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公开(公告)号：US20230408551A1
公开(公告)日：2023-12-21
申请号：US18209110
申请日：2023-06-13
申请人： Tektronix, Inc.
发明人： Justin E. Patterson
IPC分类号： G01R13/02
CPC分类号： G01R13/029 , G01R13/0272
摘要： A system includes an input for accepting an input signal from a Device Under Test (DUT), a measurement unit for generating first measurement data and second measurement data from the input signal, and one or more processors configured to derive at least one principal component from the first and second measurement data using principal component analysis, and remap the first measurement data and the second measurement data to a principal component domain derived from the at least one principal component. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.
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公开(公告)号：US11817945B2
公开(公告)日：2023-11-14
申请号：US17114266
申请日：2020-12-07
申请人： Tektronix, Inc.
发明人： Shane L. Arnold
CPC分类号： H04L43/04 , G01R13/0272 , G06F3/04847 , G06F3/05 , G11B20/00007
摘要： A test and measurement instrument includes an acquisition memory and a processor structured to store a stream of sampled incoming data samples in the acquisition memory. As the memory fills, the instrument automatically decimates either the data samples already stored in the acquisition memory, the incoming data samples, or both. The instrument may also store two copies of the incoming data samples, one at an increased decimation rate. The two copies are tied together with a timestamp or using other methods. The more highly decimated copy may be used to produce a video output of the stored data samples, saving the instrument from generating the video output from the larger sized sample.
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公开(公告)号：US11789070B2
公开(公告)日：2023-10-17
申请号：US17324007
申请日：2021-05-18
申请人： Tektronix, Inc.
IPC分类号： G06F11/00 , G01R31/317 , G01R31/28 , G01R31/3187 , G01R31/319
CPC分类号： G01R31/3171 , G01R31/2841 , G01R31/3187 , G01R31/31905
摘要： A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
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公开(公告)号：US11789051B2
公开(公告)日：2023-10-17
申请号：US17182056
申请日：2021-02-22
申请人： Tektronix, Inc.
发明人： Kan Tan
CPC分类号： G01R23/02 , G01R13/0218 , G01R23/16
摘要： A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than an analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating pattern, a single analog-to-digital converter configured to receive the signal under test and sample the signal under test over a plurality of repeating patterns at a sample rate, and one or more processors configured to determine a frequency of the signal under test and reconstruct the signal under test based on the determined frequency of the signal, the pattern length of the signal under test, and/or the sample rate without a trigger.
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公开(公告)号：US11768161B2
公开(公告)日：2023-09-26
申请号：US17307989
申请日：2021-05-04
申请人： Tektronix, Inc.
摘要： Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
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26.发明公开公开(公告)号：US20230266369A1
公开(公告)日：2023-08-24
申请号：US18138006
申请日：2023-04-21
申请人： Tektronix, Inc.
发明人： Michael J. Mende
CPC分类号： G01R19/0015 , G01R15/125
摘要： A test and measurement probe system, including an input to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit, such as an AC coupling circuit or a LF and/or DC rejection circuit, configured to receive the input signal and to separate the AC component and the LF and/or DC component from the input signal, a first output to output the alternating current component to the test and measurement instrument, and a second output to output the direct current component to the test and measurement instrument. In some embodiments, the LF and/or DC component is digitized prior to being output by the second output.
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公开(公告)号：US20230222382A1
公开(公告)日：2023-07-13
申请号：US18081616
申请日：2022-12-14
申请人： Tektronix, Inc.
发明人： Wenzheng Sun , Xiaolan Wang , Justin E. Patterson
IPC分类号： G06N20/00
CPC分类号： G06N20/00
摘要： A system to develop and test machine learning models has a waveform emulator machine learning system, a user interface to allow a user to input one or more design parameters for the waveform emulator machine learning system, one or more processors configured to execute code to cause the one or more processors to: send the one or more design parameters to the waveform emulator machine learning system; receive one or more data sets from the waveform emulator machine learning system, the one or more data sets based on the one or more design parameters; train a developed machine learning model using at least one of the one or more data sets, resulting in a trained machine learning model; validate the trained machine learning model using a previously unused one of the one or more data sets; adjust the trained machine learning model as needed; and repeat the training, validating, and adjusting until an optimal machine learning model is trained. A method of developing and testing machine learning models includes providing one or more design parameters to a waveform emulator machine learning system, receiving one or more data sets from the waveform emulator machine learning system, training a developed machine learning model using at least one of the one or more data sets, resulting in a trained machine learning model, validating the trained machine learning model using a previously unused one of the one or more data sets, adjusting the trained machine learning model as needed, and repeating the training, validating, and adjusting until an optimal machine learning model is trained.
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28.发明授权公开(公告)号：US11652494B1
公开(公告)日：2023-05-16
申请号：US17555226
申请日：2021-12-17
摘要： Methods and devices for digitizing an analog repetitive signal using waveform averaging are described. An example method includes generating a discrete set of analog dither offset voltages, wherein at least two of the discrete set of analog dither offset voltages are different from each other, receiving the analog repetitive signal comprising multiple instances of a waveform, wherein the waveform has a waveform duration, generate a timing alignment to align each waveform of the analog repetitive signal and the corresponding analog dither offset voltage over the waveform duration, combining, based on the timing alignment, each waveform and the corresponding analog dither offset voltage over the waveform duration to produce an analog output signal, converting the analog output signal to a digital output signal, and producing, based on the timing alignment, a digital averaged signal based on averaging the multiple instances of the waveform in the analog output signal.
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29.发明申请公开(公告)号：US20230070298A1
公开(公告)日：2023-03-09
申请号：US17894927
申请日：2022-08-24
申请人： Tektronix, Inc.
发明人： Kan Tan
摘要： A test and measurement device has an input port configured to receive a signal from a device under test, the signal having a symbol rate, one or more analog-to-digital converters to convert the signal to waveform samples at a sampling rate, and one or more processors configured to execute code that, when aliasing is present in the waveform samples, causes the one or more processors to: up-sample the waveform samples to produce up-sampled samples; use the up-sampled samples to produce a real-time waveform; perform clock recovery on the real-time waveform to produce a recovered clock; and resample the waveform samples using the recovered clock to produce a non-aliased waveform. A method of acquiring a waveform in a test and measurement device includes receiving a signal from a device under test, the signal having a symbol rate, converting the signal to waveform samples at a sampling rate of the test and measurement device, when aliasing is present in the waveform samples, up-sampling the waveform samples to produce up-sampled samples, using the up-sampled samples to produce a real-time waveform, performing clock recovery on the real-time waveform to produce a recovered clock, and resampling the waveform samples using the recovered clock to produce a non-aliased waveform.
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公开(公告)号：US20230016996A1
公开(公告)日：2023-01-19
申请号：US17953234
申请日：2022-09-26
申请人： Tektronix, Inc.
IPC分类号： G01D11/30
摘要： A stand for receiving a portable test and measurement instrument includes a base plate, a first portion extending orthogonally from the generally flat base, the first portion including one or more holes spaced in a pattern through which one or more fasteners may attach the test and measurement instrument to the stand, and a second portion adjacent to and extending at an angle from the first portion, the second portion including one or more holes spaced in a pattern through which one or more fasteners may attach the test and measurement instrument to the stand.
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