METHOD AND SYSTEM FOR PLASMA-INDUCED TERAHERTZ SPECTROSCOPY
    21.
    发明申请
    METHOD AND SYSTEM FOR PLASMA-INDUCED TERAHERTZ SPECTROSCOPY 有权
    用于等离子体诱导的TERAHERTZ光谱的方法和系统

    公开(公告)号:US20100277718A1

    公开(公告)日:2010-11-04

    申请号:US12634282

    申请日:2009-12-09

    Abstract: A method of analyzing a remotely-located object includes the step of illuminating at least a portion of a targeted object with electromagnetic radiation to induce a phase transformation in the targeted object, wherein the phase transformation produces an emitter plasma, which emits terahertz radiation. The method also includes the step of ionizing a volume of an ambient gas to produce a sensor plasma by focusing an optical probe beam in the volume and the step of detecting an optical component of resultant radiation produced from an interaction of the focused optical probe beam and the terahertz radiation in the sensor plasma. Detecting an optical component of the resultant radiation emitted by the sensor plasma facilitates detection of a characteristic fingerprint of the targeted object imposed onto the terahertz radiation produced as a result of the induced phase transformation.

    Abstract translation: 分析遥远物体的方法包括用电磁辐射照射目标物体的至少一部分以引起目标物体中的相变的步骤,其中相变产生发射太赫兹辐射的发射体等离子体。 该方法还包括使体积的环境气体电离以通过将光学探针束聚焦在体积中来产生传感器等离子体的步骤,以及检测由聚焦的光学探针光束和 传感器等离子体中的太赫兹辐射。 检测由传感器等离子体发射的所得辐射的光学部件有助于检测施加在由感应相变所产生的太赫兹辐射上的目标物体的特征指纹。

    Systems, methods, and devices for handling terahertz radiation
    22.
    发明授权
    Systems, methods, and devices for handling terahertz radiation 有权
    用于处理太赫兹辐射的系统,方法和装置

    公开(公告)号:US07808636B2

    公开(公告)日:2010-10-05

    申请号:US12013167

    申请日:2008-01-11

    Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.

    Abstract translation: 提供了用于检测电磁场,特别是太赫兹(THz)电磁场的变化的方法和装置。 所述方法和装置使用偏振检测装置和控制器来根据需要维持或改变调制信号的极化。 提供的方法和装置用于通过将电磁场和探针光束引导到电晶体上并检测所得到的探针光束的调制来表征电磁场。 通过检测和比较调制探测光束的偏振分量来实现探测光束的调制的检测。 本发明的方面可用于分析或检测爆炸物,爆炸性相关化合物和药物等物质。 还公开了一种紧凑的装置,用于装置,样品架和辐射源底座的模块化光学装置。

    METHODS AND SYSTEMS FOR GENERATING AMPLIFIED TERAHERTZ RADIATION FOR ANALYZING REMOTELY-LOCATED OBJECTS
    23.
    发明申请
    METHODS AND SYSTEMS FOR GENERATING AMPLIFIED TERAHERTZ RADIATION FOR ANALYZING REMOTELY-LOCATED OBJECTS 有权
    用于产生放大的TERAHERTZ辐射的方法和系统用于分析远程定位的物体

    公开(公告)号:US20080048122A1

    公开(公告)日:2008-02-28

    申请号:US11756243

    申请日:2007-05-31

    Abstract: A method for generating amplified terahertz radiation includes inducing a first volume of a gas to produce a seed plasma and emit pulsed seed terahertz radiation by focusing an optical seed beam in the first volume. The seed terahertz radiation is then amplified by focusing an optical gain beam to produce a gain plasma in a second volume overlapping with the pulsed seed terahertz radiation remote from the seed plasma. The method may be implemented in a system for detecting and analyzing a remotely-located object such as an explosive material, a biological agent, and a chemical agent.

    Abstract translation: 用于产生放大的太赫兹辐射的方法包括:通过将光学种子束聚焦在第一体积中来诱导第一体积的气体以产生种子等离子体并发射脉冲种子太赫兹辐射。 然后通过聚焦光学增益束来放大种子太赫兹辐射,以产生与远离种子等离子体的脉冲种子太赫兹辐射重叠的第二体积中的增益等离子体。 该方法可以在用于检测和分析诸如爆炸物质,生物制剂和化学试剂的远程定位物体的系统中实现。

    METHODS AND SYSTEMS FOR THE ENHANCEMENT OF TERAHERTZ WAVE GENERATION FOR ANALYZING A REMOTELY-LOCATED OBJECT
    24.
    发明申请
    METHODS AND SYSTEMS FOR THE ENHANCEMENT OF TERAHERTZ WAVE GENERATION FOR ANALYZING A REMOTELY-LOCATED OBJECT 有权
    用于分析远程定位对象的TERAHERTZ波形生成增强的方法和系统

    公开(公告)号:US20070263682A1

    公开(公告)日:2007-11-15

    申请号:US11756230

    申请日:2007-05-31

    CPC classification number: G01N21/3581 G01N21/3563 G01N21/636 G01N2021/1793

    Abstract: A method for generating terahertz radiation includes inducing a background plasma in a volume of a gas by focusing a first optical beam in the volume, and generating pulsed terahertz radiation with enhanced generation efficiency by focusing a second time-delayed optical beam in the background plasma. The method may be implemented in a system for detecting and analyzing a remotely-located object.

    Abstract translation: 一种用于产生太赫兹辐射的方法包括通过将第一光束聚焦在体积中来引入一定体积的气体中的背景等离子体,以及通过将第二时间延迟的光束聚焦在背景等离子体中来产生具有增强的发生效率的脉冲太赫兹辐射。 该方法可以在用于检测和分析位于远程的对象的系统中实现。

    Field induced THz wave emission microscope
    25.
    发明授权
    Field induced THz wave emission microscope 有权
    场诱发太赫兹波发射显微镜

    公开(公告)号:US07230245B2

    公开(公告)日:2007-06-12

    申请号:US11121385

    申请日:2005-05-04

    CPC classification number: G01Q60/12 G01N21/3563 G01N21/3581

    Abstract: A device for use with a source of radiation to provide a THz emission image representing a sample. The device comprises a substrate, a metallic probe having a tip adjacent to the substrate surface and a source of AC bias coupled between the probe tip and substrate. Radiation generated by the source of radiation is incident on the substrate surface in the vicinity of the probe tip and generates THz emission based at least on the AC bias coupled between the probe tip and substrate. A method for providing a THz emission image representing a sample is also provided.

    Abstract translation: 一种与辐射源一起使用以提供表示样品的THz发射图像的装置。 该器件包括衬底,具有与衬底表面相邻的尖端的金属探针和耦合在探针尖端和衬底之间的AC偏压源。 由辐射源产生的辐射入射到探针尖端附近的衬底表面上,并且至少基于耦合在探针尖端和衬底之间的AC偏压产生THz发射。 还提供了一种用于提供表示样本的THz发射图像的方法。

    Field induced THz wave emission microscope
    26.
    发明申请
    Field induced THz wave emission microscope 有权
    场诱发太赫兹波发射显微镜

    公开(公告)号:US20060022141A1

    公开(公告)日:2006-02-02

    申请号:US11121385

    申请日:2005-05-04

    CPC classification number: G01Q60/12 G01N21/3563 G01N21/3581

    Abstract: A device for use with a source of radiation to provide a THz emission image representing a sample. The device comprises a substrate, a metallic probe having a tip adjacent to the substrate surface and a source of AC bias coupled between the probe tip and substrate. Radiation generated by the source of radiation is incident on the substrate surface in the vicinity of the probe tip and generates THz emission based at least on the AC bias coupled between the probe tip and substrate. A method for providing a THz emission image representing a sample is also provided.

    Abstract translation: 一种与辐射源一起使用以提供表示样品的THz发射图像的装置。 该器件包括衬底,具有与衬底表面相邻的尖端的金属探针和耦合在探针尖端和衬底之间的AC偏压源。 由辐射源产生的辐射入射到探针尖端附近的衬底表面上,并且至少基于耦合在探针尖端和衬底之间的AC偏压产生THz发射。 还提供了一种用于提供表示样本的THz发射图像的方法。

    Ultrafast all-optical switch using carbon nanotube polymer composites
    27.
    发明授权
    Ultrafast all-optical switch using carbon nanotube polymer composites 有权
    使用碳纳米管聚合物复合材料的超快速全光开关

    公开(公告)号:US06782154B2

    公开(公告)日:2004-08-24

    申请号:US10074937

    申请日:2002-02-12

    CPC classification number: G02F1/3515 G02F1/3615 Y10S977/932

    Abstract: An ultrafast all-optical nonlinear switch. The switch has as components a substrate and a material disposed on the substrate. In one embodiment, the material includes a plurality of single-walled carbon nanotubes and a polymer forming a composite. Preferably, the polymer is polyimide. In another embodiment, the material includes a plurality of single-walled carbon nanotubes incorporated into a silica. The nanotube loading in the material is less than about 0.1 wt %. The material is a substantially transparent, third-order nonlinear optical material. The switch has a switching speed of less than 1 picosecond for light with a wavelength of about 1.55 micrometers. Also disclosed is a process for preparing the ultrafast all-optical nonlinear switch.

    Abstract translation: 超高速全光非线性开关。 开关具有作为基板和设置在基板上的材料的部件。 在一个实施方案中,该材料包括多个单壁碳纳米管和形成复合材料的聚合物。 优选地,聚合物是聚酰亚胺。 在另一个实施方案中,该材料包括掺入二氧化硅中的多个单壁碳纳米管。 材料中的纳米管负载小于约0.1重量%。 该材料是基本透明的三阶非线性光学材料。 对于波长约1.55微米的光,该开关具有小于1皮秒的切换速度。 还公开了一种制备超快全光非线性开关的方法。

    Terahertz imaging with dynamic aperture
    28.
    发明授权
    Terahertz imaging with dynamic aperture 有权
    太赫兹成像与动态光圈

    公开(公告)号:US06734974B2

    公开(公告)日:2004-05-11

    申请号:US10056866

    申请日:2002-01-25

    CPC classification number: G01N21/3581 G02F1/3534 G02F2203/13

    Abstract: A method of improving spatial resolution of a pump-probe terahertz (THz) imaging system for producing an image of an object. The method provides a chopped optical gating beam focused on a semiconductive layer that is either part of the object or a discrete layer placed over the object. The gating beam is focused on a gating pulse focal spot having a diameter effective to cause measurable modulation in transmission of a THz beam through the semiconductive layer when the gating pulse is on as compared to when the gating pulse is off, creating alternating modulated THz beams for detection and processing. Systems for performing the method in transmission and reflection modes are also described.

    Abstract translation: 一种提高泵浦太赫兹(THz)成像系统的空间分辨率的方法,用于产生物体的图像。 该方法提供了聚焦在作为物体的一部分或放置在物体上的离散层的半导体层的切割的光学门控光束。 选通光束聚焦在门控脉冲焦点上,该脉冲焦点有效地在与选通脉冲关闭时相比门控脉冲打开时在THz光束透过半导体层的传输中产生可测量的调制,产生交替调制的THz光束 用于检测和处理。 还描述了用于在传输和反射模式中执行该方法的系统。

    Free-space time-domain method for measuring thin film dielectric
properties
    29.
    发明授权
    Free-space time-domain method for measuring thin film dielectric properties 有权
    用于测量薄膜介电性质的自由空间时域法

    公开(公告)号:US6057928A

    公开(公告)日:2000-05-02

    申请号:US333596

    申请日:1999-06-15

    CPC classification number: G01N21/41 G01N21/3563 G01N21/3586

    Abstract: A non-contact method for determining the index of refraction or dielectric constant of a thin film on a substrate at a desired frequency in the GHz to THz range having a corresponding wavelength larger than the thickness of the thin film (which may be only a few microns). The method comprises impinging the desired-frequency beam in free space upon the thin film on the substrate and measuring the measured phase change and the measured field reflectance from the reflected beam for a plurality of incident angles over a range of angles that includes the Brewster's angle for the thin film. The index of refraction for the thin film is determined by applying Fresnel equations to iteratively calculate a calculated phase change and a calculated field reflectance at each of the plurality of incident angles, and selecting the index of refraction that provides the best mathematical curve fit with both the dataset of measured phase changes and the dataset of measured field reflectances for each incident angle. The dielectric constant for the thin film can be calculated as the index of refraction squared.

    Abstract translation: 一种非接触式方法,用于在GHz至THz范围内以期望的频率确定衬底上的薄膜的折射率或介电常数,其具有大于薄膜厚度的相应波长(其可能仅为少数几个 微米)。 该方法包括将自由空间中的期望频率光束照射到衬底上的薄膜上,并且在包括布鲁斯特角度的角度范围内测量测量的相位变化和来自反射光束的多个入射角的测量的场反射率 为薄膜。 通过应用菲涅尔方程来迭代地计算多个入射角中的每一个处的相位变化和计算的场​​反射率来确定薄膜的折射率,并且选择提供最佳数学曲线拟合的折射率 测量相位变化的数据集和每个入射角的测量场反射数据集。 可以计算薄膜的介电常数作为折射率平方。

    BACKLIGHT MODULE AND DISPLAY DEVICE
    30.
    发明公开

    公开(公告)号:US20240014182A1

    公开(公告)日:2024-01-11

    申请号:US17419854

    申请日:2021-05-12

    Applicant: Xi Cheng

    Inventor: Xi Cheng

    CPC classification number: H01L25/0753 H01L33/20

    Abstract: The present application discloses a backlight module and a display device. The backlight module includes a substrate, a plurality of LED chips, and a sealant layer. The plurality of LED chips are arranged on the substrate at intervals, and the sealant layer is arranged on the substrate and covers the plurality of LED chips; the sealant layer is provided with a plurality of recesses on a side away from the LED chips, and the plurality of recesses is arranged above the plurality of LED chips in a one-to-one correspondence to the plurality of LED chips, so that light directly above the LED chips is opened to surroundings, and side light emission of the LED chips is increased, thereby increasing brightness of an area between adjacent ones of the LED chips, thus reducing a probability of dark shadows occurring.

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