STANDARD MEMBER FOR CALIBRATION AND METHOD OF MANUFACTURING THE SAME AND SCANNING ELECTRON MICROSCOPE USING THE SAME
    21.
    发明申请
    STANDARD MEMBER FOR CALIBRATION AND METHOD OF MANUFACTURING THE SAME AND SCANNING ELECTRON MICROSCOPE USING THE SAME 有权
    用于校准的标准会员及其制造方法和使用该标准物质的扫描电子显微镜

    公开(公告)号:US20130299699A1

    公开(公告)日:2013-11-14

    申请号:US13995627

    申请日:2011-12-26

    IPC分类号: H01J37/26 B32B38/10 B32B38/00

    摘要: A standard member for automatically, stably, and highly accurately performing magnification calibration used in an electron microscope, the standard member including, on the same plane, a multilayer film cross section formed by alternately laminating materials different from each other, a plurality of first mark patterns arranged across a first silicon layer and in parallel to the multilayer film cross section, at least a pair of second mark patterns arranged across a second silicon layer thicker than the first silicon layer on the opposite side of the first mark patterns with respect to the multilayer film cross section and in parallel to the multilayer film cross section, and a silicon layer arranged on the outer side of the first mark patterns and the second mark patterns with respect to the multilayer film cross section.

    摘要翻译: 一种标准构件,用于在电子显微镜中自动,稳定和高精度地执行放大校准,该标准构件在同一平面上包括通过交替层叠彼此不同的材料形成的多层膜横截面,多个第一标记 布置在第一硅层上并平行于多层膜横截面的图案,至少一对第二标记图案,其布置在第一标记图案相对侧上比第一硅层更厚的第二硅层, 多层膜截面并且与多层膜截面平行,以及相对于多层膜截面布置在第一标记图案的外侧的硅层和第二标记图案。

    Image pickup apparatus and electronic device
    22.
    发明授权
    Image pickup apparatus and electronic device 有权
    摄像设备和电子设备

    公开(公告)号:US08488317B2

    公开(公告)日:2013-07-16

    申请号:US13114735

    申请日:2011-05-24

    申请人: Jiro Yamamoto

    发明人: Jiro Yamamoto

    IPC分类号: H05K7/20 H04N5/228

    摘要: An image pickup apparatus that does not give a user, who grips an apparatus body with his/her hand when he/she uses the imaging apparatus or the electronic device, a sense of discomfort due to a heat, and that can efficiently diffuse heat generated from a heat source inside the apparatus body to suppress a local temperature rise inside the apparatus body. An image pickup apparatus comprises an outer cover that forms an exterior of a device body, the device body having a grip at one end thereof and having a heat source therein. A first thermal conductive path from a first circuit unit to a first heat storage member via a first heat conductive member and a second thermal conductive path from a second circuit unit to a second heat storage member via the second heat conductive member are separated from each other.

    摘要翻译: 当使用成像设备或电子设备时,不会给用户握住他/她的手的身体的图像拾取装置,由于热而引起的不适感,并且可以有效地扩散产生的热量 从装置本体内的热源抑制装置本体内的局部温度升高。 图像拾取装置包括形成装置主体的外部的外盖,所述装置主体的一端具有手柄并且在其中具有热源。 从第一电路单元经由第一导热构件到第一蓄热构件的第一导热路径以及经由第二导热构件从第二电路单元到第二储热构件的第二导热路径彼此分离 。

    Calibration standard member, method for manufacturing the member and scanning electronic microscope using the member
    23.
    发明授权
    Calibration standard member, method for manufacturing the member and scanning electronic microscope using the member 有权
    校准标准件,制造构件的方法和使用该构件的扫描电子显微镜

    公开(公告)号:US08373113B2

    公开(公告)日:2013-02-12

    申请号:US13127912

    申请日:2009-10-22

    IPC分类号: H01J37/28

    摘要: This invention provides a standard member allowing magnification calibration for use in an electron microscope to be performed with high precision. A (110) or (100) oriented silicon substrate including a magnification calibration pattern comprised of a constant pitch periodic pattern and a (110) or (100) oriented silicon substrate not including the constant pitch periodic pattern are bonded together by means of bonding without using an adhesive agent, while aligning the plane directions of the surfaces of the two substrates in the same orientation. Then, the thus bonded substrates are cleaved or diced so that their (111) surfaces or (110) surfaces become cross-section surfaces. Further, by selectively etching one side of the constant pitch periodic pattern, a standard member with no level difference and no damage to superlattice patterns and having a constant pitch concavity and convexity periodic pattern in a cross-section surface vertical to the substrate surface is created.

    摘要翻译: 本发明提供了允许以高精度执行在电子显微镜中使用的放大校准的标准构件。 包括由恒定间距周期性图案和不包括恒定间距周期图案的(110)或(100)定向硅衬底组成的放大校准图案的(110)或(100)定向硅衬底通过粘合而结合而没有 使用粘合剂,同时以相同的取向对准两个基板的表面的平面方向。 然后,如此粘合的基材被切割或切割,使得它们的(111)表面或(110)表面变成横截面。 此外,通过选择性地蚀刻恒定间距周期性图案的一侧,产生在与基板表面垂直的横截面中没有电平差并且不损坏超晶格图案并具有恒定的间距凹凸周期图案的标准构件 。

    Blower and air conditioner outdoor unit with the blower
    24.
    发明授权
    Blower and air conditioner outdoor unit with the blower 有权
    鼓风机和空调室外机带鼓风机

    公开(公告)号:US08002519B2

    公开(公告)日:2011-08-23

    申请号:US11922586

    申请日:2006-07-24

    IPC分类号: F04D29/38 F04D29/66

    摘要: A blower is provided with an axial flow impeller 7, a fan motor 8 positioned in a suction side of the axial flow impeller 7, and a motor stay 9 supporting the fan motor 8. The motor stay 9 is substantially formed to have a linear shape and attached in parallel to a rotating surface of the axial flow impeller 7. An impeller blade front edge 17 of the axial flow impeller 7 is positioned in a region X which is closer to the motor stay 9 than a region Y in which an air flow turbulence in a wake flow of the motor stay 9 is expanded, and in which region X a range of the air flow turbulence is reduced. Accordingly, it is possible to inhibit the air flow turbulence in the wake flow of the motor stay 9 from affecting the aerodynamic characteristics and noise characteristics (for example, an increase of an NZ noise) of the axial flow impeller 7.

    摘要翻译: 鼓风机设置有轴流式叶轮7,位于轴流式叶轮7的吸入侧的风扇马达8和支撑风扇马达8的马达支架9.马达支架9基本形成为具有直线形状 并且平行于轴流式叶轮7的旋转表面安装。轴流式叶轮7的叶轮叶片前缘17位于比空气流动的区域Y更靠近马达支架9的区域X中 电动机支座9的尾流中的湍流膨胀,并且在该区域X中,气流湍流的范围减小。 因此,可以抑制马达支架9的尾流中的空气流动湍流,从而影响轴流式叶轮7的空气动力学特性和噪声特性(例如NZ噪声的增加)。

    SEMICONDUCTOR DEVICE
    25.
    发明申请
    SEMICONDUCTOR DEVICE 有权
    半导体器件

    公开(公告)号:US20090090925A1

    公开(公告)日:2009-04-09

    申请号:US12245077

    申请日:2008-10-03

    IPC分类号: H01L33/00

    摘要: There are a silicon laser device having a IV-group semiconductor such as silicon or germanium equivalent to the silicon as a basic constituent element on a substrate made of the silicon, and the like by a method capable of easily forming the silicon laser device by using a general silicon process, and a manufacturing method thereof. The silicon laser device is an ultrathin silicon laser that includes a first electrode unit injecting electrons, a second electrode unit injecting holes, a light emitting unit electrically connected to the first electrode unit and the second electrode unit, wherein the light emitting unit is made of single-crystal silicon and has a first surface (top surface) and a second surface (bottom surface) opposed to the first surface, a waveguide made of a first dielectric, which is disposed in the vicinity of the light emitting unit, by setting surface directions of the first and second surfaces as a surface (100) and thinning a thickness of the light emitting unit in a direction perpendicular to the first and second surfaces, and a mirror formed by alternately adjoining the first dielectric and a second dielectric.

    摘要翻译: 存在具有诸如硅等离子体的硅组合半导体的硅激光器装置,其等同于由硅制成的衬底上作为基本构成元件的硅等,通过使用能够容易地形成硅激光器件的方法, 通用硅工艺及其制造方法。 硅激光器件是一种超薄硅激光器,其包括注入电子的第一电极单元,注入空穴的第二电极单元,与第一电极单元和第二电极单元电连接的发光单元,其中发光单元由 单晶硅,并且具有与第一表面相对的第一表面(顶表面)和第二表面(底表面),通过设置在发光单元附近的由第一电介质制成的波导 第一表面和第二表面的方向作为表面(100),并且在垂直于第一和第二表面的方向上减薄发光单元的厚度,以及通过交替地邻接第一电介质和第二电介质而形成的反射镜。

    Electronic apparatus and method of manufacturing holding member
    29.
    发明授权
    Electronic apparatus and method of manufacturing holding member 有权
    电子设备及其制造方法

    公开(公告)号:US08867218B2

    公开(公告)日:2014-10-21

    申请号:US13309096

    申请日:2011-12-01

    申请人: Jiro Yamamoto

    发明人: Jiro Yamamoto

    IPC分类号: H05K1/00 G03B17/02 H04N5/225

    CPC分类号: H04N5/2252 G03B17/02

    摘要: An electronic apparatus includes a metal holding member. The holding member includes a first region, a second region formed by hemming the first region, and a third region formed by bending perpendicularly relative to the second region at a bending part. The first region has an opening part. A part of the opening part is blocked by the bending part.

    摘要翻译: 电子设备包括金属保持构件。 保持构件包括第一区域,通过折叠第一区域形成的第二区域和在弯曲部分处相对于第二区域垂直弯曲形成的第三区域。 第一个区域有一个开放部分。 开口部分的一部分被弯曲部分阻挡。

    Standard member for calibration and method of manufacturing the same and scanning electron microscope using the same
    30.
    发明授权
    Standard member for calibration and method of manufacturing the same and scanning electron microscope using the same 有权
    用于校准的标准构件及其制造方法及使用其的扫描电子显微镜

    公开(公告)号:US08735816B2

    公开(公告)日:2014-05-27

    申请号:US13995627

    申请日:2011-12-26

    IPC分类号: G01N23/00 G21K7/00

    摘要: A standard member for automatically, stably, and highly accurately performing magnification calibration used in an electron microscope, the standard member including, on the same plane, a multilayer film cross section formed by alternately laminating materials different from each other, a plurality of first mark patterns arranged across a first silicon layer and in parallel to the multilayer film cross section, at least a pair of second mark patterns arranged across a second silicon layer thicker than the first silicon layer on the opposite side of the first mark patterns with respect to the multilayer film cross section and in parallel to the multilayer film cross section, and a silicon layer arranged on the outer side of the first mark patterns and the second mark patterns with respect to the multilayer film cross section.

    摘要翻译: 一种标准构件,用于在电子显微镜中自动,稳定和高精度地执行放大校准,该标准构件在同一平面上包括通过交替层叠彼此不同的材料形成的多层膜横截面,多个第一标记 布置在第一硅层上并平行于多层膜横截面的图案,至少一对第二标记图案,其布置在第一标记图案相对侧上比第一硅层更厚的第二硅层, 多层膜截面并且与多层膜截面平行,以及相对于多层膜截面布置在第一标记图案的外侧的硅层和第二标记图案。