Abstract:
A cathode-ray tube having an electron gun which includes an electrode plate (E) in which a portion having three beam passage holes (H) and a portion having bead supports (S) are formed as a unitary or one piece structure, the two portions having different thicknesses (T.sub.1, T.sub.2), and the steps being inclinedly formed along the boundaries of the two portions. Since the portion having beam passage holes and the portion having bead supports are formed as a unitary or one piece structure easily and highly precisely in the electrode plate, the conventionally employed process of welding can be omitted, and thereby the productivity is raised and the manufacturing cost is decreased. Moreover, use of the material having the steps formed in advance contributes to increasing the productivity and preventing the machining tools from being damaged during the press-forming.
Abstract:
A semiconductor device includes a plurality of single crystal semiconductor island layers formed on a semiconductor substrate with a first insulating layer intervened therebetween, the single crystal semiconductor island layers being isolated from one another by a second insulating layer. In forming the single crystal semiconductor island layers, a single crystal semiconductor layer is formed and is selectively removed on the first insulating layer. The second insulating layer is buried between adjacent ones of the single crystal semiconductor island layers. The second insulating layer is formed over the entire surface inclusive of the single crystal semiconductor island layers and a surface portion of the second insulating layer is removed by an etching process or a polishing process. Since the non-element regions are buried by the second insulating layer and the single crystal semiconductor island layers are completely isolated from one another, the substrate-related capacitances such as those at wiring regions and resistive parts are reduced.
Abstract:
Disclosed is a semiconductor device in which dummy regions which are lower than an isolated element region are formed around the isolated element region. Another dummy region which has a height nearly equal to those of element regions may be formed at a non-element-region-existing region, accompanying with lower dummy regions. The method for making the semiconductor device has the steps of suitably forming the element regions and dummy regions on a insulating layer on a substrate, depositing a insulator on the entire surface of the insulating layer and polishing the insulator to obtain a plane surface.
Abstract:
A cathode-ray tube having an electron gun which includes an electrode plate (E) in which a portion having three beam passage holes (H) and a portion having bead supports (S) are formed as a unitary structure, the two portions having different thicknesses (T.sub.1, T.sub.2), and the steps being inclinedly formed along the boundaries of the two portions. Since the portion having beam passage holes and the portion having bead supports are formed as a unitary structure easily and highly precisely in the electrode plate, the conventionally employed process of welding can be omitted, and thereby the productivity is raised and the manufacturing cost is decreased. Moreover, use of the material having the steps formed in advance contributes to increasing the productivity and preventing the machining tools from being damaged during the press-forming.
Abstract:
A semiconductor device comprising an insulating isolation groove which comprises a groove in a substrate, an insulating film on the inner surface of the groove, a polycrystal silicon film and a boron phosphosilicate glass film in order embedded within the groove, and a silicon oxide film on the boron phosphosilicate glass film.Since the polycrystal silicon film and boron phosphosilicate glass film are embedded within the groove, the crystal defect due to thermal expansion does not occur. And, since it is not necessary to oxidize the surface of the polycrystal silicon film within the groove, deformation due to an increased build-up at the time of oxidation does not occur.
Abstract:
A radio communication device includes a mounting substrate and a shielding case to cover circuits mounted on the substrate. A first surface of the substrate includes an input/output area where a transmitting/receiving unit of an RF signal is mounted, an amplification area where an amplifying unit to amplify the RF signal from the transmitting/receiving unit is mounted, an RF area where an RF processing unit to process the. RF signal is mounted, and a baseband area where a baseband processing unit to process a baseband signal is mounted. A second surface of the substrate includes a crystal oscillator arranged to generate a reference clock signal which is supplied to the RF processing unit and the baseband processing unit.
Abstract:
In a broadcast receiving system, a first antenna receives a broadcast signal of a first frequency band and a second antenna receives a signal of a second frequency band different from the first frequency band. A frequency conversion unit converts the signal of the second frequency band into a second signal of the first frequency band. A selection unit selects one of the broadcast signal output from the first antenna and the second signal output from the frequency conversion unit. A demodulation unit demodulates the one of the broadcast signal and the second signal selected by the selection unit.
Abstract:
On a surface of a silicon substrate, N.sup.+ type buried layer and N-type epitaxial layer are formed in order, and an isolation layer reaching the silicon substrate from the surface of the N-type epitaxial layer is formed to define a photodiode. In the surface of the photodiode, a rectangular recess is selectively formed toward inside of the N-type epitaxial layer. On the side face of the recess, a silicon oxide layer is formed. In the region surrounded by the silicon oxide layer, a photo absorbing layer and so forth is formed. On the other hand, in an optical waveguide, a LOCOS oxide layer is formed toward inside from the surface of the N-type epitaxial layer. The N-type epitaxial layer is sandwiched between the LOCOS oxide layer and the N.sup.+ type buried layer. The refraction indexes of the LOCOS oxide layer and the N.sup.+ type buried layer are smaller than that of the N-type epitaxial layer. Thus, the N-type epitaxial layer serves as an optical passage to efficiently introduce a light beam into the photo absorbing layer of the photodiode.
Abstract:
A fabrication method of a semiconductor device that can realize a semiconductor device having an improved radiation performance of heat together with a low parasitic capacitance between a semiconductor substrate and a conductor of the device. An SOI structure having a single-crystal silicon layer formed on an insulating substructure is prepared and then, device regions are formed on the substructure by using the single-crystal silicon layer. Sidewall insulators are formed to cover side faces of the respective device regions, laterally isolating the device regions from each other. A resistive silicon layer is formed on a non-device region of the substructure. The resistive silicon layer has a resistivity or specific resistance greater than that of the device regions. Electronic elements are formed in the device regions. The resistive silicon layer may be made of polysilicon or single-crystal silicon.
Abstract:
An insulating film is provided on a single crystal silicon layer of a SOI substrate, and a first groove for device isolation and a second groove for thickness measurement are formed to expose a surface of a silicon substrate of the SOI substrate. Then, the first and second grooves are filled with a filling film, and the filling film is etched back, so that the first groove is still filled with the filling film, while the filling film which have filled the second groove is removed to expose the surface of the silicon substrate, because the second groove has a width larger than that of the first groove.