Voltage Rail Monitoring to Detect Electromigration

    公开(公告)号:US20170219648A1

    公开(公告)日:2017-08-03

    申请号:US15054464

    申请日:2016-02-26

    Abstract: A method detects electromigration in a field replaceable unit. An integrated circuit, which is within a field replaceable unit (FRU) in an electronic device, is quiescented. An isolation power switch applies a test voltage from a field power source to a target voltage rail in the integrated circuit. An isolation power switch isolates the target voltage rail from the field power source. A voltage sensor coupled to the target voltage rail measures a field voltage decay rate for the target voltage rail. A voltage record comparator logic within the integrated circuit compares the field voltage decay rate to an initial voltage decay rate for the target voltage rail. In response to a difference between the field voltage decay rate and the initial voltage decay rate for the target voltage rail exceeding a predetermined limit, a signal is sent to an output device.

    USING SPARE BITS IN MEMORY SYSTEMS
    28.
    发明申请

    公开(公告)号:US20210141550A1

    公开(公告)日:2021-05-13

    申请号:US16677740

    申请日:2019-11-08

    Abstract: Disclosed is a computer implemented method to mark data as persistent using spare bits. The method includes receiving, by a memory system, a set of data, wherein the set of data includes a subset of meta-bits, and the set of data is received as a plurality of transfers, and wherein the memory system includes a first rank and a second rank. The method also includes decoding, by a decoder, the subset of meta-bits, wherein the subset of meta-bits are configured to indicate the set of data is important. The method further includes storing, based on the decoding, the set of data in a persistent storage medium.

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