:
A memory device utilizing a negatively biased word line scheme diverts word line discharge current from the negative voltage source during a precharge operation, thereby reducing voltage fluctuations and current consumption from the negative voltage source. A main word line, sub-word line, word line enable signal, or other type of word line is coupled to the negative voltage source during a precharge operation. The word line is also coupled to a second power supply during the precharge operation, and then uncoupled from the second power supply after most of the word line discharge current has been diverted. The negative voltage source can then discharge and maintain the word line at a negative bias.
Abstract:
A voltage detecting circuit includes a first voltage generator that provides a reference voltage, a second voltage generator that provides a comparison voltage in response to a boosted voltage, and a differential amplifier that provides an amplified difference signal to generate a voltage level detection signal in response to a voltage difference between the reference voltage and the comparison voltage. A bypass circuit is coupled to the amplified signal to detect a target VPP level suitable for a test mode by providing a current path in response to the comparison voltage when the comparison voltage reaches a predetermined level. The voltage detecting circuit thereby allows a precise and stable detecting operation to be performed regardless of the operation mode or process or temperature variations.
Abstract:
A time-to-digital converter includes a phase-difference enhancement section configured to receive first and second input signals having a reference phase difference Δt, and to output first and second output signals having an enhanced phase difference; and a comparison section configured to receive the first and second output signals, to compare a phase difference between the first and second output signals with a reference delay time τ, and to output a comparison signal. The time-to-digital converter has a high resolution. That is to say, the time-to-digital converter has a resolution less than the minimum phase delay time of a delay element, which is obtainable in a corresponding semiconductor process.
Abstract:
A broadband multi-phase output delay locked loop (DLL) circuit can be operated in a wide range of frequencies and generate various phases. Unlike conventional voltage control delay lines in which delay cells are connected in series, the DLL circuit utilizes a delay matrix in which a resistant network is used so that the number of delay cells connected in series is reduced, various phases can be outputted, and a delay interval error (phase error) due to the resistant network is minimized. The current of the delay cells is controlled so that the delay cells in the delay matrix can operate in a wide range of frequencies, and load capacitance values of capacitors connected in parallel in the delay cells can be controlled.
Abstract:
A broadband multi-phase output delay locked loop (DLL) circuit can be operated in a wide range of frequencies and generate various phases. Unlike conventional voltage control delay lines in which delay cells are connected in series, the DLL circuit utilizes a delay matrix in which a resistant network is used so that the number of delay cells connected in series is reduced, various phases can be outputted, and a delay interval error (phase error) due to the resistant network is minimized. The current of the delay cells is controlled so that the delay cells in the delay matrix can operate in a wide range of frequencies, and load capacitance values of capacitors connected in parallel in the delay cells can be controlled.
Abstract:
A semiconductor memory device having a shared sense amplifier architecture includes a bitline equalizing voltage generator, which recycles a boost voltage to generate bitline equalizing voltage. The bitline equalizing voltage is used to generate signals for activating bitline equalizing circuits to precharge the bitlines of at least one of the first and second memory block with a bitline precharge voltage, when the memory block is not currently selected for a data operation. The bitline equalizing voltage generator may be configured to recycle the boost voltage that was used to generate a bitline isolation signal or a wordline drive signal.
Abstract:
Provided is a circuit for use in a semiconductor memory optimized to improve data read ability at low supply voltages. Circuit includes a direct sense AMP circuit, an input/output gate circuit, and an operation control unit. The direct sense AMP circuit transmits read data loaded in a bit line pair including first and second bit lines to a data input/output pair including first and second data input/output lines in response to a read command signal. The input/output gate circuit which, in response to a read/write signal, also passes the read data loaded in the bit line pair directly to the data input/output line pair, and passes write data loaded in the data input/output line pair directly to the bit line pair. The operation control unit which, in response to a column address signal and a write command, generates the read command signal and the read/write signal to turn ON both the direct sense AMP circuit and the input/output gate circuit in a data read operation, or to turn ON the input/output gate circuit and turn OFF the direct sense AMP circuit in a data write operation.
Abstract:
A semiconductor memory device having a shared sense amplifier architecture includes a bitline equalizing voltage generator, which recycles a boost voltage to generate bitline equalizing voltage. The bitline equalizing voltage is used to generate signals for activating bitline equalizing circuits to precharge the bitlines of at least one of the first and second memory block with a bitline precharge voltage, when the memory block is not currently selected for a data operation. The bitline equalizing voltage generator may be configured to recycle the boost voltage that was used to generate a bitline isolation signal or a wordline drive signal.
Abstract:
A plurality of internal circuits of a memory device are operable at first and second internal voltages, where the first internal voltage is less than the second internal voltage. A first power port of the memory device receives a first power supply voltage, and a second power port of the memory device receives a second power supply voltage, where the first power supply voltage is less than the second power supply voltage. An internal voltage generation circuit of the memory device is selectively operable in either a first mode in which the second internal voltage is generated from the first power supply voltage, or a second mode in which the second internal voltage is generated from the second power supply voltage.