FLEXIBLE COMMAND ADDRESSING FOR MEMORY
    21.
    发明申请
    FLEXIBLE COMMAND ADDRESSING FOR MEMORY 有权
    用于存储器的灵活的命令寻址

    公开(公告)号:US20140006699A1

    公开(公告)日:2014-01-02

    申请号:US13536663

    申请日:2012-06-28

    IPC分类号: G06F12/00

    摘要: Flexible command addressing for memory. An embodiment of a memory device includes a dynamic random-access memory (DRAM); and a system element coupled with the DRAM, the system element including a memory controller for control of the DRAM. The DRAM includes a memory bank, a bus, the bus including a plurality of pins for the receipt of commands, and a logic, wherein the logic provides for shared operation of the bus for a first type of command and a second type of command received on a first set of pins.

    摘要翻译: 内存灵活的命令寻址。 存储器件的实施例包括动态随机存取存储器(DRAM); 以及与DRAM耦合的系统元件,所述系统元件包括用于控制DRAM的存储器控​​制器。 DRAM包括存储体,总线,总线包括用于接收命令的多个引脚和逻辑,其中逻辑提供用于第一类型的命令的总线的共享操作和接收的第二类型的命令 在第一组引脚上。

    Method and apparatus for providing debug functionality in a buffered memory channel
    22.
    发明授权
    Method and apparatus for providing debug functionality in a buffered memory channel 有权
    用于在缓冲存储器通道中提供调试功能的方法和装置

    公开(公告)号:US07412627B2

    公开(公告)日:2008-08-12

    申请号:US11192249

    申请日:2005-07-27

    IPC分类号: G06F11/00

    摘要: Some embodiments of the invention enable debugging functionality for memory devices residing on a memory module that are buffered from the memory bus by a buffer chip. Some embodiments map connector signals from a tester coupled to the high speed interface between the buffer chip and the memory bus to an interface between the buffer chip and the memory devices. During test mode, some embodiments bypass the normal operational circuitry of the buffer chip and provide a direct connection to the memory devices. Other embodiments use the existing architecture of the buffer chip to convert high speed pins into low speed pins and map them to pins that are connected to the memory devices. Other embodiments are described in the claims.

    摘要翻译: 本发明的一些实施例使得驻留在存储器模块上的存储器设备的调试功能能够通过缓冲器芯片从存储器总线缓冲。 一些实施例将来自耦合到缓冲器芯片和存储器总线之间的高速接口的测试仪的连接器信号映射到缓冲器芯片和存储器件之间的接口。 在测试模式期间,一些实施例绕过缓冲芯片的正常操作电路并提供与存储器件的直接连接。 其他实施例使用缓冲芯片的现有架构将高速引脚转换成低速引脚并将其映射到连接到存储器件的引脚。 在权利要求中描述了其它实施例。

    Buffered memory module with implicit to explicit memory command expansion
    23.
    发明授权
    Buffered memory module with implicit to explicit memory command expansion 有权
    缓冲内存模块,具有隐式显式内存命令扩展

    公开(公告)号:US07243205B2

    公开(公告)日:2007-07-10

    申请号:US10713784

    申请日:2003-11-13

    IPC分类号: G06F12/00

    CPC分类号: G06F13/16

    摘要: Method and apparatus for use with buffered memory modules are included among the embodiments. In exemplary systems, the memory module has a buffer that receives memory commands and data, and then presents those commands and data to physical memory devices through a separate interface. The buffer has the capability to accept an implicit memory command, i.e., a command that does not contain a fully-formed memory device command, but instead instructs the memory module buffer to form one or more fully-formed memory device commands to perform memory operations. Substantial memory channel bandwidth can be saved, for instance, with a command that instructs a memory module to clear a region of memory or copy a region to a second area in memory. Other embodiments are described and claimed.

    摘要翻译: 在实施例中包括用于缓冲存储器模块的方法和装置。 在示例性系统中,存储器模块具有接收存储器命令和数据的缓冲器,然后通过单独的接口将这些命令和数据呈现给物理存储器设备。 缓冲器具有接受隐含存储器命令的功能,即,不包含完全形成的存储器件命令的命令,而是指示存储器模块缓冲器形成一个或多个完全形成的存储器件命令以执行存储器操作 。 例如,可以通过指令存储器模块清除存储器区域或将区域复制到存储器中的第二区域的命令来保存实质存储器通道带宽。 描述和要求保护其他实施例。

    Method, apparatus and system for determining a write recovery time of a memory based on temperature
    25.
    发明授权
    Method, apparatus and system for determining a write recovery time of a memory based on temperature 有权
    用于基于温度确定存储器的写恢复时间的方法,装置和系统

    公开(公告)号:US09390785B2

    公开(公告)日:2016-07-12

    申请号:US14227969

    申请日:2014-03-27

    摘要: Techniques and mechanisms for determining a write recovery time of a memory device. In an embodiment, thermal detection logic detects a signal from a thermal sensor indicating a temperature state of a resource of the memory device. A value of a write recovery parameter is set based on the signal from the thermal sensor. In another embodiment, command logic generates a signal to precharge one or more cells of the memory device. The write recovery parameter is used by timer logic to control a timing of the signal to precharge the one or more cells.

    摘要翻译: 用于确定存储器设备的写恢复时间的技术和机制。 在一个实施例中,热检测逻辑检测来自指示存储器件的资源的温度状态的热传感器的信号。 基于来自热传感器的信号设置写恢复参数的值。 在另一实施例中,命令逻辑产生用于对存储器件的一个或多个单元预充电的信号。 写恢复参数由定时器逻辑用于控制信号的定时以对一个或多个单元进行预充电。

    Method and system for error management in a memory device
    27.
    发明授权
    Method and system for error management in a memory device 有权
    存储器件中错误管理的方法和系统

    公开(公告)号:US09158616B2

    公开(公告)日:2015-10-13

    申请号:US13619452

    申请日:2012-09-14

    IPC分类号: G06F11/00 G06F11/10

    CPC分类号: G06F11/10 G06F11/1016

    摘要: A method and system for error management in a memory device. In one embodiment of the invention, the memory device can handle commands and address parity errors and cyclic redundancy check errors. In one embodiment of the invention, the memory can detect whether a received command has any parity errors by determining whether the command bits or the address bits of the received command has any parity errors. If a parity error or cyclic redundancy check error in the received command is detected, an error handling mechanism is triggered to recover from the errant command.

    摘要翻译: 一种用于存储器件中的错误管理的方法和系统。 在本发明的一个实施例中,存储器设备可以处理命令和寻址奇偶校验错误和循环冗余校验错误。 在本发明的一个实施例中,存储器可以通过确定接收到的命令的命令位或地址位是否具有任何奇偶校验错误来检测所接收的命令是否具有任何奇偶校验错误。 如果检测到接收到的命令中的奇偶校验错误或循环冗余校验错误,则触发错误处理机制以从错误命令中恢复。

    METHOD, APPARATUS AND SYSTEM FOR DETERMINING A WRITE RECOVERY TIME OF A MEMORY BASED ON TEMPERATURE
    28.
    发明申请
    METHOD, APPARATUS AND SYSTEM FOR DETERMINING A WRITE RECOVERY TIME OF A MEMORY BASED ON TEMPERATURE 有权
    用于确定基于温度的存储器的写恢复时间的方法,装置和系统

    公开(公告)号:US20150279446A1

    公开(公告)日:2015-10-01

    申请号:US14227969

    申请日:2014-03-27

    IPC分类号: G11C11/4076 G11C11/4094

    摘要: Techniques and mechanisms for determining a write recovery time of a memory device. In an embodiment, thermal detection logic detects a signal from a thermal sensor indicating a temperature state of a resource of the memory device. A value of a write recovery parameter is set based on the signal from the thermal sensor. In another embodiment, command logic generates a signal to precharge one or more cells of the memory device. The write recovery parameter is used by timer logic to control a timing of the signal to precharge the one or more cells.

    摘要翻译: 用于确定存储器设备的写恢复时间的技术和机制。 在一个实施例中,热检测逻辑检测来自指示存储器件的资源的温度状态的热传感器的信号。 基于来自热传感器的信号设置写恢复参数的值。 在另一实施例中,命令逻辑产生用于对存储器件的一个或多个单元预充电的信号。 写恢复参数由定时器逻辑用于控制信号的定时以对一个或多个单元进行预充电。

    Method and system for error management in a memory device
    29.
    发明授权
    Method and system for error management in a memory device 有权
    存储器件中错误管理的方法和系统

    公开(公告)号:US08862973B2

    公开(公告)日:2014-10-14

    申请号:US12634286

    申请日:2009-12-09

    IPC分类号: G06F11/00

    CPC分类号: G06F11/1016

    摘要: A method and system for error management in a memory device. In one embodiment of the invention, the memory device can handle commands and address parity errors and cyclic redundancy check errors. In one embodiment of the invention, the memory can detect whether a received command has any parity errors by determining whether the command bits or the address bits of the received command has any parity errors. If a parity error or cyclic redundancy check error in the received command is detected, an error handling mechanism is triggered to recover from the errant command.

    摘要翻译: 一种用于存储器件中的错误管理的方法和系统。 在本发明的一个实施例中,存储器设备可以处理命令和寻址奇偶校验错误和循环冗余校验错误。 在本发明的一个实施例中,存储器可以通过确定接收到的命令的命令位或地址位是否具有任何奇偶校验错误来检测所接收的命令是否具有任何奇偶校验错误。 如果检测到接收到的命令中的奇偶校验错误或循环冗余校验错误,则触发错误处理机制以从错误命令中恢复。